Wavelet transform as a processing tool in white-light interferometry P Sandoz Optics letters 22 (14), 1065-1067, 1997 | 366 | 1997 |
Unambiguous profilometry by fringe-order identification in white-light phase-shifting interferometry P Sandoz, R Devillers, A Plata Journal of modern optics 44 (3), 519-534, 1997 | 169 | 1997 |
High-resolution profilometry by using phase calculation algorithms for spectroscopic analysis of white-light interferograms P Sandoz, G Tribillon, H Perrin Journal of Modern Optics 43 (4), 701-708, 1996 | 150 | 1996 |
An algorithm for profilometry by white-light phase-shifting interferometry P Sandoz Journal of modern optics 43 (8), 1545-1554, 1996 | 143 | 1996 |
High resolution digital holography M Jacquot, P Sandoz, G Tribillon Optics communications 190 (1-6), 87-94, 2001 | 99 | 2001 |
Profilometry by zero-order interference fringe identification P Sandoz, G Tribillon Taylor & Francis Group 40 (9), 1691-1700, 1993 | 96 | 1993 |
Fiber microaxicons fabricated by a polishing technique for the generation of Bessel-like beams T Grosjean, SS Saleh, MA Suarez, IA Ibrahim, V Piquerey, D Charraut, ... Applied optics 46 (33), 8061-8067, 2007 | 93 | 2007 |
Sensing one nanometer over ten centimeters: A microencoded target for visual in-plane position measurement AN André, P Sandoz, B Mauzé, M Jacquot, GJ Laurent IEEE/ASME Transactions on Mechatronics 25 (3), 1193-1201, 2020 | 49 | 2020 |
Processing of white-light correlograms: simultaneous phase and envelope measurements by wavelet transformation P Sandoz, M Jacquot Optical Inspection and Micromeasurements II 3098, 73-82, 1997 | 46 | 1997 |
2D visual micro-position measurement based on intertwined twin-scale patterns V Guelpa, P Sandoz, MA Vergara, C Clévy, N Le Fort-Piat, GJ Laurent Sensors and Actuators A: Physical 248, 272-280, 2016 | 45 | 2016 |
Nanometer precision with a planar parallel continuum robot B Mauzé, R Dahmouche, GJ Laurent, AN André, P Rougeot, P Sandoz, ... IEEE Robotics and Automation Letters 5 (3), 3806-3813, 2020 | 41 | 2020 |
Roughness measurement by confocal microscopy for brightness characterization and surface waviness visibility evaluation P Sandoz, G Tribillon, T Gharbi, R Devillers Wear 201 (1-2), 186-192, 1996 | 41 | 1996 |
Optical implementation of frequency domain analysis for white-light interferometry P Sandoz, H Perrin, GM Tribillon, JE Calatroni, AL Guerrero, C Sainz, ... Interferometry VII: Applications 2545, 221-228, 1995 | 41 | 1995 |
High-accuracy position and orientation measurement of extended two-dimensional surfaces by a phase-sensitive vision method P Sandoz, V Bonnans, T Gharbi Applied optics 41 (26), 5503-5511, 2002 | 40 | 2002 |
Phase-sensitive vision technique for high accuracy position measurement of moving targets P Sandoz, JC Ravassard, S Dembele, A Janex IEEE Transactions on instrumentation and measurement 49 (4), 867-872, 2000 | 40 | 2000 |
Reactive-homeostasis as a cybernetic model of the silhouette effect of denial of pregnancy P Sandoz Medical hypotheses 77 (5), 782-785, 2011 | 36 | 2011 |
Intra‐and inter‐individual variability in the mechanical properties of the human skin from in vivo measurements on 20 volunteers E Jacquet, J Chambert, J Pauchot, P Sandoz Skin Research and Technology 23 (4), 491-499, 2017 | 35 | 2017 |
In-plane rigid-body vibration mode characterization with a nanometer resolution by stroboscopic imaging of a microstructured pattern P Sandoz, JM Friedt, E Carry Review of scientific instruments 78 (2), 2007 | 35 | 2007 |
Position referencing in optical microscopy thanks to sample holders with out‐of‐focus encoded patterns P Sandoz, R Zeggari, L Froehly, JL Pretet, C Mougin Journal of Microscopy 225 (3), 293-303, 2007 | 34 | 2007 |
Efferocytosis of apoptotic human papillomavirus‐positive cervical cancer cells by human primary fibroblasts F Hermetet, E Jacquin, S Launay, E Gaiffe, M Couturier, F Hirchaud, ... Biology of the Cell 108 (7), 189-204, 2016 | 33 | 2016 |