关注
Jacob Gavartin
Jacob Gavartin
Materials Science Lead at Schrodinger Inc
在 schrodinger.com 的电子邮件经过验证
标题
引用次数
引用次数
年份
Negative oxygen vacancies in HfO2 as charge traps in high-k stacks
JL Gavartin, D Muñoz Ramo, AL Shluger, G Bersuker, BH Lee
Applied Physics Letters 89 (8), 2006
3642006
Trapping, self-trapping and the polaron family
AM Stoneham, J Gavartin, AL Shluger, AV Kimmel, DM Ramo, ...
Journal of Physics: Condensed Matter 19 (25), 255208, 2007
2842007
Spectroscopic properties of oxygen vacancies in monoclinic calculated with periodic and embedded cluster density functional theory
D Muñoz Ramo, JL Gavartin, AL Shluger, G Bersuker
Physical Review B—Condensed Matter and Materials Physics 75 (20), 205336, 2007
2592007
The role of nitrogen-related defects in high-k dielectric oxides: Density-functional studies
JL Gavartin, AL Shluger, AS Foster, GI Bersuker
Journal of applied physics 97 (5), 2005
1992005
Theoretical Prediction of Intrinsic Self-Trapping of Electrons and Holes in Monoclinic
D Muñoz Ramo, AL Shluger, JL Gavartin, G Bersuker
Physical review letters 99 (15), 155504, 2007
1752007
Electronic properties of structural defects at the MgO (001) surface
PV Sushko, JL Gavartin, AL Shluger
The Journal of Physical Chemistry B 106 (9), 2269-2276, 2002
1642002
Structural, electronic and vibrational properties of tetragonal zirconia under pressure: a density functional theory study
V Milman, A Perlov, K Refson, SJ Clark, J Gavartin, B Winkler
Journal of Physics: Condensed Matter 21 (48), 485404, 2009
1472009
Predicting Drug Substances Autoxidation
P Lienard, J Gavartin, G Boccardi, M Meunier
Pharmaceutical Research 32 (1), 300-310, 2014
1172014
How will quantum computers provide an industrially relevant computational advantage in quantum chemistry?
VE Elfving, BW Broer, M Webber, J Gavartin, MD Halls, KP Lorton, ...
arXiv preprint arXiv:2009.12472, 2020
1062020
Oxide muonics: II. Modelling the electrical activity of hydrogen in wide-gap and high-permittivity dielectrics
SFJ Cox, JL Gavartin, JS Lord, SP Cottrell, JM Gil, HV Alberto, JP Duarte, ...
Journal of Physics: Condensed Matter 18 (3), 1079, 2006
1022006
Interfacial oxide growth at silicon∕ high-k oxide interfaces: First principles modeling of the Si–HfO2 interface
MH Hakala, AS Foster, JL Gavartin, P Havu, MJ Puska, RM Nieminen
Journal of applied physics 100 (4), 2006
702006
Lattice relaxation and charge-transfer optical transitions due to self-trapped holes in nonstoichiometric LaMnO3 crystal
NN Kovaleva, JL Gavartin, AL Shluger, AV Boris, AM Stoneham
Journal of Experimental and Theoretical Physics 94, 178-190, 2002
612002
Ab initio modeling of structure and defects at the HfO2/Si interface
JL Gavartin, L Fonseca, G Bersuker, AL Shluger
Microelectronic engineering 80, 412-415, 2005
592005
High-throughput molecular dynamics simulations and validation of thermophysical properties of polymers for various applications
MAF Afzal, AR Browning, A Goldberg, MD Halls, JL Gavartin, T Morisato, ...
ACS Applied Polymer Materials 3 (2), 620-630, 2020
572020
Oxygen vacancies in cubic nanocrystals studied by an ab initio embedded cluster method
D Muñoz Ramo, PV Sushko, JL Gavartin, AL Shluger
Physical Review B—Condensed Matter and Materials Physics 78 (23), 235432, 2008
482008
Calculation of adiabatic barriers for cation diffusion in Li2O and LiCl crystals
JL Gavartin, CRA Catlow, AL Shluger, AN Varaksin, YN Kolmogorov
Modelling and Simulation in Materials Science and Engineering 1 (1), 29, 1992
481992
Modeling hfo2/sio2/si interface
JL Gavartin, AL Shluger
Microelectronic engineering 84 (9-10), 2412-2415, 2007
342007
The oxide gate dielectric: do we know all we should?
AM Stoneham, JL Gavartin, AL Shluger
Journal of Physics: Condensed Matter 17 (21), S2027, 2005
342005
Nano and Giga Challenges in Microelectronics
AL Shluger, AS Foster, JL Gavartin, PV Sushko, J Greer, A Korkin, ...
Greer, J, 151, 2003
302003
Thermal fluctuations, localization, and self-trapping in a polar crystal: Combined shell-model molecular dynamics and quantum chemical approach
JL Gavartin, AL Shluger
Physical Review B 64 (24), 245111, 2001
252001
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