| Evaluation of 10-nm bulk FinFET RF performance—Conventional versus NC-FinFET R Singh, K Aditya, SS Parihar, YS Chauhan, R Vega, TB Hook, A Dixit IEEE Electron Device Letters 39 (8), 1246-1249, 2018 | 58 | 2018 |
| 3-D LER and RDF matching performance of nanowire FETs in inversion, accumulation, and junctionless modes AK Bansal, C Gupta, A Gupta, R Singh, TB Hook, A Dixit IEEE Transactions on Electron Devices 65 (3), 1246-1252, 2018 | 38 | 2018 |
| Experimental Evaluation of Self-Heating and Analog/RF FOM in GAA-Nanowire FETs R Singh, K Aditya, A Veloso, B Parvais, A Dixit IEEE Transactions on Electron Devices 66 (8), 10.1109/TED.2019.2924439, 2019 | 18 | 2019 |
| Analytical modeling of parasitic capacitance in inserted-oxide FinFETs R Singh, A Gupta, C Gupta, AK Bansal, TB Hook, A Dixit IEEE Transactions on Electron Devices 64 (12), 5274-5278, 2017 | 12 | 2017 |
| 7-nm Nanowire FET process variation modeling using industry standard BSIM-CMG model R Singh, K Aditya, AK Bansal, PA Chanawala, TB Hook, A Dixit 2016 3rd International Conference on Emerging Electronics (ICEE), 1-4, 2016 | 9 | 2016 |
| Impact of Gamma-Ray Radiation on DC and RF Performance of 10-nm Bulk N-Channel FinFETs K Aditya, R Singh, M Kumar, R Vega, A Dixit IEEE Transactions on Device and Materials Reliability 20 (4), 760-766, 2020 | 7 | 2020 |
| Effect of Post Radiation Annealing on the TID Response of 0.18 μm bulk NFETs K Aditya, M Kumar, CK Jha, R Singh, P Yogi, S Basra, HS Jatana, A Dixit 2019 Electron Devices Technology and Manufacturing Conference (EDTM), 336-338, 2019 | 5 | 2019 |
| Characterization and Global Parameter Extraction of bulk MOSFETs using BSIM-BULK Model SS Parihar, C Jha, R Singh, R Gurjar, A Dixit 2018 5th IEEE Uttar Pradesh Section International Conference on Electrical …, 2018 | 5 | 2018 |
| Characterization and modeling of N-channel bulk FinFETs from DC to high frequency R Singh, P Kushwaha, S Ghosh, B Parvais, YS Chauhan, A Dixit 2017 International Conference on Electron Devices and Solid-State Circuits …, 2017 | 3 | 2017 |
| SEU Sensitivity of a 14-nm SOI FinFET eDRAM Cell under Heavy-ion Irradiation K Aditya, R Saini, M Kumar, R Singh, A Dixit 2018 4th IEEE International Conference on Emerging Electronics (ICEE), 1-4, 2018 | 2 | 2018 |
| Superior Transient Response to Heavy-Ion Irradiation by N-Channel SOI-iFinFETs K Aditya, R Singh, AK Bansal, R Saini, A Gupta, A Dixit IETE Journal of Research, 1-7, 2019 | 1 | 2019 |
| An investigation of reliability and variability issues in nanoscale SOI and multi-gate MOSFETs: modelling, simulation and characterization AD Manoj Kumar, Kritika Aditya, Ramendra Singh, Ishita Jain, Anshul Gupta CSI Transactions on ICT, 2277-9078, 2019 | 1* | 2019 |
| Impact of SOI thickness scaling on alpha-particle irradiation performance of MOSFETs K Aditya, R Saini, R Singh, CK Jha, A Dixit 2017 International Conference on Electron Devices and Solid-State Circuits …, 2017 | 1 | 2017 |
| Nanowire FET DC Parameter Extraction using BSIM-CMG Model AD Ramendra Singh, Anil K. Bansal, Ishita Jain 18th International Workshop on Physics of Semiconductor Devices, IISc …, 2015 | | 2015 |
Abhisek DixitNXP Chair Professor, Electrical Engineering, IIT Delhi, New Delhi, India在 ee.iitd.ac.in 的电子邮件经过验证
Abhisek DixitNXP Chair Professor, Electrical Engineering, IIT Delhi, New Delhi, India在 ee.iitd.ac.in 的电子邮件经过验证
Anil Kumar BansalResearch Scholar at IIT Delhi在 ee.iitd.ac.in 的电子邮件经过验证