Measurement technique for characterizing memory effects in RF power amplifiers JHK Vuolevi, T Rahkonen, JPA Manninen IEEE Transactions on microwave theory and techniques 49 (8), 1383-1389, 2001 | 572 | 2001 |
Distortion in RF power amplifiers J Vuolevi, T Rahkonen Artech house, 2003 | 538 | 2003 |
The use of stabilized CMOS delay lines for the digitization of short time intervals TE Rahkonen, JT Kostamovaara IEEE Journal of Solid-State Circuits 28 (8), 887-894, 1993 | 347 | 1993 |
A CMOS time-to-digital converter (TDC) based on a cyclic time domain successive approximation interpolation method A Mantyniemi, T Rahkonen, J Kostamovaara IEEE Journal of Solid-State Circuits 44 (11), 3067-3078, 2009 | 195 | 2009 |
An integrated time-to-digital converter with 30-ps single-shot precision E Raisanen-Ruotsalainen, T Rahkonen, J Kostamovaara IEEE Journal of Solid-State Circuits 35 (10), 1507-1510, 2000 | 162 | 2000 |
A low-power CMOS time-to-digital converter E Raisanen-Ruotsalainen, T Rahkonen, J Kostamovaara IEEE Journal of Solid-State Circuits 30 (9), 984-990, 1995 | 156 | 1995 |
Detailed distortion analysis technique based on simulated large-signal voltage and current spectra JP Aikio, T Rahkonen IEEE Transactions on Microwave Theory and Techniques 53 (10), 3057-3066, 2005 | 75 | 2005 |
Digital predistortion of amplitude varying phased array utilising over-the-air combining N Tervo, J Aikio, T Tuovinen, T Rahkonen, A Parssinen 2017 IEEE MTT-S International Microwave Symposium (IMS), 1165-1168, 2017 | 70 | 2017 |
An integrated 9-channel time digitizer with 30 ps resolution A Mantyniemi, T Rahkonen, J Kostamovaara 2002 IEEE International Solid-State Circuits Conference. Digest of Technical …, 2002 | 62 | 2002 |
A high resolution digital CMOS time-to-digital converter based on nested delay locked loops A Mantyniemi, T Rahkonen, J Kostamovaara 1999 IEEE International Symposium on Circuits and Systems (ISCAS) 2, 537-540, 1999 | 53 | 1999 |
Time interval measurements using time-to-voltage conversion with built-in dual-slope A/D conversion E Raisanen-Ruotsalainen, T Rahkonen, J Kostamovaara 1991 IEEE International Symposium on Circuits and Systems (ISCAS), 2573-2576, 1991 | 52 | 1991 |
Detecting defects in photovoltaic cells and panels and evaluating the impact on output performances C Schuss, K Leppänen, K Remes, J Saarela, T Fabritius, B Eichberger, ... IEEE Transactions on Instrumentation and Measurement 65 (5), 1108-1119, 2016 | 48 | 2016 |
CMOS photodetectors for industrial position sensing AJ Makynen, JT Kostamovaara, TE Rahkonen IEEE transactions on instrumentation and measurement 43 (3), 489-492, 1994 | 48 | 1994 |
Impacts on the output power of photovoltaics on top of electric and hybrid electric vehicles C Schuss, T Fabritius, B Eichberger, T Rahkonen IEEE Transactions on Instrumentation and Measurement 69 (5), 2449-2458, 2019 | 47 | 2019 |
A comprehensive analysis of AM–AM and AM–PM conversion in an LDMOS RF power amplifier JP Aikio, T Rahkonen IEEE Transactions on Microwave Theory and Techniques 57 (2), 262-270, 2009 | 46 | 2009 |
Cancelling the memory effects in RF power amplifiers J Vuolevi, J Manninen, T Rahkonen ISCAS 2001. The 2001 IEEE International Symposium on Circuits and Systems …, 2001 | 43 | 2001 |
Digital predistortion of phased-array transmitter with shared feedback and far-field calibration N Tervo, B Khan, O Kursu, JP Aikio, M Jokinen, ME Leinonen, M Juntti, ... IEEE Transactions on Microwave Theory and Techniques 69 (1), 1000-1015, 2020 | 41 | 2020 |
CMOS-compatible position-sensitive devices (PSDs) based on photodetector arrays A Mäkynen, T Ruotsalainen, T Rahkonen, J Kostamovaara Sensors and Actuators A: Physical 105 (3), 261-270, 2003 | 40 | 2003 |
A 5th order Volterra study of a 30W LDMOS power amplifier A Heiskanen, J Aikio, T Rahkonen Proceedings of the 2003 International Symposium on Circuits and Systems …, 2003 | 39 | 2003 |
Detecting defects in photovoltaic panels with the help of synchronized thermography C Schuss, K Remes, K Leppänen, J Saarela, T Fabritius, B Eichberger, ... IEEE Transactions on Instrumentation and Measurement 67 (5), 1178-1186, 2018 | 38 | 2018 |