| Polarization Switching without Domain Formation at the Intrinsic <?format ?>Coercive Field in Ultrathin Ferroelectric MJ Highland, TT Fister, MI Richard, DD Fong, PH Fuoss, C Thompson, ... Physical review letters 105 (16), 167601, 2010 | 163 | 2010 |
| Imaging of strain and lattice orientation by quick scanning X-ray microscopy combined with three-dimensional reciprocal space mapping GA Chahine, MI Richard, RA Homs-Regojo, TN Tran-Caliste, D Carbone, ... Journal of Applied Crystallography 47 (2), 762-769, 2014 | 127 | 2014 |
| Enhanced relaxation and intermixing in Ge islands grown on pit-patterned Si (001) substrates TU Schülli, G Vastola, MI Richard, A Malachias, G Renaud, F Uhlík, ... Physical review letters 102 (2), 025502, 2009 | 101 | 2009 |
| Electron paramagnetic resonance and infrared studies of the genesis and reactivity toward carbon monoxide of nickel (1+) ions in a NiCa-X zeolite M Kermarec, D Olivier, M Richard, M Che, F Bozon-Verduraz The Journal of Physical Chemistry 86 (15), 2818-2827, 1982 | 95 | 1982 |
| Inversion domain boundaries in GaN wires revealed by coherent Bragg imaging S Labat, MI Richard, M Dupraz, M Gailhanou, G Beutier, M Verdier, ... ACS nano 9 (9), 9210-9216, 2015 | 76 | 2015 |
| Enhancing the electrocatalytic activity of 2H-WS 2 for hydrogen evolution via defect engineering L Wu, AJF Van Hoof, NY Dzade, L Gao, MI Richard, H Friedrich, ... Physical Chemistry Chemical Physics 21 (11), 6071-6079, 2019 | 72 | 2019 |
| The Nanodiffraction beamline ID01/ESRF: a microscope for imaging strain and structure SJ Leake, GA Chahine, H Djazouli, T Zhou, C Richter, J Hilhorst, L Petit, ... Journal of synchrotron radiation 26 (2), 571-584, 2019 | 70 | 2019 |
| Ferromagnetic resonance study of dispersed nickel particles prepared by reduction of Ni 2+-exchanged X zeolites by hydrogen molecules or hydrogen atom beams M Che, M Richard, D Olivier Journal of the Chemical Society, Faraday Transactions 1: Physical Chemistry …, 1980 | 60 | 1980 |
| PyNX: high-performance computing toolkit for coherent X-ray imaging based on operators V Favre-Nicolin, G Girard, S Leake, J Carnis, Y Chushkin, J Kieffer, ... Journal of Applied Crystallography 53 (5), 1404-1413, 2020 | 55 | 2020 |
| Fast pole figure acquisition using area detectors at the DiffAbs beamline–Synchrotron SOLEIL C Mocuta, MI Richard, J Fouet, S Stanescu, A Barbier, C Guichet, ... Applied Crystallography 46 (6), 1842-1853, 2013 | 52 | 2013 |
| Controlling dislocation nucleation-mediated plasticity in nanostructures via surface modification J Shin, LY Chen, UT Sanli, G Richter, S Labat, MI Richard, T Cornelius, ... Acta Materialia 166, 572-586, 2019 | 51 | 2019 |
| 3D imaging of a dislocation loop at the onset of plasticity in an indented nanocrystal M Dupraz, G Beutier, TW Cornelius, G Parry, Z Ren, S Labat, MI Richard, ... Nano letters 17 (11), 6696-6701, 2017 | 48 | 2017 |
| Imaging structure and composition homogeneity of 300 mm SiGe virtual substrates for advanced CMOS applications by scanning X-ray diffraction microscopy MH Zoellner, MI Richard, GA Chahine, P Zaumseil, C Reich, G Capellini, ... ACS applied materials & interfaces 7 (17), 9031-9037, 2015 | 44 | 2015 |
| EPR evidence for ion migration and Ni (CO)+ n formation in NiCaX zeolite D Oliver, M Richard, M Che Chemical Physics Letters 60 (1), 77-80, 1978 | 44 | 1978 |
| Fast computation of scattering maps of nanostructures using graphical processing units V Favre-Nicolin, J Coraux, MI Richard, H Renevier Journal of Applied Crystallography 44 (3), 635-640, 2011 | 43 | 2011 |
| In situ synchrotron x-ray studies of strain and composition evolution during metal-organic chemical vapor deposition of InGaN MI Richard, MJ Highland, TT Fister, A Munkholm, J Mei, SK Streiffer, ... Applied Physics Letters 96 (5), 2010 | 41 | 2010 |
| Evolution of crystal structure during the initial stages of ZnO atomic layer deposition R Boichot, L Tian, MI Richard, A Crisci, A Chaker, V Cantelli, S Coindeau, ... Chemistry of Materials 28 (2), 592-600, 2016 | 40 | 2016 |
| Scanning force microscope for in situ nanofocused X-ray diffraction studies Z Ren, F Mastropietro, A Davydok, S Langlais, MI Richard, JJ Furter, ... Journal of Synchrotron Radiation 21 (5), 1128-1133, 2014 | 38 | 2014 |
| Multiwavelength anomalous diffraction and diffraction anomalous fine structure to study composition and strain of semiconductor nanostructures: MAD and DAFS for studying … V Favre-Nicolin, MG Proietti, C Leclere, NA Katcho, MI Richard, ... The European Physical Journal Special Topics 208, 189-216, 2012 | 35 | 2012 |
| In situ investigation of the island nucleation of Ge on Si (001) using X-ray scattering methods TU Schülli, MI Richard, G Renaud, V Favre-Nicolin, E Wintersberger, ... Applied physics letters 89 (14), 2006 | 32 | 2006 |
