| Impact of NBTI on the temporal performance degradation of digital circuits BC Paul, K Kang, H Kufluoglu, MA Alam, K Roy IEEE Electron Device Letters 26 (8), 560-562, 2005 | 369 | 2005 |
| Temporal performance degradation under NBTI: Estimation and design for improved reliability of nanoscale circuits BC Paul, K Kang, H Kufluoglu, MA Alam, K Roy Proceedings of the Design Automation & Test in Europe Conference 1, 1-6, 2006 | 208 | 2006 |
| Impact of negative-bias temperature instability in nanoscale SRAM array: Modeling and analysis K Kang, H Kufluoglu, K Roy, MA Alam IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2007 | 199 | 2007 |
| Estimation of statistical variation in temporal NBTI degradation and its impact on lifetime circuit performance K Kang, SP Park, K Roy, MA Alam 2007 IEEE/ACM international conference on computer-aided design, 730-734, 2007 | 121 | 2007 |
| NBTI induced performance degradation in logic and memory circuits: How effectively can we approach a reliability solution? K Kang, S Gangwal, SP Park, R Kaushik 2008 Asia and South Pacific Design Automation Conference, 726-731, 2008 | 117 | 2008 |
| Negative bias temperature instability: Estimation and design for improved reliability of nanoscale circuits BC Paul, K Kang, H Kufluoglu, MA Alam, K Roy IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2007 | 102 | 2007 |
| On-chip variability sensor using phase-locked loop for detecting and correcting parametric timing failures K Kang, SP Park, K Kim, K Roy IEEE Transactions on Very Large Scale Integration (VLSI) Systems 18 (2), 270-280, 2009 | 87 | 2009 |
| Efficient transistor-level sizing technique under temporal performance degradation due to NBTI K Kang, H Kufluoglu, MA Alam, K Roy 2006 International Conference on Computer Design, 216-221, 2006 | 85 | 2006 |
| Reliability implications of bias-temperature instability in digital ICs SP Park, K Kang, K Roy IEEE Design & Test of Computers 26 (6), 8-17, 2009 | 81 | 2009 |
| Characterization of NBTI induced temporal performance degradation in nano-scale SRAM array using IDDQ K Kang, MA Alam, K Roy 2007 IEEE International Test Conference, 1-10, 2007 | 81 | 2007 |
| Characterization and estimation of circuit reliability degradation under NBTI using on-line IDDQ measurement K Kang, K Kim, AE Islam, MA Alam, K Roy Proceedings of the 44th annual Design Automation Conference, 358-363, 2007 | 70 | 2007 |
| Statistical timing analysis using levelized covariance propagation K Kang, BC Paul, K Roy Design, Automation and Test in Europe, 764-769, 2005 | 68 | 2005 |
| Reliable and self-repairing SRAM in nano-scale technologies using leakage and delay monitoring S Mukhopadhyay, K Kang, H Mahmoodi, K Roy IEEE International Conference on Test, 2005., 10 pp.-1135, 2005 | 62 | 2005 |
| Accurate estimation and modeling of total chip leakage considering inter-& intra-die process variations A Agarwal, K Kang, K Roy ICCAD-2005. IEEE/ACM International Conference on Computer-Aided Design, 2005 …, 2005 | 44 | 2005 |
| Reliability-and process-variation aware design of vlsi circuits M Alam, K Kang, BC Paul, K Roy 2007 14th International Symposium on the Physical and Failure Analysis of …, 2007 | 40 | 2007 |
| Statistical timing analysis using levelized covariance propagation considering systematic and random variations of process parameters K Kang, BC Paul, K Roy ACM Transactions on Design Automation of Electronic Systems (TODAES) 11 (4 …, 2006 | 34 | 2006 |
| Variation resilient low-power circuit design methodology using on-chip phase locked loop K Kang, K Kim, K Roy Proceedings of the 44th annual Design Automation Conference, 934-939, 2007 | 30 | 2007 |
| Fast and accurate estimation of nano-scaled SRAM read failure probability using critical point sampling IJ Chang, K Kang, S Mukhopadhyay, CH Kim, K Roy Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005 …, 2005 | 30 | 2005 |
| Device-Aware Yield-Centric Dual- Design Under Parameter Variations in Nanoscale Technologies A Agarwal, K Kang, S Bhunia, JD Gallagher, K Roy IEEE Transactions on Very Large Scale Integration (VLSI) Systems 15 (6), 660-671, 2007 | 26 | 2007 |
| Variation estimation and compensation technique in scaled LTPS TFT circuits for low-power low-cost applications J Li, K Kang, K Roy IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2008 | 24 | 2008 |
Kaushik RoyProfessor of Electrical and Computer Engineering, Purdue University在 purdue.edu 的电子邮件经过验证
