| Direct Observation of Self-heating in III-V Gate-all-around Nanowire MOSFETs SH Shin, M Masuduzzaman, MA Wahab, K Maize, JJ Gu, M Si, A Shakouri, ... 2014 IEEE International Electron Devices Meeting (IEDM), 20.3.1, 2014 | 85 | 2014 |
| Exploring the capability of multifrequency charge pumping in resolving location and energy levels of traps within dielectric M Masuduzzaman, AE Islam, MA Alam IEEE transactions on electron devices 55 (12), 3421-3431, 2008 | 69 | 2008 |
| Intrinsic correlation between PBTI and TDDB degradations in nMOS HK/MG dielectrics J Yang, M Masuduzzaman, K Joshi, S Mukhopadhyay, J Kang, ... 2012 IEEE international reliability physics symposium (IRPS), 5D. 4.1-5D. 4.7, 2012 | 40 | 2012 |
| Effective Nanometer Airgap of NEMS Devices Using Negative Capacitance of Ferroelectric Materials M Masuduzzaman, MA Alam Nano Letters 14 (6), 3160-3165, 2014 | 39 | 2014 |
| Impact of nanowire variability on performance and reliability of gate-all-around III-V MOSFETs SH Shin, M Masuduzzaman, JJ Gu, MA Wahab, N Conrad, M Si, PD Ye, ... 2013 IEEE International Electron Devices Meeting (IEDM), 7.5. 1-7.5. 4, 2013 | 38 | 2013 |
| The origin of broad distribution of breakdown times in polycrystalline thin film dielectrics M Masuduzzaman, S Xie, J Chung, D Varghese, J Rodriguez, S Krishnan, ... Applied Physics Letters 101 (15), 153511-153511-5, 2012 | 24 | 2012 |
| Origin and Implications of Hot Carrier Degradation of Gate-all-around nanowire III-V MOSFETs SH Shin, MA Wahab, M Masuduzzaman, M Si, J Gu, PD Ye, MA Alam International Reliability Physics Symposium (IRPS), 4A.3, 2014 | 23 | 2014 |
| SILC-based reassignment of trapping and trap generation regimes of positive bias temperature instability JQ Yang, M Masuduzzman, JF Kang, MA Alam 2011 International Reliability Physics Symposium, 3A. 3.1-3A. 3.6, 2011 | 20 | 2011 |
| Performance and variability studies of InGaAs gate-all-around nanowire MOSFETs N Conrad, SH Shin, J Gu, M Si, H Wu, M Masuduzzaman, MA Alam, ... IEEE Transactions on Device and Materials Reliability 13 (4), 489-496, 2013 | 18 | 2013 |
| Physics and mechanisms of dielectric trap profiling by Multi-frequency Charge Pumping (MFCP) method M Masuduzzaman, AE Islam, MA Alam 2009 IEEE International Reliability Physics Symposium, 13-20, 2009 | 16 | 2009 |
| A multi-probe correlated bulk defect characterization scheme for ultra-thin high-к dielectric M Masuduzzaman, AE Islam, MA Alam 2010 IEEE International Reliability Physics Symposium, 1069-1072, 2010 | 15 | 2010 |
| Observation and control of hot atom damage in ferroelectric devices M Masuduzzaman, D Varghese, JA Rodriguez, S Krishnan, MA Alam Electron Devices, IEEE Transactions on 61 (10), 3490-3498, 2014 | 14 | 2014 |
| Probing bulk defect energy bands using generalized charge pumping method M Masuduzzaman, B Weir, MA Alam Journal of Applied Physics 111 (7), 074501-074501-9, 2012 | 13 | 2012 |
| NEMS devices with series ferroelectric negative capacitor MA Alam, M Masuduzzaman, A Jain US Patent 9,755,041, 2017 | 12 | 2017 |
| Experimental identification of unique oxide defect regions by characteristic response of charge pumping M Masuduzzaman, A Islam, R Degraeve, M Cho, M Zahid, M Alam 2011 International Reliability Physics Symposium, 3A. 5.1-3A. 5.6, 2011 | 10 | 2011 |
| Hot Atom Damage (HAD) Limited TDDB Lifetime of Ferroelectric Memories M Masuduzzaman, MA Alam 2013 IEEE International Electron Devices Meeting (IEDM), 21.4.1, 2013 | 9 | 2013 |
| The origin and consequences of push-pull breakdown in series connected dielectrics M Masuduzzaman, D Varghese, H Guo, S Krishnan, MA Alam Applied Physics Letters 99 (26), 2011 | 5 | 2011 |
| Characterizing self-heating dynamics using cyclostationary measurements SH Shin, M Masuduzzaman, MA Alam arXiv preprint arXiv:1609.00346, 2016 | 2 | 2016 |
| NEMS devices with series ferroelectric negative capacitor MA Alam, M Masuduzzaman, A Jain US Patent 10,312,342, 2019 | 1 | 2019 |
| Lifetime of Ferroelectric Devices MA Alam, M Masuduzzaman US Patent App. 14/533,897, 2015 | 1 | 2015 |
Muhammad Ashraful AlamJai N. Gupta Professor of Electrical Engineering, Purdue University在 purdue.edu 的电子邮件经过验证
Muhammad Ashraful AlamJai N. Gupta Professor of Electrical Engineering, Purdue University在 purdue.edu 的电子邮件经过验证
Ahmad Ehteshamul IslamUS Air Force Research Laboratory在 us.af.mil 的电子邮件经过验证
Dhanoop VargheseTexas Instruments在 ti.com 的电子邮件经过验证