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Sule Ozev
标题
引用次数
引用次数
年份
Testing of Droplet-Based Microelectrofluidic Systems.
F Su, S Ozev, K Chakrabarty
ITC 46, 1192-1200, 2003
1532003
A mechanism for online diagnosis of hard faults in microprocessors
FA Bower, DJ Sorin, S Ozev
38th Annual IEEE/ACM International Symposium on Microarchitecture (MICRO'05 …, 2005
1432005
Tolerating hard faults in microprocessor array structures
FA Bower, PG Shealy, S Ozev, DJ Sorin
International Conference on Dependable Systems and Networks, 2004, 51-60, 2004
1262004
Defect filter for alternate RF test
HG Stratigopoulos, S Mir, E Acar, S Ozev
2010 15th IEEE European Test Symposium, 265-270, 2010
1032010
Ensuring the operational health of droplet-based microelectrofluidic biosensor systems
F Su, S Ozev, K Chakrabarty
IEEE Sensors Journal 5 (4), 763-773, 2005
1022005
Test planning and test resource optimization for droplet-based microfluidic systems
F Su, S Ozev, K Chakrabarty
Journal of Electronic Testing 22 (2), 199-210, 2006
882006
Concurrent testing of droplet-based microfluidic systems for multiplexed biomedical assays
F Su, S Ozev, K Chakrabarty
2004 International Conferce on Test, 883-892, 2004
722004
Detailed characterization of transceiver parameters through loop-back-based BiST
ES Erdogan, S Ozev
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 18 (6), 901-911, 2009
652009
Statistical test development for analog circuits under high process variations
F Liu, S Ozev
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2007
572007
Concurrent testing of digital microfluidics-based biochips
F Su, S Ozev, K Chakrabarty
ACM Transactions on Design Automation of Electronic Systems (TODAES) 11 (2 …, 2006
562006
Wafer-level RF test and DfT for VCO modulating transceiver architectures
S Ozev, C Olgaard
22nd IEEE VLSI Test Symposium, 2004. Proceedings., 217-222, 2004
472004
Testability implications in low-cost integrated radio transceivers: a Bluetooth case study
S Ozev, C Gaard, A Orailoglu
Proceedings International Test Conference 2001 (Cat. No. 01CH37260), 965-974, 2001
422001
Online built-in self-test of high switching frequency DC–DC converters using model reference based system identification techniques
N Beohar, VNK Malladi, D Mandal, S Ozev, B Bakkaloglu
IEEE Transactions on Circuits and Systems I: Regular Papers 65 (2), 818-831, 2017
402017
Experimental and simulated cycling of ISFET electric fields for drift reset
D Welch, S Shah, S Ozev, JB Christen
IEEE electron device letters 34 (3), 456-458, 2013
392013
Defect-oriented testing of RF circuits
E Acar, S Ozev
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2008
392008
Online diagnosis of hard faults in microprocessors
FA Bower, DJ Sorin, S Ozev
ACM Transactions on Architecture and Code Optimization (TACO) 4 (2), 8-es, 2007
392007
An ADC-BiST scheme using sequential code analysis
ES Erdogan, S Ozev
2007 Design, Automation & Test in Europe Conference & Exhibition, 1-6, 2007
392007
Self-repairing of microprocessor array structures
FA Bower III, S Ozev, PG Shealy, DJ Sorin
US Patent 7,415,644, 2008
382008
An industrial case study of analog fault modeling
E Yilmaz, A Meixner, S Ozev
29th VLSI test symposium, 178-183, 2011
372011
Defect-based RF testing using a new catastrophic fault model
E Acar, S Ozev
IEEE International Conference on Test, 2005., 9 pp.-429, 2005
362005
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