| From IC debug to hardware security risk: The power of backside access and optical interaction C Boit, S Tajik, P Scholz, E Amini, A Beyreuther, H Lohrke, JP Seifert 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis …, 2016 | 36 | 2016 |
| Assessment of a chip backside protection E Amini, A Beyreuther, N Herfurth, A Steigert, B Szyszka, C Boit Journal of Hardware and Systems Security 2, 345-352, 2018 | 33 | 2018 |
| Solution-processed photoconductive UV detectors based on ZnO nanosheets E Amini, M Dolatyari, A Rostami, H Shekari, H Baghban, H Rasooli, S Miri IEEE Photonics Technology Letters 24 (22), 1995-1997, 2012 | 15 | 2012 |
| Sensitive, Fast, Solution‐Processed Ultraviolet Detectors Based on Passivated Zinc Oxide Nanorods A Rostami, M Dolatyari, E Amini, H Rasooli, H Baghban, S Miri ChemPhysChem 14 (3), 554-559, 2013 | 12 | 2013 |
| IC security and quality improvement by protection of chip backside against hardware attacks E Amini, A Beyreuther, N Herfurth, A Steigert, R Muydinov, B Szyszka, ... Microelectronics Reliability 88, 22-25, 2018 | 11 | 2018 |
| Backside protection structure for security sensitive ics E Amini, R Muydinov, B Szyszka, C Boit International Symposium for Testing and Failure Analysis 81504, 279-284, 2017 | 9 | 2017 |
| Fabrication of fast and sensitive IR‐detectors based on PbS quantum dots passivated by organic ligands S Miri, A Rostami, M Dolatyari, H Baghban, H Rasooli, E Amini physica status solidi (a) 210 (2), 420-424, 2013 | 9 | 2013 |
| Special session: Physical attacks through the chip backside: Threats, challenges, and opportunities E Amini, K Bartels, C Boit, M Eggert, N Herfurth, T Kiyan, T Krachenfels, ... 2021 IEEE 39th VLSI Test Symposium (VTS), 1-12, 2021 | 5 | 2021 |
| Second generation of optical IC-backside protection structure E Amini, T Kiyan, N Herfurth, A Beyreuther, C Boit, JP Seifert 2020 IEEE International Symposium on the Physical and Failure Analysis of …, 2020 | 5 | 2020 |
| Photon emission as a characterization tool for bipolar parasitics in FinFET technology A Beyreuther, N Herfurth, E Amini, T Nakamura, I De Wolf, C Boit Microelectronics Reliability 88, 273-276, 2018 | 5 | 2018 |
| EOFM for contactless parameter extraction of low k dielectric MIS structures N Herfurth, E Amini, A Beyreuther, T Nakamura, S Keil, C Boit 2019 IEEE 26th International Symposium on Physical and Failure Analysis of …, 2019 | 4 | 2019 |
| A scalable & comprehensive resilience concept against optical & physical IC backside attacks N Herfurth, E Amini, M Lisker, JP Seifert, C Boit 2022 IEEE International Symposium on the Physical and Failure Analysis of …, 2022 | 2 | 2022 |
| Generation and Tracking of Optical Signals inside the IC to Improve Device Security and Failure Analysis E Amini, N Herfurth, A Beyreuther, JP Seifert, C Boit 2019 IEEE 26th International Symposium on Physical and Failure Analysis of …, 2019 | 2 | 2019 |
| EOFM measurements of lateral and vertical Bipolar Transistors in Silicon and SiGe: C Technologies A Beyreuther, N Herfurth, E Amini, T Nakamura, GG Fischer, S Keil, C Boit 2019 IEEE 26th International Symposium on Physical and Failure Analysis of …, 2019 | 2 | 2019 |
| Electrons Vs. Photons: Assessment of Circuit’s Activity Requirements for E-Beam and Optical Probing Attacks E Amini, T Kiyan, L Renkes, T Krachenfels, C Boit, JP Seifert, J Jatzkowski, ... International Symposium for Testing and Failure Analysis 84741, 339-345, 2023 | 1 | 2023 |
| The IC Ultra-Thin Back Surface-A Field of Real Nanoscale Fault Isolation Opportunities Requiring a Skillful Sample Preparation C Boit, J Jatzkowski, F Altmann, M DiBattista, S Silverman, G Zwicker, ... 2022 IEEE International Symposium on the Physical and Failure Analysis of …, 2022 | 1 | 2022 |
| Extraction of Secrets from Allegedly Secret-free IoT Sensors using Artificial Intelligence T Kiyan, T Krachenfels, E Amini, Z Shakibaei, C Boit, JP Seifert 2021 IEEE International Symposium on the Physical and Failure Analysis of …, 2021 | 1 | 2021 |
| Comprehensive parametric investigations of EOFM measurements on single FinFET transistors A Beyreuther, N Herfurth, E Amini, T Nakamura, B Motamedi, C Boit 2020 IEEE International Symposium on the Physical and Failure Analysis of …, 2020 | 1 | 2020 |
| New Access to Soft Breakdown Parameters of Low-k Dielectrics Through Localisation-Based Analysis N Herfurth, A Beyreuther, E Amini, C Boit, M Simon-Najasek, S Hübner, ... 2019 IEEE International Reliability Physics Symposium (IRPS), 1-9, 2019 | 1 | 2019 |
| Zinc oxide nanoplates for ultraviolet radiation detection M Dolatyari, E Amini, H Shekari, A Bakhtiari, A Rostami Asia Communications and Photonics Conference and Exhibition, 830820, 2011 | | 2011 |
