| Testing of Droplet-Based Microelectrofluidic Systems. F Su, S Ozev, K Chakrabarty ITC 46, 1192-1200, 2003 | 153 | 2003 |
| A mechanism for online diagnosis of hard faults in microprocessors FA Bower, DJ Sorin, S Ozev 38th Annual IEEE/ACM International Symposium on Microarchitecture (MICRO'05 …, 2005 | 143 | 2005 |
| Tolerating hard faults in microprocessor array structures FA Bower, PG Shealy, S Ozev, DJ Sorin International Conference on Dependable Systems and Networks, 2004, 51-60, 2004 | 126 | 2004 |
| Defect filter for alternate RF test HG Stratigopoulos, S Mir, E Acar, S Ozev 2010 15th IEEE European Test Symposium, 265-270, 2010 | 103 | 2010 |
| Ensuring the operational health of droplet-based microelectrofluidic biosensor systems F Su, S Ozev, K Chakrabarty IEEE Sensors Journal 5 (4), 763-773, 2005 | 102 | 2005 |
| Test planning and test resource optimization for droplet-based microfluidic systems F Su, S Ozev, K Chakrabarty Journal of Electronic Testing 22 (2), 199-210, 2006 | 88 | 2006 |
| Concurrent testing of droplet-based microfluidic systems for multiplexed biomedical assays F Su, S Ozev, K Chakrabarty 2004 International Conferce on Test, 883-892, 2004 | 72 | 2004 |
| Detailed characterization of transceiver parameters through loop-back-based BiST ES Erdogan, S Ozev IEEE Transactions on Very Large Scale Integration (VLSI) Systems 18 (6), 901-911, 2009 | 65 | 2009 |
| Statistical test development for analog circuits under high process variations F Liu, S Ozev IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2007 | 57 | 2007 |
| Concurrent testing of digital microfluidics-based biochips F Su, S Ozev, K Chakrabarty ACM Transactions on Design Automation of Electronic Systems (TODAES) 11 (2 …, 2006 | 56 | 2006 |
| Wafer-level RF test and DfT for VCO modulating transceiver architectures S Ozev, C Olgaard 22nd IEEE VLSI Test Symposium, 2004. Proceedings., 217-222, 2004 | 47 | 2004 |
| Testability implications in low-cost integrated radio transceivers: a Bluetooth case study S Ozev, C Gaard, A Orailoglu Proceedings International Test Conference 2001 (Cat. No. 01CH37260), 965-974, 2001 | 42 | 2001 |
| Online built-in self-test of high switching frequency DC–DC converters using model reference based system identification techniques N Beohar, VNK Malladi, D Mandal, S Ozev, B Bakkaloglu IEEE Transactions on Circuits and Systems I: Regular Papers 65 (2), 818-831, 2017 | 40 | 2017 |
| Experimental and simulated cycling of ISFET electric fields for drift reset D Welch, S Shah, S Ozev, JB Christen IEEE electron device letters 34 (3), 456-458, 2013 | 39 | 2013 |
| Defect-oriented testing of RF circuits E Acar, S Ozev IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2008 | 39 | 2008 |
| Online diagnosis of hard faults in microprocessors FA Bower, DJ Sorin, S Ozev ACM Transactions on Architecture and Code Optimization (TACO) 4 (2), 8-es, 2007 | 39 | 2007 |
| An ADC-BiST scheme using sequential code analysis ES Erdogan, S Ozev 2007 Design, Automation & Test in Europe Conference & Exhibition, 1-6, 2007 | 39 | 2007 |
| Self-repairing of microprocessor array structures FA Bower III, S Ozev, PG Shealy, DJ Sorin US Patent 7,415,644, 2008 | 38 | 2008 |
| An industrial case study of analog fault modeling E Yilmaz, A Meixner, S Ozev 29th VLSI test symposium, 178-183, 2011 | 37 | 2011 |
| Defect-based RF testing using a new catastrophic fault model E Acar, S Ozev IEEE International Conference on Test, 2005., 9 pp.-429, 2005 | 36 | 2005 |
