| Ellipsometry and polarized light RMA Azzam, NM Bashara, DT Burns Analytica Chimica Acta 199, 283-284, 1987 | 12390 | 1987 |
| Photopolarimetric measurement of the Mueller matrix by Fourier analysis of a single detected signal RMA Azzam Optics Letters 2 (6), 148-150, 1978 | 698 | 1978 |
| Multiple determination of the optical constants of thin-film coating materials DP Arndt, RMA Azzam, JM Bennett, JP Borgogno, CK Carniglia, WE Case, ... Applied Optics 23 (20), 3571-3596, 1984 | 347 | 1984 |
| Propagation of partially polarized light through anisotropic media with or without depolarization: a differential 4× 4 matrix calculus RMA Azzam JOSA 68 (12), 1756-1767, 1978 | 331 | 1978 |
| Division-of-amplitude photopolarimeter (DOAP) for the simultaneous measurement of all four Stokes parameters of light RMA Azzam Optica Acta: International Journal of Optics 29 (5), 685-689, 1982 | 299 | 1982 |
| Arrangement of four photodetectors for measuring the state of polarization of light RMA Azzam Optics letters 10 (7), 309-311, 1985 | 290 | 1985 |
| Stokes-vector and Mueller-matrix polarimetry RMA Azzam JOSA A 33 (7), 1396-1408, 2016 | 222 | 2016 |
| General analysis and optimization of the four-detector photopolarimeter RMA Azzam, IM Elminyawi, AM El-Saba JOSA A 5 (5), 681-689, 1988 | 221 | 1988 |
| Fiber-optic four-detector polarimeter A Bouzid, MAG Abushagur, A El-Sabae, RMA Azzam Optics Communications 118 (3-4), 329-334, 1995 | 177 | 1995 |
| Accurate calibration of the four-detector photopolarimeter with imperfect polarizing optical elements RMA Azzam, AG Lopez JOSA A 6 (10), 1513-1521, 1989 | 145 | 1989 |
| Polarization properties of corner-cube retroreflectors: theory and experiment J Liu, RMA Azzam Applied optics 36 (7), 1553-1559, 1997 | 135 | 1997 |
| Construction, calibration, and testing of a four‐detector photopolarimeter RMA Azzam, E Masetti, IM Elminyawi, FG Grosz Review of scientific instruments 59 (1), 84-88, 1988 | 124 | 1988 |
| Ellipsometric function of a film–substrate system: applications to the design of reflection-type optical devices and to ellipsometry RMA Azzam, ARM Zaghloul, NM Bashara JOSA 65 (3), 252-260, 1975 | 119 | 1975 |
| Simplified approach to the propagation of polarized light in anisotropic media—application to liquid crystals RMA Azzam, NM Bashara JOSA 62 (11), 1252-1257, 1972 | 105 | 1972 |
| Chiral thin solid films: Method of deposition and applications RMA Azzam Applied physics letters 61 (26), 3118-3120, 1992 | 103 | 1992 |
| Generalized ellipsometry for surfaces with directional preference: application to diffraction gratings RMA Azzam, NM Bashara JOSA 62 (12), 1521-1523, 1972 | 99 | 1972 |
| A simple Fourier photopolarimeter with rotating polarizer and analyzer for measuring Jones and Mueller matrices RMA Azzam Optics Communications 25 (2), 137-140, 1978 | 98 | 1978 |
| Ellipsometry RMA Azzam, NM Bashara Handbook of Optics 2, 275, 1995 | 94 | 1995 |
| Polarization characteristics of scattered radiation from a diffraction grating by ellipsometry with application to surface roughness RMA Azzam, NM Bashara Physical Review B 5 (12), 4721, 1972 | 91 | 1972 |
| Mueller-matrix ellipsometry: a review RMA Azzam Polarization: Measurement, Analysis, and Remote Sensing 3121, 396-405, 1997 | 86 | 1997 |
