AUDIT: Stress testing the automatic way Y Kim, LK John, S Pant, S Manne, M Schulte, WL Bircher, MSS Govindan 2012 45th Annual IEEE/ACM International Symposium on Microarchitecture, 212-223, 2012 | 100 | 2012 |
Breeding process and characteristics of KG101, a superior line of Panax ginseng CA Meyer WS Kwon, CM Chung, YT Kim, MG Lee, KT Choi Journal of Ginseng Research 22, 11-17, 1998 | 62 | 1998 |
Automated di/dt stressmark generation for microprocessor power delivery networks Y Kim, LK John IEEE/ACM International Symposium on Low Power Electronics and Design, 253-258, 2011 | 58 | 2011 |
Fast exploration of parameterized bus architecture for communication-centric SoC design C Shin, YT Kim, EY Chung, KM Choi, JT Kong, SK Eo Proceedings Design, Automation and Test in Europe Conference and Exhibition …, 2004 | 32 | 2004 |
Follow-up of ulcerative colitis: Short-term outcome to medical treatment and relapse rates DK Chang, KL Lee, JG Kim, YT Kim, HC Jung, IS Song, K Choi, C Kim, ... Korean J Gastroenterol 26 (26), 907-18, 1994 | 29 | 1994 |
Fast and accurate transaction level modeling of an extended AMBA2. 0 bus architecture YT Kim, T Kim, Y Kim, C Shin, EY Chung, KM Choi, JT Kong, SK Eo Design, Automation and Test in Europe, 138-139, 2005 | 27 | 2005 |
Guardband reduction for multi-core data processor S Manne, R Desikan, S Pant, Y Kim US Patent 9,223,383, 2015 | 26 | 2015 |
Power control for multi-core data processor S Manne, S Pant, Y Kim, MJ Schulte US Patent 9,360,918, 2016 | 24 | 2016 |
Performance boosting under reliability and power constraints Y Kim, LK John, I Paul, S Manne, M Schulte 2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 334-341, 2013 | 18 | 2013 |
A systematic IP and bus subsystem modeling for platform-based system design J Um, WC Kwon, S Hong, YT Kim, KM Choi, JT Kong, SK Eo, T Kim Proceedings of the Design Automation & Test in Europe Conference 1, 5 pp., 2006 | 7 | 2006 |
Automating stressmark generation for testing processor voltage fluctuations Y Kim, LK John, S Pant, S Manne, M Schulte, WL Bircher, MSS Govindan IEEE Micro 33 (4), 66-75, 2013 | 4 | 2013 |
Characterization and management of voltage noise in multi-core, multi-threaded processors Y Kim | 4 | 2013 |
Impact of compiler optimizations on voltage droops and reliability of an SMT, multi-core processor Y Kim, LK John, S Manne, M Schulte, S Pant Proceedings of the First International Workshop on Secure and Resilient …, 2012 | 1 | 2012 |
Method of securely transferring programmable packet using digital signatures having access-controlled high-security verification key Y Kim, J Han, D Seo, S Sohn US Patent App. 10/836,928, 2005 | 1 | 2005 |
Automated di/dt Stressmark Generation for Microprocessor Power Distribution Networks Y Kim, LK John | | |