关注
Maurice Meijer
Maurice Meijer
Technical director, NXP Semiconductors
在 nxp.com 的电子邮件经过验证
标题
引用次数
引用次数
年份
Body-bias-driven design strategy for area-and performance-efficient CMOS circuits
M Meijer, JP De Gyvez
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 20 (1), 42-51, 2010
492010
Testing and diagnosis of power switches in SOCs
SK Goel, M Meijer, JP de Gyvez
Eleventh IEEE European Test Symposium (ETS'06), 6 pp.-150, 2006
442006
On-chip digital power supply control for system-on-chip applications
M Meijer, J Pineda de Gyvez, R Otten
Proceedings of the 2005 international symposium on Low power electronics and …, 2005
392005
Characterization of STI edge effects on CMOS variability
N Wils, HP Tuinhout, M Meijer
IEEE Transactions on Semiconductor Manufacturing 22 (1), 59-65, 2009
362009
A forward body bias generator for digital CMOS circuits with supply voltage scaling
M Meijer, JP de Gyvez, B Kup, B van Uden, P Bastiaansen, M Lammers, ...
Proceedings of 2010 IEEE International Symposium on Circuits and Systems …, 2010
342010
Adaptive techniques for dynamic processor optimization: theory and practice
A Wang, S Naffziger
Springer Science & Business Media, 2008
322008
Technology exploration for adaptive power and frequency scaling in 90nm CMOS
M Meijer, F Pessolano, JP de Gyvez
Proceedings of the 2004 international symposium on Low power electronics and …, 2004
322004
Technology scaling of critical charges in storage circuits based on cross-coupled inverter-pairs
T Heijmen, B Kruseman, R van Veen, M Meijer
2004 IEEE International Reliability Physics Symposium. Proceedings, 675-676, 2004
262004
Digital systems power management for high performance mixed signal platforms
A Kapoor, C Groot, GV Piqué, H Fatemi, J Echeverri, L Sevat, M Vertregt, ...
IEEE Transactions on Circuits and Systems I: Regular Papers 61 (4), 961-975, 2014
242014
A 350nA voltage regulator for 90nm CMOS digital circuits with Reverse-Body-Bias
GV Piqué, M Meijer
2011 Proceedings of the ESSCIRC (ESSCIRC), 379-382, 2011
212011
Post-silicon tuning capabilities of 45nm low-power CMOS digital circuits
M Meijer, B Liu, R Van Veen, JP De Gyvez
2009 Symposium on VLSI Circuits, 110-111, 2009
212009
Ultra-low-power digital design with body biasing for low area and performance-efficient operation
M Meijer, JP De Gyvez, A Kapoor
Journal of Low Power Electronics 6 (4), 521-532, 2010
182010
Technological boundaries of voltage and frequency scaling for power performance tuning
M Meijer, JP de Gyvez
Adaptive Techniques for Dynamic Processor Optimization: Theory and Practice …, 2008
172008
Influence of STI stress on drain current matching in advanced CMOS
N Wils, H Tuinhout, M Meijer
2008 IEEE International Conference on Microelectronic Test Structures, 238-243, 2008
142008
Efficient testing and diagnosis of faulty power switches in SOCs
SK Goel, M Meijer, JP De Gyvez
IET Computers & Digital Techniques 1 (3), 230-236, 2007
132007
Testable integrated circuit and IC test method
JR Vazquez, LE Villagra, RIMP Meijer
US Patent 8,138,783, 2012
112012
Testable integrated circuit and ic test method
S Goel, JJP De Gyvez, RLMP Meijer
US Patent App. 12/160,409, 2010
112010
Body bias driven design synthesis for optimum performance per area
M Meijer, JP de Gyvez
2010 11th International Symposium on Quality Electronic Design (ISQED), 472-477, 2010
112010
Energy-efficient FPGA interconnect design
M Meijer, R Krishnan, M Bennebroek
Proceedings of the Design Automation & Test in Europe Conference 2, 1-6, 2006
112006
Clock buffer
V Sharma, RIMP Meijer, JP de Gyvez
US Patent 9,065,439, 2015
102015
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