Flowdroid: Precise context, flow, field, object-sensitive and lifecycle-aware taint analysis for android apps S Arzt, S Rasthofer, C Fritz, E Bodden, A Bartel, J Klein, Y Le Traon, ... ACM sigplan notices 49 (6), 259-269, 2014 | 2660 | 2014 |
Androzoo: Collecting millions of android apps for the research community K Allix, TF Bissyandé, J Klein, Y Le Traon Proceedings of the 13th international conference on mining software …, 2016 | 1000 | 2016 |
Iccta: Detecting inter-component privacy leaks in android apps L Li, A Bartel, TF Bissyandé, J Klein, Y Le Traon, S Arzt, S Rasthofer, ... 2015 IEEE/ACM 37th IEEE International Conference on Software Engineering 1 …, 2015 | 781 | 2015 |
Effective {Inter-Component} communication mapping in android: An essential step towards holistic security analysis D Octeau, P McDaniel, S Jha, A Bartel, E Bodden, J Klein, Y Le Traon 22nd USENIX Security Symposium (USENIX Security 13), 543-558, 2013 | 573 | 2013 |
Mutation testing advances: an analysis and survey M Papadakis, M Kintis, J Zhang, Y Jia, Y Le Traon, M Harman Advances in computers 112, 275-378, 2019 | 532 | 2019 |
A state-of the-art survey & testbed of fuzzy AHP (FAHP) applications S Kubler, J Robert, W Derigent, A Voisin, Y Le Traon Expert systems with applications 65, 398-422, 2016 | 521 | 2016 |
Static analysis of android apps: A systematic literature review L Li, TF Bissyandé, M Papadakis, S Rasthofer, A Bartel, D Octeau, J Klein, ... Information and Software Technology 88, 67-95, 2017 | 435 | 2017 |
Automatic test generation: A use case driven approach C Nebut, F Fleurey, Y Le Traon, JM Jezequel IEEE Transactions on Software Engineering 32 (3), 140-155, 2006 | 431 | 2006 |
Refactoring UML models G Sunyé, D Pollet, Y Le Traon, JM Jézéquel International Conference on the Unified Modeling Language, 134-148, 2001 | 427 | 2001 |
Metallaxis‐FL: mutation‐based fault localization M Papadakis, Y Le Traon Software Testing, Verification and Reliability 25 (5-7), 605-628, 2015 | 347 | 2015 |
Dexpler: converting android dalvik bytecode to jimple for static analysis with soot A Bartel, J Klein, Y Le Traon, M Monperrus Proceedings of the ACM SIGPLAN International Workshop on State of the Art in …, 2012 | 323 | 2012 |
Automated and scalable t-wise test case generation strategies for software product lines G Perrouin, S Sen, J Klein, B Baudry, Y Le Traon 2010 Third international conference on software testing, verification and …, 2010 | 309 | 2010 |
Improving test suites for efficient fault localization B Baudry, F Fleurey, Y Le Traon Proceedings of the 28th international conference on Software engineering, 82-91, 2006 | 287 | 2006 |
Bypassing the combinatorial explosion: Using similarity to generate and prioritize t-wise test configurations for software product lines C Henard, M Papadakis, G Perrouin, J Klein, P Heymans, Y Le Traon IEEE Transactions on Software Engineering 40 (7), 650-670, 2014 | 245 | 2014 |
Trivial compiler equivalence: A large scale empirical study of a simple, fast and effective equivalent mutant detection technique M Papadakis, Y Jia, M Harman, Y Le Traon 2015 IEEE/ACM 37th IEEE International Conference on Software Engineering 1 …, 2015 | 244 | 2015 |
Comparing white-box and black-box test prioritization C Henard, M Papadakis, M Harman, Y Jia, Y Le Traon Proceedings of the 38th International Conference on Software Engineering …, 2016 | 230 | 2016 |
Permissioned blockchain frameworks in the industry: A comparison J Polge, J Robert, Y Le Traon Ict Express 7 (2), 229-233, 2021 | 226 | 2021 |
Fixminer: Mining relevant fix patterns for automated program repair A Koyuncu, K Liu, TF Bissyandé, D Kim, J Klein, M Monperrus, Y Le Traon Empirical Software Engineering 25, 1980-2024, 2020 | 225 | 2020 |
Combining multi-objective search and constraint solving for configuring large software product lines C Henard, M Papadakis, M Harman, Y Le Traon 2015 IEEE/ACM 37th IEEE International Conference on Software Engineering 1 …, 2015 | 217 | 2015 |
Got issues? who cares about it? a large scale investigation of issue trackers from github TF Bissyandé, D Lo, L Jiang, L Réveillere, J Klein, Y Le Traon 2013 IEEE 24th international symposium on software reliability engineering …, 2013 | 211 | 2013 |