| Titania-doped tantala/silica coatings for gravitational-wave detection GM Harry, MR Abernathy, AE Becerra-Toledo, H Armandula, E Black, ... Classical and Quantum Gravity 24 (2), 405, 2006 | 311 | 2006 |
| Shear-induced α→ γ transformation in nanoscale Fe–C composite Y Ivanisenko, I MacLaren, X Sauvage, RZ Valiev, HJ Fecht Acta Materialia 54 (6), 1659-1669, 2006 | 261 | 2006 |
| Atomap: a new software tool for the automated analysis of atomic resolution images using two-dimensional Gaussian fitting M Nord, PE Vullum, I MacLaren, T Tybell, R Holmestad Advanced structural and chemical imaging 3, 1-12, 2017 | 234 | 2017 |
| The microstructure and microtexture of zirconium oxide films studied by transmission electron backscatter diffraction and automated crystal orientation mapping with … A Garner, A Gholinia, P Frankel, M Gass, I MacLaren, M Preuss Acta Materialia 80, 159-171, 2014 | 171 | 2014 |
| Abnormal grain growth in alumina: synergistic effects of yttria and silica I MacLaren, RM Cannon, MA Gülgün, R Voytovych, N Popescu‐Pogrion, ... Journal of the American Ceramic Society 86 (4), 650-59, 2003 | 154 | 2003 |
| The effect of yttrium on densification and grain growth in α-alumina R Voytovych, I Maclaren, MA Gülgün, RM Cannon, M Rühle Acta Materialia 50 (13), 3453-3463, 2002 | 132 | 2002 |
| Ohmic contacts to n-type germanium with low specific contact resistivity K Gallacher, P Velha, DJ Paul, I MacLaren, M Myronov, DR Leadley Applied Physics Letters 100 (2), 2012 | 122 | 2012 |
| Investigations of the Antibacterial Properties of Ciprofloxacin@SiO2 MJ Rosemary, I MacLaren, T Pradeep Langmuir 22 (24), 10125-10129, 2006 | 117 | 2006 |
| Effect of heat treatment on mechanical dissipation in Ta2O5 coatings IW Martin, R Bassiri, R Nawrodt, MM Fejer, A Gretarsson, E Gustafson, ... Classical and Quantum Gravity 27 (22), 225020, 2010 | 107 | 2010 |
| Cation segregation in an oxide ceramic with low solubility: yttrium doped α-alumina MA Gülgün, R Voytovych, I Maclaren, M Rühle, RM Cannon Interface Science 10, 99-110, 2002 | 100 | 2002 |
| Electron ptychographic phase imaging of light elements in crystalline materials using Wigner distribution deconvolution H Yang, I MacLaren, L Jones, GT Martinez, M Simson, M Huth, H Ryll, ... Ultramicroscopy 180, 173-179, 2017 | 95 | 2017 |
| A TEM and HREM study of particle formation during barium titanate synthesis in aqueous solution I MacLaren, CB Ponton Journal of the European Ceramic Society 20 (9), 1267-1275, 2000 | 95 | 2000 |
| Characterisation of the Medipix3 detector for 60 and 80 keV electrons JA Mir, R Clough, R MacInnes, C Gough, R Plackett, I Shipsey, H Sawada, ... Ultramicroscopy 182, 44-53, 2017 | 93 | 2017 |
| Measurements of a low-temperature mechanical dissipation peak in a single layer of Ta2O5 doped with TiO2 I Martin, H Armandula, C Comtet, MM Fejer, A Gretarsson, G Harry, ... Classical and Quantum gravity 25 (5), 055005, 2008 | 89 | 2008 |
| Comparison of the temperature dependence of the mechanical dissipation in thin films of Ta2O5 and Ta2O5 doped with TiO2 IW Martin, E Chalkley, R Nawrodt, H Armandula, R Bassiri, C Comtet, ... Classical and Quantum Gravity 26 (15), 155012, 2009 | 83 | 2009 |
| Aberration-corrected scanning transmission electron microscopy for atomic-resolution studies of functional oxides I MacLaren, QM Ramasse International Materials Reviews 59 (3), 115-131, 2014 | 81 | 2014 |
| 4D STEM: High efficiency phase contrast imaging using a fast pixelated detector H Yang, L Jones, H Ryll, M Simson, H Soltau, Y Kondo, R Sagawa, ... Journal of Physics: Conference Series 644 (1), 012032, 2015 | 73 | 2015 |
| Characterisation of amorphous molybdenum silicide (MoSi) superconducting thin films and nanowires A Banerjee, LJ Baker, A Doye, M Nord, RM Heath, K Erotokritou, ... Superconductor Science and Technology 30 (8), 084010, 2017 | 70 | 2017 |
| Probing the atomic structure of amorphous Ta2O5 coatings R Bassiri, KB Borisenko, DJH Cockayne, J Hough, I MacLaren, S Rowan Applied Physics Letters 98 (3), 2011 | 65 | 2011 |
| Detectors—The ongoing revolution in scanning transmission electron microscopy and why this important to material characterization I MacLaren, TA Macgregor, CS Allen, AI Kirkland Apl Materials 8 (11), 2020 | 62 | 2020 |
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