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Fred Le
Fred Le
Nexperia (former SPBU of NXP)
在 connect.ust.hk 的电子邮件经过验证
标题
引用次数
引用次数
年份
Experimental investigation of the failure mechanism of Cu–Sn intermetallic compounds in SAC solder joints
C Yang, F Le, SWR Lee
Microelectronics Reliability 62, 130-140, 2016
342016
An uninterrupted bird repeller on transmission line
F Le, J Luo, G Wu
2009 IEEE International Conference on Robotics and Biomimetics (ROBIO), 1983 …, 2009
162009
3D chip stacking with through silicon-vias (TSVs) for vertical interconnect and underfill dispensing
F Le, SWR Lee, Q Zhang
Journal of Micromechanics and Microengineering 27 (4), 045012, 2017
152017
Through silicon underfill dispensing for 3D die/interposer stacking
F Le, SWR Lee, KM Lau, CP Yue, JKO Sin, PKT Mok, WH Ki, HW Choi
2014 IEEE 64th Electronic Components and Technology Conference (ECTC), 919-924, 2014
72014
Underfill dispensing for 3D die stacking with through silicon vias
F Le, SWR Lee, J Wu, MMF Yuen
International Symposium on Microelectronics 2012 (1), 000548-000553, 2012
52012
Evaluation of Emerging High Melting Point Lead-free Solder and Hybrid Sinter Paste as Attaching Material for Clip Bond Package
FF Le, R van der Meulen, YK Leong, M Balakrishnan, Z Guan
International Symposium on Microelectronics 2020 (1), 000235-000241, 2020
42020
Failure analysis and experimental verification for through-silicon-via underfill dispensing on 3-D chip stack package
F Le, SWR Lee, JCC Lo, C Yang
IEEE Transactions on Components, Packaging and Manufacturing Technology 5 …, 2015
42015
An implantable medical device for transcorneal electrical stimulation: Packaging structure, process flow, and toxicology test
F Le, JCC Lo, X Qiu, SWR Lee, X Li, CY Tsui, WH Ki
IEEE Transactions on Components, Packaging and Manufacturing Technology 6 (8 …, 2016
32016
Parameter correlation and computational modeling for the flow of encapsulant in through-silicon-via underfill dispensing
F Le, SWR Lee, C Yang, JCC Lo
IEEE Transactions on Components, Packaging and Manufacturing Technology 5 (8 …, 2015
32015
Thermal Stability Characterization of High-Temperature Solders in Power Surface Mount Devices
FF Le, Z Guan, H Chen, WO Chaw, H Santican
2022 IEEE 24th Electronics Packaging Technology Conference (EPTC), 580-584, 2022
12022
Void-free underfill encapsulation for flip chip high voltage LED packaging
AW Shang, X Qiu, JCC Lo, SWR Lee, FF Le
2016 China Semiconductor Technology International Conference (CSTIC), 1-4, 2016
12016
Fluxless packaging of an implantable medical device for transcorneal electrical stimulation
F Le, JCC Lo, X Qiu, SWR Lee, X Li, CY Tsui, WH Ki
2015 IEEE 17th Electronics Packaging and Technology Conference (EPTC), 1-5, 2015
12015
A humanoid mini-walking robot with a stick
F Le, X Wu, S Yu, B Zhang, Y Xu
2009 International Conference on Information and Automation, 72-77, 2009
12009
Reflow Soldering Using Flux-sprayed Solder Preforms
FF Le, Z Guan, H Chen, H Santican, VAP Ramalingam
2023 24th International Conference on Electronic Packaging Technology (ICEPT …, 2023
2023
Die Tilt Improvement Through Copper Spacers in Solder Paste Printing
H Santican, I Dchar, D Yandoc, FF Le, L Latido
2022 IEEE 24th Electronics Packaging Technology Conference (EPTC), 1-5, 2022
2022
Assessment of Solder Flux Corrosivity and Flux Residue Level in Clip Bonding Assembly
FF Le, H Chen, Z Guan, FL Fajardo
54th International Symposium on Microelectronics 2021 (1), 000314-000320, 2021
2021
Influence of Porosity on the Mechanical Properties of Hybrid Silver Sintered Joint
Z Guan, FF Le, J Wu, J Yang, R Van Der Meulen, H Chen
2021 22nd International Conference on Electronic Packaging Technology (ICEPT …, 2021
2021
Effect of Material Properties and Bump Parameters on Capillary Filling in Through-Silicon-Via Underfill Dispensing
F Le, SWR Lee, M Tao, JCC Lo
2018 20th International Conference on Electronic Materials and Packaging …, 2018
2018
Silver Sintering Conceptual Study as a Lead-Free Solution for Clip Bond Power Packages
YKL Fitri Rafzanjani Mat, Fred Le
Nexperia Technical Forum 2018, 2018
2018
Characterization of Copper Diffusion in Through Silicon Vias
X Zhang, SWR Lee, F Le
Materials for Advanced Packaging, 923-951, 2017
2017
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