| The application of an automated control strategy for an integrated continuous pharmaceutical pilot plant R Lakerveld, B Benyahia, PL Heider, H Zhang, A Wolfe, CJ Testa, ... Organic Process Research & Development 19 (9), 1088-1100, 2015 | 105 | 2015 |
| Effect of metal line width on electromigration of BEOL Cu interconnects S Choi, C Christiansen, L Cao, J Zhang, R Filippi, T Shen, KB Yeap, ... 2018 IEEE International Reliability Physics Symposium (IRPS), 4F. 4-1-4F. 4-6, 2018 | 24 | 2018 |
| Charge transport model to predict intrinsic reliability for dielectric materials SP Ogden, J Borja, JL Plawsky, TM Lu, KB Yeap, WN Gill Journal of Applied Physics 118 (12), 2015 | 22 | 2015 |
| Electron transport and dielectric breakdown in silicon nitride using a charge transport model SP Ogden, TM Lu, JL Plawsky Applied Physics Letters 109 (15), 2016 | 14 | 2016 |
| Robust BEOL MIMCAP for long and controllable TDDB lifetime L Cheng, S Choi, S Ogden, TJ Tang, R Fox 2019 IEEE International Reliability Physics Symposium (IRPS), 1-3, 2019 | 8 | 2019 |
| Charge transport model to predict dielectric breakdown as a function of voltage, temperature, and thickness SP Ogden, Y Xu, KB Yeap, T Shen, TM Lu, JL Plawsky Microelectronics Reliability 91, 232-242, 2018 | 8 | 2018 |
| New insight on TDDB area scaling methodology of non-Poisson systems T Shen, KB Yeap, S Ogden, C Christiansen, P Justison 2018 IEEE International Reliability Physics Symposium (IRPS), P-GD. 1-1-P-GD …, 2018 | 4 | 2018 |
| Method to Determine the Root Cause of Low- SiCOH Dielectric Failure Distributions SP Ogden, KB Yeap, T Shen, P Justison, TM Lu, JL Plawsky IEEE Electron Device Letters 38 (1), 119-122, 2016 | 3 | 2016 |
| Performance and reliability of tape automated bonding for high lead count high performance devices B Nelson, B Hargis, M Bertram, D Duane, L Gilg, W Hanna, H Hashemi, ... IEEE IRPS, 7.3-7.20, 1988 | 3 | 1988 |
| The application of an automated plant-wide control strategy for a continuous pharmaceutical pilot plant R Lakerveld, B Benyahia, PL Heider, H Zhang, A Wolfe, C Testa, S Ogden, ... 2014 American Control Conference, 3512-3517, 2014 | 2 | 2014 |
| Breakdown and reliability of nanoscale dielectric films SP Ogden Rensselaer Polytechnic Institute, 2017 | | 2017 |
| A moisture-related breakdown mechanism in low-k dielectrics using a multiple IV ramp test SP Ogden, J Borja, H Zhou, JL Plawsky, TM Lu, WN Gill 2015 IEEE International Reliability Physics Symposium, BD. 4.1-BD. 4.6, 2015 | | 2015 |
| The application of a plant-wide control strategy for an integrated continuous pharmaceutical pilot plant. R Lakerveld, B Benyahia, PL Heider, H Zhang, A Wolfe, C Testa, S Ogden, ... Loughborough University, 2014 | | 2014 |
