| Analysis of tin whisker growth on lead-free alloys with Ni presence under thermal shock stress A Skwarek, M Pluska, J Ratajczak, A Czerwinski, K Witek, ... Materials Science and Engineering: B 176 (4), 352-357, 2011 | 24 | 2011 |
| Elimination of scanning electron microscopy image periodic distortions with digital signal‐processing methods M Płuska, A Czerwinski, J Ratajczak, J Kątcki, R Rak Journal of microscopy 224 (1), 89-92, 2006 | 24 | 2006 |
| Mid-infrared GaAs/AlGaAs quantum cascade lasers technology A Szerling, P Karbownik, K Kosiel, J Kubacka-Traczyk, ... Acta Physica Polonica A 116 (S), 2009 | 21 | 2009 |
| Occurrence of tin pest on the surface of tin‐rich lead‐free alloys A Skwarek, M Sroda, M Pluska, A Czerwinski, J Ratajczak, K Witek Soldering & surface mount technology 23 (3), 184-190, 2011 | 20 | 2011 |
| Room temperature, single mode emission from two-section coupled cavity InGaAs/AlGaAs/GaAs quantum cascade laser K Pierściński, D Pierścińska, M Pluska, P Gutowski, I Sankowska, ... Journal of Applied Physics 118 (13), 2015 | 16 | 2015 |
| Influence of laminate type on tin whisker growth in tin-rich lead-free solder alloys A Skwarek, M Pluska, A Czerwinski, K Witek Materials Science and Engineering: B 177 (15), 1286-1291, 2012 | 16 | 2012 |
| Temperature induced degradation mechanisms of AlInAs/InGaAs/InP quantum cascade lasers D Pierścińska, K Pierściński, M Płuska, G Sobczak, A Kuźmicz, ... Materials Research Express 5 (1), 016204, 2018 | 13 | 2018 |
| Why InGaN laser-diode degradation is accompanied by the improvement of its thermal stability L Marona, P Wiśniewski, M Leszczyński, I Grzegory, T Suski, S Porowski, ... Gallium Nitride Materials and Devices III 6894, 125-134, 2008 | 13 | 2008 |
| Processing of AlGaAs/GaAs quantum-cascade structures for terahertz laser A Szerling, K Kosiel, M Szymański, Z Wasilewski, K Gołaszewska, ... Journal of Nanophotonics 9 (1), 093079-093079, 2015 | 12 | 2015 |
| Separation of image-distortion sources and magnetic-field measurement in scanning electron microscope (SEM) M Płuska, A Czerwinski, J Ratajczak, J Kątcki, Ł Oskwarek, R Rak Micron 40 (1), 46-50, 2009 | 12 | 2009 |
| Formation of coupled-cavities in quantum cascade lasers using focused ion beam milling A Czerwinski, M Pluska, A Łaszcz, J Ratajczak, K Pierściński, ... Microelectronics Reliability 55 (9-10), 2142-2146, 2015 | 11 | 2015 |
| Examination of thermal properties and degradation of InGaN-based diode lasers by thermoreflectance spectroscopy and focused ion beam etching D Pierścińska, K Pierściński, M Płuska, Ł Marona, P Wiśniewski, P Perlin, ... AIP Advances 7 (7), 2017 | 10 | 2017 |
| ZnO nanostructures by atomic layer deposition method A Szczepanik, M Godlewski, E Guziewicz, K Kopalko, E Janik, ... Journal of Physics: Conference Series 146 (1), 012017, 2009 | 10 | 2009 |
| Impact of resistance on cathodoluminescence and its application for layer sheet-resistance measurements A Czerwinski, M Pluska, J Ratajczak, A Szerling, J Kątcki Applied Physics Letters 93 (4), 2008 | 9 | 2008 |
| Resistance and sheet resistance measurements using electron beam induced current A Czerwinski, M Płuska, J Ratajczak, A Szerling, J Kątcki Applied physics letters 89 (24), 2006 | 9 | 2006 |
| Properties and origin of oval defects in epitaxial structures grown by molecular beam epitaxy. A Szerling, K Kosiel, A Wójcik-Jedlińska, M Płuska, M Bugajski Optica Applicata 35 (3), 2005 | 9 | 2005 |
| Piezoresistive cantilever working in a shear force mode for in situ characterization of exposed micro-and nanostructures A Sierakowski, D Kopiec, P Janus, M Ekwińska, M Płuska, P Grabiec, ... Measurement Science and Technology 25 (4), 044018, 2014 | 8 | 2014 |
| Measurement of magnetic field distorting the electron beam direction in scanning electron microscope M Pluska, L Oskwarek, RJ Rak, A Czerwinski IEEE Transactions on Instrumentation and Measurement 58 (1), 173, 2009 | 8 | 2009 |
| Nanometer scale patterning of GaN using nanoimprint lithography and Inductively Coupled Plasma etching M Ekielski, M Juchniewicz, M Płuska, M Wzorek, E Kamińska, ... Microelectronic Engineering 133, 129-133, 2015 | 7 | 2015 |
| Degradation of AlInAs/InGaAs/InP quantum cascade lasers due to electrode adhesion failure D Pierścińska, K Pierściński, G Sobczak, P Gutowski, M Płuska, ... Microelectronics Reliability 99, 113-118, 2019 | 6 | 2019 |
