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Seetal Potluri
Seetal Potluri
在 albany.edu 的电子邮件经过验证 - 首页
标题
引用次数
引用次数
年份
Biochipwork: Reverse engineering of microfluidic biochips
H Chen, S Potluri, F Koushanfar
2017 IEEE International Conference on Computer Design (ICCD), 9-16, 2017
452017
SeqL: Secure Scan-Locking for IP Protection
S Potluri, A Aysu, A Kumar
2020 21st International Symposium on Quality Electronic Design (ISQED), 7-13, 2020
28*2020
Machine learning and hardware security: Challenges and opportunities
F Regazzoni, S Bhasin, AA Pour, I Alshaer, F Aydin, A Aysu, V Beroulle, ...
Proceedings of the 39th International Conference on Computer-Aided Design, 1-6, 2020
262020
2Deep: Enhancing side-channel attacks on lattice-based key-exchange via 2-D Deep Learning
P Kashyap, F Aydin, S Potluri, PD Franzon, A Aysu
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2020
202020
Architecture synthesis for cost-constrained fault-tolerant flow-based biochips
MC Eskesen, P Pop, S Potluri
2016 Design, Automation & Test in Europe Conference & Exhibition (DATE), 618-623, 2016
152016
RevEAL: Single-trace side-channel leakage of the SEAL homomorphic encryption library
F Aydin, E Karabulut, S Potluri, E Alkim, A Aysu
2022 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2022
132022
iTimed: Cache attacks on the Apple A10 Fusion SoC
G Haas, S Potluri, A Aysu
2021 IEEE International Symposium on Hardware Oriented Security and Trust …, 2021
132021
Design-for-testability of on-chip control in mVLSI biochips
S Potluri, P Pop, J Madsen
IEEE Design & Test 36 (1), 48-56, 2018
122018
DFT assisted techniques for peak launch-to-capture power reduction during launch-on-shift at-speed testing
S Potluri, AS Trinadh, SB Ch, V Kamakoti, N Chandrachoodan
ACM Transactions on Design Automation of Electronic Systems (TODAES) 21 (1 …, 2015
122015
DeePar-SCA: Breaking parallel architectures of lattice cryptography via learning based side-channel attacks
F Aydin, P Kashyap, S Potluri, P Franzon, A Aysu
Embedded Computer Systems: Architectures, Modeling, and Simulation: 20th …, 2020
112020
Security of microfluidic biochip: Practical attacks and countermeasures
H Chen, S Potluri, F Koushanfar
ACM Transactions on Design Automation of Electronic Systems (TODAES) 25 (3 …, 2020
72020
MLTimer: Leakage power minimization in digital circuits using machine learning and adaptive lazy timing analysis
S Patanjali, M Patnaik, S Potluri, V Kamakoti
Journal of Low Power Electronics 14 (2), 285-301, 2018
72018
XStat: Statistical X-filling algorithm for peak capture power reduction in scan tests
AS Trinadh, S Potluri, S Balachandran, CS Babu, V Kamakoti
Journal of Low Power Electronics 10 (1), 107-115, 2014
72014
Towards ai-enabled hardware security: Challenges and opportunities
H Sayadi, M Aliasgari, F Aydin, S Potluri, A Aysu, J Edmonds, ...
2022 IEEE 28th International Symposium on On-Line Testing and Robust System …, 2022
62022
Stealing neural network models through the scan chain: A new threat for ML hardware
S Potluri, A Aysu
2021 IEEE/ACM International Conference On Computer Aided Design (ICCAD), 1-8, 2021
62021
Efficacy of satisfiability-based attacks in the presence of circuit reverse-engineering errors
Q Tan, S Potluri, A Aysu
2020 IEEE International Symposium on Circuits and Systems (ISCAS), 1-5, 2020
52020
Flowtrojan: Insertion and detection of hardware trojans on flow-based microfluidic biochips
H Chen, S Potluri, F Koushanfar
2020 18th IEEE International New Circuits and Systems Conference (NEWCAS …, 2020
42020
A scalable pseudo-exhaustive search for fault diagnosis in microfluidic biochips
V Gokulkrishnan, V Kamakoti, N Chandrachoodan, S Potluri
2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2017
42017
Optimal don’t care filling for minimizing peak toggles during at-speed stuck-at testing
AS Trinadh, S Potluri, SB Ch, V Kamakoti, SG Singh
ACM Transactions on Design Automation of Electronic Systems (TODAES) 23 (1 …, 2017
42017
Synthesis of on-chip control circuits for mVLSI biochips
S Potluri, A Schneider, P Pop, J Madsen
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017 …, 2017
42017
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