| Perpendicular magnetization and generic realization of the Ising model in artificial spin ice S Zhang, J Li, I Gilbert, J Bartell, MJ Erickson, Y Pan, PE Lammert, ... Physical review letters 109 (8), 087201, 2012 | 89 | 2012 |
| Magneto-optical Kerr effect studies of square artificial spin ice KK Kohli, AL Balk, J Li, S Zhang, I Gilbert, PE Lammert, VH Crespi, ... Physical Review B 84 (18), 180412, 2011 | 76 | 2011 |
| Isotope Dependence of the Lifetime of the Vibration of Oxygen in Silicon KK Kohli, G Davies, NQ Vinh, D West, SK Estreicher, T Gregorkiewicz, ... Physical review letters 96 (22), 225503, 2006 | 49 | 2006 |
| Capacitance monitoring using x-ray diffraction DH Kang, KK Kohli, OJ Kwon, A Madan, CE Murray US Patent 10,008,421, 2018 | 19* | 2018 |
| Predicting arrival time of components based on historical receipt data KK Kohli US Patent 11,030,557, 2021 | 14 | 2021 |
| Multitechnique metrology methods for evaluating pitch walking in 14 nm and beyond FinFETs R Chao, KK Kohli, Y Zhang, A Madan, GR Muthinti, AJ Hong, D Conklin, ... Journal of Micro/Nanolithography, MEMS, and MOEMS 13 (4), 041411-041411, 2014 | 14 | 2014 |
| Modified tungsten silicon DA Ferrer, KK Kohli, SA Krishnan, JF Shepard Jr, KKH Wong US Patent App. 10/192,822, 2019 | 13* | 2019 |
| Investigation on critical thickness dependence of ALD TiN diffusion barrier in MOL A Subramaniyan, DF Luppi, N Makela, L Bauer, A Madan, R Murphy, ... 2016 27th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC …, 2016 | 10 | 2016 |
| Novel in-line metrology methods for Fin pitch walking monitoring in 14nm node and beyond R Chao, K Kohli, Y Zhang, A Madan, GR Muthinti, AJ Hong, D Conklin, ... Metrology, Inspection, and Process Control for Microlithography XXVIII 9050 …, 2014 | 9 | 2014 |
| Team 9: a comparison of simple vs. complex models for suicide risk assessment M Morales, P Dey, K Kohli Proceedings of the seventh workshop on computational linguistics and …, 2021 | 6 | 2021 |
| Augmented reality field of view based on sensed user data DK Chakravarthi, KK Kohli, VA Valecha, JA Lyons US Patent 11,176,753, 2021 | 5 | 2021 |
| Automated detection and classification of printing sub-resolution assist features using machine learning algorithms KK Kohli, M Jobes, I Graur Optical Microlithography XXX 10147, 176-182, 2017 | 5 | 2017 |
| Creating knowledge base for optical proximity correction to reduce sub-resolution assist feature printing KK Kohli, MN Jobes, IC Graur US Patent 10,386,714, 2019 | 4 | 2019 |
| Decay mechanism of the vibration of oxygen in crystalline germanium G Davies, KK Kohli, P Clauws, NQ Vinh Physical Review B 80 (11), 113202, 2009 | 4 | 2009 |
| Capacitance monitoring using X-ray diffraction DH Kang, KK Kohli, OJ Kwon, A Madan, CE Murray US Patent 9,870,960, 2018 | 3 | 2018 |
| Capacitance monitoring using X-ray diffraction DH Kang, KK Kohli, OJ Kwon, A Madan, CE Murray US Patent 9,870,960, 2018 | 3 | 2018 |
| A comparison of simple vs. Complex models for suicide risk assessment M Morales, P Dey, K Kohli NAACL HLT 2021, 99, 2021 | 2 | 2021 |
| Non-Contact, Sub-Surface Detection of Alloy Segregation in Back-End of Line Copper Dual-Damascene Structures J Nag, S Ray, KK Kohli, AH Simon, BA Cohen, F Tijiwa-Birk, CJ Parks, ... IEEE Transactions on Semiconductor Manufacturing 28 (4), 469-473, 2015 | 2 | 2015 |
| Predictive navigation system DK Chakravarthi, KK Kohli, VA Valecha, JA Lyons US Patent 11,047,705, 2021 | 1 | 2021 |
| Assessment of minority-alloy component segregation (eg Mn, Al) in back end of line copper trench structures using Kelvin probe technique J Nag, K Kohli, A Simon, S Krishnan, C Parks, S Ray, F Tijiwa-Birk 25th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC 2014 …, 2014 | 1 | 2014 |
