Thermoelectric performance of a metastable thin-film Heusler alloy B Hinterleitner, I Knapp, M Poneder, Y Shi, H Müller, G Eguchi, ... Nature 576 (7785), 85-90, 2019 | 314 | 2019 |
Improvement of the laser flash method to reduce uncertainty in thermal diffusivity measurements T Baba, A Ono Measurement Science and Technology 12 (12), 2046, 2001 | 226 | 2001 |
A laser flash apparatus for thermal diffusivity and specific heat capacity measurements K Shinzato, T Baba Journal of thermal analysis and calorimetry 64, 413-422, 2001 | 170 | 2001 |
Thermal conductivity of diamond films synthesized by microwave plasma CVD A Ono, T Baba, H Funamoto, A Nishikawa Japanese journal of applied physics 25 (10A), L808, 1986 | 163 | 1986 |
Thermal transport properties of polycrystalline tin-doped indium oxide films T Ashida, A Miyamura, N Oka, Y Sato, T Yagi, N Taketoshi, T Baba, ... Journal of applied physics 105 (7), 2009 | 157 | 2009 |
Development of a thermal diffusivity measurement system for metal thin films using a picosecond thermoreflectance technique N Taketoshi, T Baba, A Ono Measurement Science and Technology 12 (12), 2064, 2001 | 157 | 2001 |
Lattice thermal conductivity of MgSiO3 perovskite and post-perovskite at the core–mantle boundary K Ohta, T Yagi, N Taketoshi, K Hirose, T Komabayashi, T Baba, Y Ohishi, ... Earth and Planetary Science Letters 349, 109-115, 2012 | 130 | 2012 |
Analysis of one-dimensional heat diffusion after light pulse heating by the response function method T Baba Japanese Journal of Applied Physics 48 (5S2), 05EB04, 2009 | 129 | 2009 |
A high-temperature laser-pulse thermal diffusivity apparatus A Cezairliyan, T Baba, R Taylor International journal of thermophysics 15, 317-341, 1994 | 125 | 1994 |
Analysis on thermal properties of tin doped indium oxide films by picosecond thermoreflectance measurement T Yagi, K Tamano, Y Sato, N Taketoshi, T Baba, Y Shigesato Journal of Vacuum Science & Technology A 23 (4), 1180-1186, 2005 | 105 | 2005 |
Thermal diffusivity of single-walled carbon nanotube forest measured by laser flash method M Akoshima, K Hata, DN Futaba, K Mizuno, T Baba, M Yumura Japanese Journal of Applied Physics 48 (5S2), 05EC07, 2009 | 99 | 2009 |
Observation of heat diffusion across submicrometer metal thin films using a picosecond thermoreflectance technique N Taketoshi, T Baba, A Ono Japanese Journal of Applied Physics 38 (11A), L1268, 1999 | 98 | 1999 |
Study on a thermal-diffusivity standard for laser flash method measurements M Akoshima, T Baba International journal of thermophysics 27, 1189-1203, 2006 | 91 | 2006 |
Thermoreflectance technique to measure thermal effusivity distribution with high spatial resolution K Hatori, N Taketoshi, T Baba, H Ohta Review of scientific instruments 76 (11), 2005 | 91 | 2005 |
Thermal Conductivity of Amorphous Indium--Gallium--Zinc Oxide Thin Films T Yoshikawa, T Yagi, N Oka, J Jia, Y Yamashita, K Hattori, Y Seino, ... Applied Physics Express 6 (2), 021101, 2013 | 73 | 2013 |
Homodyne detection technique using spontaneously generated reference signal in picosecond thermoreflectance measurements N Taketoshi, T Baba, E Schaub, A Ono Review of scientific instruments 74 (12), 5226-5230, 2003 | 64 | 2003 |
Microstructurally Tailored Thin β‐Ag2Se Films toward Commercial Flexible Thermoelectrics Y Lei, R Qi, M Chen, H Chen, C Xing, F Sui, L Gu, W He, Y Zhang, T Baba, ... Advanced Materials 34 (7), 2104786, 2022 | 63 | 2022 |
Development of ultrafast laser flash methods for measuring thermophysical properties of thin films and boundary thermal resistances T Baba, N Taketoshi, T Yagi Japanese Journal of Applied Physics 50 (11S), 11RA01, 2011 | 62 | 2011 |
Electrical delay technique in the picosecond thermoreflectance method for thermophysical property measurements of thin films N Taketoshi, T Baba, A Ono Review of scientific instruments 76 (9), 2005 | 54 | 2005 |
Thermal diffusivity measurement in a diamond anvil cell using a light pulse thermoreflectance technique T Yagi, K Ohta, K Kobayashi, N Taketoshi, K Hirose, T Baba Measurement Science and Technology 22 (2), 024011, 2010 | 52 | 2010 |