Vibrational Properties of CuO and Cu4 O3 from First-Principles Calculations, and Raman and Infrared Spectroscopy L Debbichi, MC Marco de Lucas, JF Pierson, P Kruger
The Journal of Physical Chemistry C 116 (18), 10232-10237, 2012
549 2012 Electronic structures of Y Wang, S Lany, J Ghanbaja, Y Fagot-Revurat, YP Chen, F Soldera, ...
Physical Review B 94 (24), 245418, 2016
356 2016 Cuprite, paramelaconite and tenorite films deposited by reactive magnetron sputtering JF Pierson, A Thobor-Keck, A Billard
Applied surface science 210 (3-4), 359-367, 2003
313 2003 Reactive magnetron sputtering of copper, silver, and gold JF Pierson, D Wiederkehr, A Billard
Thin Solid Films 478 (1-2), 196-205, 2005
232 2005 Transmittance enhancement and optical band gap widening of Cu2O thin films after air annealing Y Wang, P Miska, D Pilloud, D Horwat, F Mücklich, JF Pierson
Journal of Applied Physics 115 (7), 2014
175 2014 Structure and properties of copper nitride films formed by reactive magnetron sputtering JF Pierson
Vacuum 66 (1), 59-64, 2002
146 2002 Stability of reactively sputtered silver oxide films JF Pierson, C Rousselot
Surface and Coatings Technology 200 (1-4), 276-279, 2005
144 2005 VN thin films as electrode materials for electrochemical capacitors R Lucio-Porto, S Bouhtiyya, JF Pierson, A Morel, F Capon, P Boulet, ...
Electrochimica Acta 141, 203-211, 2014
117 2014 Reactively sputtered zirconium nitride coatings: structural, mechanical, optical and electrical characteristics D Pilloud, AS Dehlinger, JF Pierson, A Roman, L Pichon
Surface and Coatings Technology 174, 338-344, 2003
116 2003 Asymmetric electrochemical capacitor microdevice designed with vanadium nitride and nickel oxide thin film electrodes E Eustache, R Frappier, RL Porto, S Bouhtiyya, JF Pierson, T Brousse
Electrochemistry communications 28, 104-106, 2013
110 2013 Structural, electrical, optical, and mechanical characterizations of decorative ZrOxNy thin films P Carvalho, F Vaz, L Rebouta, L Cunha, CJ Tavares, C Moura, E Alves, ...
Journal of applied physics 98 (2), 2005
103 2005 Application of sputtered ruthenium nitride thin films as electrode material for energy-storage devices S Bouhtiyya, RL Porto, B Laïk, P Boulet, F Capon, JP Pereira-Ramos, ...
Scripta Materialia 68 (9), 659-662, 2013
96 2013 Structural changes in Zr–Si–N films vs. their silicon content D Pilloud, JF Pierson, AP Marques, A Cavaleiro
Surface and Coatings Technology 180, 352-356, 2004
89 2004 Innovative Zr-Cu-Ag thin film metallic glass deposed by magnetron PVD sputtering for antibacterial applications A Etiemble, C Der Loughian, M Apreutesei, C Langlois, S Cardinal, ...
Journal of Alloys and Compounds 707, 155-161, 2017
84 2017 Influence of silicon addition on the oxidation resistance of CrN coatings A Thobor-Keck, F Lapostolle, AS Dehlinger, D Pilloud, JF Pierson, ...
Surface and Coatings Technology 200 (1-4), 264-268, 2005
81 2005 Influence of the nanostructuration of PVD hard TiN-based films on the durability of coated steel P Steyer, A Mege, D Pech, C Mendibide, J Fontaine, JF Pierson, C Esnouf, ...
Surface and Coatings Technology 202 (11), 2268-2277, 2008
77 2008 Tuning the structure and preferred orientation in reactively sputtered copper oxide thin films Y Wang, J Ghanbaja, F Soldera, S Migot, P Boulet, D Horwat, F Mücklich, ...
Applied Surface Science 335, 85-91, 2015
74 2015 Oxidation resistance improvement of arc-evaporated TiN hard coatings by silicon addition P Steyer, D Pilloud, JF Pierson, JP Millet, M Charnay, B Stauder, ...
Surface and Coatings Technology 201 (7), 4158-4162, 2006
72 2006 Hard Cr–Al–Si–B–(N) coatings deposited by reactive and non-reactive magnetron sputtering of CrAlSiB target PV Kiryukhantsev-Korneev, JF Pierson, KA Kuptsov, DV Shtansky
Applied surface science 314, 104-111, 2014
64 2014 Semi-Transparent p-Cu2 O/n-ZnO Nanoscale-Film Heterojunctions for Photodetection and Photovoltaic Applications C de Melo, M Jullien, Y Battie, A En Naciri, J Ghanbaja, F Montaigne, ...
ACS Applied Nano Materials 2 (7), 4358-4366, 2019
61 2019 
david horwatFull Professor, Institut Jean Lamour, Université de Lorraine在 univ-lorraine.fr 的电子邮件经过验证
