Towards an ADC BIST scheme using the histogram test technique F Azaïs, S Bernard, Y Betrand, M Renovell Proceedings IEEE European Test Workshop, 53-58, 2000 | 116 | 2000 |
Implementation of a linear histogram BIST for ADCs F Azaïs, S Bernard, Y Bertrand, M Renovell Proceedings Design, Automation and Test in Europe. Conference and Exhibition …, 2001 | 113 | 2001 |
A low-cost adaptive ramp generator for analog BIST applications F Azaïs, S Bernard, Y Bertrand, X Michel, M Renovell Proceedings 19th IEEE VLSI Test Symposium. VTS 2001, 266-271, 2001 | 99 | 2001 |
Hardware resource minimization for histogram-based ADC BIST M Renovell, F Azaïs, S Bernard, Y Bertrand Proceedings 18th IEEE VLSI Test Symposium, 247-252, 2000 | 95 | 2000 |
A high accuracy triangle-wave signal generator for on-chip ADC testing S Bernard, F Azaïs, Y Bertrand, M Renovell Proceedings The Seventh IEEE European Test Workshop, 89-94, 2002 | 85 | 2002 |
Making predictive analog/RF alternate test strategy independent of training set size H Ayari, F Azais, S Bernard, M Comte, V Kerzerho, O Potin, M Renovell 2012 IEEE International Test Conference, 1-9, 2012 | 51 | 2012 |
Smart selection of indirect parameters for DC-based alternate RF IC testing H Ayari, F Azais, S Bernard, M Comte, M Renovell, V Kerzerho, O Potin, ... 2012 IEEE 30th VLSI Test Symposium (VTS), 19-24, 2012 | 46 | 2012 |
A low-cost BIST architecture for linear histogram testing of ADCs F Azaïs, S Bernard, Y Bertrand, M Renovell Journal of Electronic Testing 17 (2), 139-147, 2001 | 46 | 2001 |
DC-100-GHz frequency doublers in InP DHBT technology V Puyal, A Konczykowska, P Nouet, S Bernard, S Blayac, F Jorge, M Riet, ... IEEE Transactions on Microwave theory and techniques 53 (4), 1338-1344, 2005 | 41 | 2005 |
Device for distributing power between cathodes of a multipolar electrode, in particular of an implant D Andreu, S Bernard, Y Bertrand, G Catheras, J Galy, D Guiraud, ... US Patent 7,768,151, 2010 | 37 | 2010 |
A new methodology for ADC test flow optimization S Bernard, M Comte, F Azaïs, Y Bertrand, M Renovell International Test Conference, 201-209, 2003 | 29 | 2003 |
New implantable stimulator for the FES of paralyzed muscles JD Techer, S Bernard, Y Bertrand, G Cathébras, D Guiraud Proceedings of the 30th European Solid-State Circuits Conference, 455-458, 2004 | 26 | 2004 |
Optimizing sinusoidal histogram test for low cost ADC BIST F Azaïs, S Bernard, Y Bertrand, M Renovell Journal of Electronic Testing 17, 255-266, 2001 | 26 | 2001 |
Effects of extraction method and storage of dry tissue on marine lipids and fatty acids F Sardenne, N Bodin, L Metral, A Crottier, F Le Grand, A Bideau, B Brisset, ... Analytica Chimica Acta 1051, 82-93, 2019 | 25 | 2019 |
Efficiency evaluation of analog/RF alternate test: Comparative study of indirect measurement selection strategies S Larguech, F Azaïs, S Bernard, M Comte, V Kerzérho, M Renovell Microelectronics Journal 46 (11), 1091-1102, 2015 | 23 | 2015 |
Fast digital post-processing technique for integral nonlinearity correction of analog-to-digital converters: Validation on a 12-bit folding-and-interpolating analog-to-digital … V Kerzérho, V Fresnaud, D Dallet, S Bernard, L Bossuet IEEE Transactions on Instrumentation and Measurement 60 (3), 768-775, 2010 | 23 | 2010 |
A novel DFT technique for testing complete sets of ADCs and DACs in complex SiPs V Kerzerho, P Cauvet, S Bernard, F Azais, M Comte, M Renovell IEEE Design & Test of Computers 23 (3), 234-243, 2006 | 22 | 2006 |
Efficient on-chip generator for linear histogram BIST of ADCs S Bernard, F Azais, Y Bertrand, M Renovell Proc. International Mixed-Signal Testing Workshop, 89-96, 2001 | 21 | 2001 |
A passive pressure sensor for continuously measuring the intraocular pressure in glaucomatous patients P Auvray, L Rousseau, G Lissorgues, F Soulier, O Potin, S Bernard, ... Irbm 33 (2), 117-122, 2012 | 20 | 2012 |
A broad-band active frequency doubler operating up to 120 GHz V Puyal, A Konczykowska, P Nouet, S Bernard, M Riet, F Jorge, J Godin European Gallium Arsenide and Other Semiconductor Application Symposium …, 2005 | 18 | 2005 |