| Temperature study of the dielectric polarization effects of capacitive RF MEMS switches G Papaioannou, MN Exarchos, V Theonas, G Wang, J Papapolymerou IEEE Transactions on Microwave Theory and Techniques 53 (11), 3467-3473, 2005 | 136 | 2005 |
| Dielectric charging in silicon nitride films for MEMS capacitive switches: Effect of film thickness and deposition conditions U Zaghloul, G Papaioannou, F Coccetti, P Pons, R Plana Microelectronics Reliability 49 (9-11), 1309-1314, 2009 | 78 | 2009 |
| Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation M Lamhamdi, P Pons, U Zaghloul, L Boudou, F Coccetti, J Guastavino, ... Microelectronics Reliability 48 (8-9), 1248-1252, 2008 | 76 | 2008 |
| On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization … U Zaghloul, G Papaioannou, B Bhushan, F Coccetti, P Pons, R Plana Microelectronics Reliability 51 (9-11), 1810-1818, 2011 | 70 | 2011 |
| Structure dependent charging process in RF MEMS capacitive switches E Papandreou, M Lamhamdi, CM Skoulikidou, P Pons, G Papaioannou, ... Microelectronics Reliability 47 (9-11), 1812-1817, 2007 | 62 | 2007 |
| On the influence of environment gases, relative humidity and gas purification on dielectric charging/discharging processes in electrostatically driven MEMS/NEMS devices U Zaghloul, B Bhushan, P Pons, GJ Papaioannou, F Coccetti, R Plana Nanotechnology 22 (3), 035705, 2010 | 57 | 2010 |
| Dielectric charging in radio frequency microelectromechanical system capacitive switches: A study of material properties and device performance G Papaioannou, J Papapolymerou, P Pons, R Plana Applied Physics Letters 90 (23), 2007 | 56 | 2007 |
| Effect of deposition conditions on charging processes in SiNx: Application to RF-MEMS capacitive switches R Daigler, E Papandreou, M Koutsoureli, G Papaioannou, ... Microelectronic Engineering 86 (3), 404-407, 2009 | 55 | 2009 |
| A systematic reliability investigation of the dielectric charging process in electrostatically actuated MEMS based on Kelvin probe force microscopy U Zaghloul, GJ Papaioannou, F Coccetti, P Pons, R Plana Journal of Micromechanics and Microengineering 20 (6), 064016, 2010 | 38 | 2010 |
| On the modeling of dielectric charging in RF-MEMS capacitive switches G Papaioannou, F Coccetti, R Plana 2010 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems …, 2010 | 38 | 2010 |
| Kelvin probe microscopy for reliability investigation of RF-MEMS capacitive switches A Belarni, M Lamhamdi, P Pons, L Boudou, J Guastavino, Y Segui, ... Microelectronics Reliability 48 (8-9), 1232-1236, 2008 | 38 | 2008 |
| The operating performance of firms that switch their stock listings GJ Papaioannou, NG Travlos, KG Viswanathan Journal of Financial Research 26 (4), 469-486, 2003 | 38 | 2003 |
| Contactless dielectric charging mechanisms in RF-MEMS capacitive switches GJ Papaioannou, G Wang, D Bessas, J Papapolymerou 2006 European Microwave Integrated Circuits Conference, 513-516, 2006 | 37 | 2006 |
| A study of field emission process in electrostatically actuated MEMS switches L Michalas, A Garg, A Venkattraman, M Koutsoureli, A Alexeenko, ... Microelectronics Reliability 52 (9-10), 2267-2271, 2012 | 33 | 2012 |
| Assessment of dielectric charging in electrostatically driven MEMS devices: A comparison of available characterization techniques U Zaghloul, M Koutsoureli, H Wang, F Coccetti, G Papaioannou, P Pons, ... Microelectronics Reliability 50 (9-11), 1615-1620, 2010 | 33 | 2010 |
| ESD failure signature in capacitive RF MEMS switches J Ruan, GJ Papaioannou, N Nolhier, N Mauran, M Bafleur, F Coccetti, ... Microelectronics reliability 48 (8-9), 1237-1240, 2008 | 33 | 2008 |
| Effect of space charge polarization in radio frequency microelectromechanical system capacitive switch dielectric charging GJ Papaioannou, M Exarchos, V Theonas, J Psychias, G Konstantinidis, ... Applied Physics Letters 89 (10), 2006 | 33 | 2006 |
| Nanoscale characterization of the dielectric charging phenomenon in PECVD silicon nitride thin films with various interfacial structures based on Kelvin probe force microscopy U Zaghloul, GJ Papaioannou, H Wang, B Bhushan, F Coccetti, P Pons, ... Nanotechnology 22 (20), 205708, 2011 | 32 | 2011 |
| Dielectric charging mechanisms in RF-MEMS capacitive switches GJ Papaioannou, J Papapolymerou 2007 European Microwave Integrated Circuit Conference, 359-362, 2007 | 32 | 2007 |
| Investigation of charging mechanisms in Metal-Insulator-Metal structures M Exarchos, V Theonas, P Pons, GJ Papaioannou, S Melle, D Dubuc, ... Microelectronics Reliability 45 (9-11), 1782-1785, 2005 | 32 | 2005 |
Koutsoureli MatroniUniversity of Athens, Physics Department在 phys.uoa.gr 的电子邮件经过验证
