| Technology scaling comparison of flip-flop heavy-ion single-event upset cross sections NJ Gaspard, S Jagannathan, ZJ Diggins, MP King, SJ Wen, R Wong, ... IEEE Transactions on Nuclear Science 60 (6), 4368-4373, 2013 | 54 | 2013 |
| Estimation of hardened flip-flop neutron soft error rates using SRAM multiple-cell upset data in bulk CMOS N Gaspard, S Jagannathan, Z Diggins, M McCurdy, TD Loveless, ... 2013 IEEE International Reliability Physics Symposium (IRPS), SE. 6.1-SE. 6.5, 2013 | 40 | 2013 |
| Temperature dependence of soft error rate in flip-flop designs S Jagannathan, Z Diggins, N Mahatme, TD Loveless, BL Bhuva, SJ Wen, ... 2012 IEEE International Reliability Physics Symposium (IRPS), SE. 2.1-SE. 2.6, 2012 | 34 | 2012 |
| Effects of total-ionizing-dose irradiation on SEU-and SET-induced soft errors in bulk 40-nm sequential circuits RM Chen, ZJ Diggins, NN Mahatme, L Wang, EX Zhang, YP Chen, YN Liu, ... IEEE Transactions on Nuclear Science 64 (1), 471-476, 2016 | 25 | 2016 |
| Range-finding sensor degradation in gamma radiation environments ZJ Diggins, N Mahadevan, D Herbison, G Karsai, E Barth, RA Reed, ... IEEE Sensors Journal 15 (3), 1864-1871, 2014 | 21 | 2014 |
| Neutron-and alpha-particle induced soft-error rates for flip flops at a 40 nm technology node S Jagannathan, TD Loveless, Z Diggins, BL Bhuva, SJ Wen, R Wong, ... 2011 International Reliability Physics Symposium, SE. 5.1-SE. 5.5, 2011 | 21 | 2011 |
| Effect of threshold voltage implants on single-event error rates of D flip-flops in 28-nm bulk CMOS N Gaspard, S Jagannathan, Z Diggins, AV Kauppila, TD Loveless, ... 2013 IEEE International Reliability Physics Symposium (IRPS), SE. 7.1-SE. 7.3, 2013 | 19 | 2013 |
| Effects of temperature and supply voltage on SEU-and SET-induced errors in bulk 40-nm sequential circuits RM Chen, ZJ Diggins, NN Mahatme, L Wang, EX Zhang, YP Chen, ... IEEE Transactions on Nuclear Science 64 (8), 2122-2128, 2017 | 17 | 2017 |
| Radiation response and adaptive control-based degradation mitigation of MEMS accelerometers in ionizing dose environments EB Pitt, EJ Barth, ZJ Diggins, N Mahadevan, G Karsai, BD Sierawski, ... IEEE Sensors Journal 17 (4), 1132-1143, 2016 | 11 | 2016 |
| Impact of temporal masking of flip-flop upsets on soft error rates of sequential circuits RM Chen, NN Mahatme, ZJ Diggins, L Wang, EX Zhang, YP Chen, YN Liu, ... IEEE Transactions on Nuclear Science 64 (8), 2098-2106, 2017 | 10 | 2017 |
| Angled flip-flop single-event cross sections for submicron bulk CMOS technologies N Gaspard, S Jagannathan, Z Diggins, T Reece, SJ Wen, R Wong, K Lilja, ... 2013 14th European Conference on Radiation and Its Effects on Components and …, 2013 | 9 | 2013 |
| Hol man N Gaspard, S Jagannathan, Z Diggins, M McCurdy, TD Loveless, ... WT, Oates, TS, Fang, YP, Wen, SJ, Wong, R., Lilja, K., and Bounasser, M …, 2013 | 9 | 2013 |
| Comparative analysis of flip-flop designs for soft errors at advanced technology nodes BL Bhuva, K Lilja, J Holts, SJ Wen, R Wong, S Jagannathan, TD Loveless, ... 2011 IEEE International Conference on IC Design & Technology, 1-4, 2011 | 9 | 2011 |
| Bayesian inference modeling of total ionizing dose effects on system performance ZJ Diggins, N Mahadevan, EB Pitt, D Herbison, RM Hood, G Karsai, ... IEEE Transactions on Nuclear Science 62 (6), 2517-2524, 2015 | 8 | 2015 |
| Total-ionizing-dose induced timing window violations in CMOS microcontrollers ZJ Diggins, N Mahadevan, D Herbison, G Karsai, BD Sierawski, E Barth, ... IEEE Transactions on Nuclear Science 61 (6), 2979-2984, 2014 | 8 | 2014 |
| Scalability of capacitive hardening for flip-flops in advanced technology nodes ZJ Diggins, NJ Gaspard, NN Mahatme, S Jagannathan, TD Loveless, ... IEEE Transactions on Nuclear Science 60 (6), 4394-4398, 2013 | 8 | 2013 |
| System health awareness in total-ionizing dose environments ZJ Diggins, N Mahadevan, EB Pitt, D Herbison, G Karsai, BD Sierawski, ... IEEE Transactions on Nuclear Science 62 (4), 1674-1681, 2015 | 7 | 2015 |
| Impact of gamma radiation on range finding sensor performance ZJ Diggins, N Mahadevan, D Herbison, E Barth, A Witulski SENSORS, 2013 IEEE, 1-4, 2013 | 7 | 2013 |
| Analysis of temporal masking effect on single-event upset rates for sequential circuits RM Chen, ZJ Diggins, NN Mahatme, L Wang, EX Zhang, YP Chen, YN Liu, ... 2016 16th European Conference on Radiation and Its Effects on Components and …, 2016 | 6 | 2016 |
| Soft error rate comparison of various hardened and non-hardened flip-flops at 28-nm node N Gaspard, S Jagannathan, ZJ Diggins, NN Mahatme, TD Loveless, ... 2014 IEEE International Reliability Physics Symposium, SE. 5.1-SE. 5.5, 2014 | 6 | 2014 |
