An enhanced MLSCR structure suitable for ESD protection in advanced epitaxial CMOS technology F Du, F Hou, W Song, R Chen, J Liu, Z Liu, JJ Liou IEEE Transactions on Electron Devices 66 (5), 2062-2067, 2019 | 27 | 2019 |
Augmented DTSCR with fast turn-on speed for nanoscale ESD protection applications F Du, W Song, F Hou, J Liu, Z Liu, JJ Liou, X Xiong, Q Li, Y Liu IEEE Transactions on Electron Devices 67 (3), 1353-1356, 2020 | 26 | 2020 |
An improved silicon-controlled rectifier (SCR) for low-voltage ESD application F Du, F Hou, W Song, L Chen, Y Nie, Y Qing, Y Xu, J Liu, Z Liu, JJ Liou IEEE Transactions on Electron Devices 67 (2), 576-581, 2020 | 21 | 2020 |
A compact and self-isolated dual-directional silicon controlled rectifier (SCR) for ESD applications F Du, Z Liu, J Liu, J Wang, JJ Liou IEEE Transactions on Device and Materials Reliability 19 (1), 169-175, 2019 | 19 | 2019 |
An enhanced gate-grounded NMOSFET for robust ESD applications F Du, S Song, F Hou, W Song, L Chen, J Liu, Z Liu, JJ Liou IEEE electron device letters 40 (9), 1491-1494, 2019 | 17 | 2019 |
Bidirectional silicon‐controlled rectifier for advanced ESD protection applications F Du, F Hou, Z Liu, J Liu, JJ Liou Electronics Letters 55 (2), 112-114, 2019 | 12 | 2019 |
Robust silicon-controlled rectifier with high-holding voltage for on-chip electrostatic protection W Song, R Chen, Z Tong, F Hou, F Du, Z Liu, H Liu IEEE Transactions on Electron Devices 69 (2), 696-703, 2021 | 11 | 2021 |
Compact and low leakage devices for bidirectional low-voltage ESD protection applications F Du, Y Qing, F Hou, K Zou, W Song, R Chen, J Liu, L Chen, JJ Liou, Z Liu IEEE Electron Device Letters 42 (3), 391-394, 2021 | 11 | 2021 |
Gate-controlled LVTSCR for high-voltage ESD protections in advanced CMOS processes R Chen, H Liu, C Yan, F Du, A Han, Y Zhang, W Huang, Q Xiang, T Gao, ... IEEE Transactions on Electron Devices 70 (4), 1566-1573, 2023 | 8 | 2023 |
Direct visualization of breakdown-induced metal migration in enhanced modified lateral silicon-controlled rectifiers X Chen, F Du, C Wang, H Xu, Y Zhang, F Hou, X Yang, Y Wu, C Tsai, ... IEEE Transactions on Electron Devices 68 (3), 1378-1381, 2021 | 8 | 2021 |
Improved LDMOS‐SCR for high‐voltage electrostatic discharge (ESD) protection applications W Song, F Hou, F Du, J Liu, Z Liu, JJ Liou Electronics Letters 56 (13), 680-682, 2020 | 7 | 2020 |
Novel symmetrical dual-directional SCR with p-type guard ring for high-voltage ESD protection F Du, KC Chang, X Lin, F Hou, L Chen, X Luo, Z Liu IEEE Transactions on Electron Devices 68 (8), 4164-4167, 2021 | 6 | 2021 |
A New dual directional SCR with high holding voltage for High Voltage ESD protection S Song, F Du, F Hou, W Song, Z Liu, J Liu 2019 IEEE International Conference on Electron Devices and Solid-State …, 2019 | 6 | 2019 |
A millimeter-wave broadband reflectionless ESD protection device A Han, J Zhou, F Du, Z Liu, X Luo IEEE Electron Device Letters 43 (6), 926-929, 2022 | 5 | 2022 |
Compact and fast response dual-directional SCR for nanoscale ESD protection engineering F Du, KC Chang, X Lin, F Hou, Y Zhang, A Han, X Luo, Z Liu IEEE Transactions on Electron Devices 69 (6), 3490-3493, 2022 | 5 | 2022 |
Design of a novel low voltage triggered silicon controlled rectifier (SCR) for ESD applications W Song, F Du, F Hou, J Liu, X Huang, Z Liu, JJ Liou 2020 International EOS/ESD Symposium on Design and System (IEDS), 1-4, 2021 | 5 | 2021 |
Improving robustness of GGNMOS with P-base layer for electrostatic discharge protection in 0.5-BCD process F Hou, R Chen, F Du, J Liu, Z Liu, JJ Liou Chinese Physics B 28 (8), 088501, 2019 | 5 | 2019 |
Enhanced gated-diode-triggered silicon-controlled rectifier for robust electrostatic discharge (ESD) protection applications W Song, F Hou, F Du, Z Liu, JJ Liou Chinese Physics B 29 (9), 098502, 2020 | 4 | 2020 |
Enhanced LVTSCR with High Holding Voltage in Advanced CMOS technology M Huang, F Du, F Hou, W Song, J Liu, Z Liu 2019 IEEE International Conference on Electron Devices and Solid-State …, 2019 | 4 | 2019 |
Novel diode-triggered SCR with suppressed multiple triggering for ESD applications L Chen, F Du, R Chen, J Liu, Z Liu, L Zhang 2018 IEEE International Conference on Electron Devices and Solid State …, 2018 | 4 | 2018 |