Mechanisms of surface anodization produced by scanning probe microscopes AE Gordon, RT Fayfield, DD Litfin, TK Higman Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1995 | 206 | 1995 |
System and method for dynamic ESD Protection K Kimber, D Litfin US Patent 6,898,061, 2005 | 23 | 2005 |
Bipolar junction transistor antifuse KN Kimber, DD Litfin, J Burkhardt, SL Kosier US Patent 7,071,533, 2006 | 11 | 2006 |
Silicon metal‐oxide‐semiconductor field‐effect transistor with gate structures defined by scanned probe lithography MS Hagedorn, DD Litfin, GM Price, AE Gordon, TK Higman Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1996 | 9 | 1996 |
Electrostatic discharge protection circuit DD Litfin US Patent 6,768,176, 2004 | 7 | 2004 |
J. Vac. Sci. Technol. B AE Gordon, RT Fayfield, DD Litfin, TK Higman J. Vac. Sci. Technol. B 13 (6), 2805-2808, 1995 | 7 | 1995 |
Low trigger voltage electrostatic discharge protection device D Litfin, S Kosier US Patent App. 11/244,959, 2007 | 3 | 2007 |
High trigger current electrostatic discharge protection device D Litfin US Patent App. 11/287,646, 2007 | 2 | 2007 |
Anti-snapback circuitry for metal oxide semiconductor (MOS) transistor K Kimber, D Litfin US Patent 9,269,705, 2016 | | 2016 |
Atomic Force Microscope-Based Lithography of Titanium AE Gordon, DD Litfin, MS Hagedorn, J Chen, RT Fayfield, TK Higman MRS Online Proceedings Library (OPL) 380, 125, 1995 | | 1995 |