Exploring the microstructure manifold: image texture representations applied to ultrahigh carbon steel microstructures BL DeCost, T Francis, EA Holm Acta Materialia 133, 30-40, 2017 | 214 | 2017 |
High throughput quantitative metallography for complex microstructures using deep learning: a case study in ultrahigh carbon steel BL DeCost, B Lei, T Francis, EA Holm Microscopy and Microanalysis 25 (1), 21-29, 2019 | 196 | 2019 |
UHCSDB: UltraHigh carbon steel micrograph database BL DeCost, MD Hecht, T Francis, BA Webler, YN Picard, EA Holm Integrating Materials and Manufacturing Innovation 6 (2), 197-205, 2017 | 80 | 2017 |
TriBeam tomography and microstructure evolution in additively manufactured Alnico magnets PF Rottmann, AT Polonsky, T Francis, MG Emigh, M Krispin, G Rieger, ... Materials Today, 2021 | 22 | 2021 |
Time-Resolved Digital Image Correlation in the Scanning Electron Microscope for Analysis of Time-Dependent Mechanisms JC Stinville, T Francis, AT Polonsky, CJ Torbet, MA Charpagne, Z Chen, ... Experimental Mechanics, 1-18, 2020 | 21 | 2020 |
Multimodal 3D Characterization of Voids in Shock-Loaded Tantalum: Implications for Ductile Spallation Mechanisms T Francis, PF Rottmann, AT Polonsky, MA Charpagne, MLP Echlin, ... Acta Materialia, 117057, 2021 | 20 | 2021 |
A geodesic octonion metric for grain boundaries T Francis, I Chesser, S Singh, EA Holm, M De Graef Acta Materialia 166, 135-147, 2019 | 18 | 2019 |
Learning the grain boundary manifold: tools for visualizing and fitting grain boundary properties I Chesser, T Francis, M De Graef, EA Holm Acta Materialia, 2020 | 14 | 2020 |
Ultrahigh carbon steel micrographs MD Hecht, BL DeCost, T Francis, EA Holm, YN Picard, BA Webler | 8 | 2017 |
3D Characterization of a Novel CoNi-superalloy for Additive Manufacturing A Polonsky, T Francis, K Pusch, ML Echlin, A Botman, S Randolph, ... Microscopy and Microanalysis, 1-3, 0 | 4 | |
Ultrahigh Carbon Steel Microconstituent Annotations B DeCost, M Hecht, T Sibley, T Francis, B Webler, Y Picard, E Holm | | 2018 |
TriBeam Tomography for 3D Data Acquisition ML Echlin, A Polonsky, T Francis, W Lenthe, M Titus, A Mottura, C Torbet, ... Microscopy and Microanalysis, 1-3, 0 | | |