| Stress determination in textured thin films using X-ray diffraction BM Clemens, JA Bain MRS bulletin 17 (7), 46-51, 1992 | 194 | 1992 |
| Single-chip computers with microelectromechanical systems-based magnetic memory LR Carley, JA Bain, GK Fedder, DW Greve, DF Guillou, MSC Lu, ... Journal of applied physics 87 (9), 6680-6685, 2000 | 181 | 2000 |
| Influence of stress and texture on soft magnetic properties of thin films P Zou, W Yu, JA Bain IEEE Transactions on Magnetics 38 (5), 3501-3520, 2002 | 146 | 2002 |
| Mobility of oxygen vacancy in SrTiO3 and its implications for oxygen-migration-based resistance switching W Jiang, M Noman, YM Lu, JA Bain, PA Salvador, M Skowronski Journal of Applied Physics 110 (3), 2011 | 133 | 2011 |
| Joule Heating-Induced Metal–Insulator Transition in Epitaxial VO2/TiO2 Devices D Li, AA Sharma, DK Gala, N Shukla, H Paik, S Datta, DG Schlom, ... ACS applied materials & interfaces 8 (20), 12908-12914, 2016 | 126 | 2016 |
| Imaging of quantized magnetostatic modes using spatially resolved ferromagnetic resonance S Tamaru, JA Bain, RJM Van de Veerdonk, TM Crawford, M Covington, ... Journal of Applied Physics 91 (10), 8034-8036, 2002 | 106 | 2002 |
| Acousto-optical modulation of thin film lithium niobate waveguide devices L Cai, A Mahmoud, M Khan, M Mahmoud, T Mukherjee, J Bain, G Piazza Photonics Research 7 (9), 1003-1013, 2019 | 100 | 2019 |
| Oxygen Vacancy Creation, Drift, and Aggregation in TiO2‐Based Resistive Switches at Low Temperature and Voltage J Kwon, AA Sharma, JA Bain, YN Picard, M Skowronski Advanced Functional Materials 25 (19), 2876-2883, 2015 | 97 | 2015 |
| Imaging of optical field confinement in ridge waveguides fabricated on very-small-aperture laser F Chen, A Itagi, JA Bain, DD Stancil, TE Schlesinger, L Stebounova, ... Applied physics letters 83 (16), 3245-3247, 2003 | 96 | 2003 |
| Electronic instabilities leading to electroformation of binary metal oxide‐based resistive switches AA Sharma, M Noman, M Abdelmoula, M Skowronski, JA Bain Advanced Functional Materials 24 (35), 5522-5529, 2014 | 90 | 2014 |
| Elastic strains and coherency stresses in Mo/Ni multilayers JA Bain, LJ Chyung, S Brennan, BM Clemens Physical Review B 44 (3), 1184, 1991 | 90 | 1991 |
| Phase coupling and control of oxide-based oscillators for neuromorphic computing AA Sharma, JA Bain, JA Weldon IEEE Journal on Exploratory Solid-State Computational Devices and Circuits 1 …, 2015 | 87 | 2015 |
| Oscillatory neural networks based on TMO nano-oscillators and multi-level RRAM cells TC Jackson, AA Sharma, JA Bain, JA Weldon, L Pileggi IEEE journal on Emerging and Selected Topics in Circuits and Systems 5 (2 …, 2015 | 80 | 2015 |
| 12.5 THz Fco GeTe inline phase-change switch technology for reconfigurable RF and switching applications N El-Hinnawy, P Borodulin, EB Jones, BP Wagner, MR King, JS Mason, ... 2014 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS), 1-3, 2014 | 80 | 2014 |
| Low resistance, high dynamic range reconfigurable phase change switch for radio frequency applications EK Chua, LP Shi, R Zhao, KG Lim, TC Chong, TE Schlesinger, JA Bain Applied Physics Letters 97 (18), 2010 | 78 | 2010 |
| Design criteria in sizing phase-change RF switches G Slovin, M Xu, R Singh, TE Schlesinger, J Paramesh, JA Bain IEEE transactions on microwave theory and techniques 65 (11), 4531-4540, 2017 | 75 | 2017 |
| Computational investigations into the operating window for memristive devices based on homogeneous ionic motion M Noman, W Jiang, PA Salvador, M Skowronski, JA Bain Applied Physics A 102, 877-883, 2011 | 71 | 2011 |
| High frequency initial permeability of NiFe and FeAlN WP Jayasekara, JA Bain, MH Kryder IEEE transactions on magnetics 34 (4), 1438-1440, 1998 | 71 | 1998 |
| Application of image processing to characterize patterning noise in self-assembled nano-masks for bit-patterned media S Nabavi, BVKV Kumar, JA Bain, C Hogg, SA Majetich IEEE transactions on magnetics 45 (10), 3523-3526, 2009 | 70 | 2009 |
| AlN barriers for capacitance reduction in phase-change RF switches G Slovin, M Xu, J Paramesh, TE Schlesinger, JA Bain IEEE Electron Device Letters 37 (5), 568-571, 2016 | 68 | 2016 |
T.E. (Ed) SchlesingerBenjamin T Rome Dean, Whiting School of Engineering, Johns Hopkins在 jhu.edu 的电子邮件经过验证
