| MRAM as embedded non-volatile memory solution for 22FFL FinFET technology O Golonzka, JG Alzate, U Arslan, M Bohr, P Bai, J Brockman, B Buford, ... 2018 IEEE International Electron Devices Meeting (IEDM), 18.1. 1-18.1. 4, 2018 | 149 | 2018 |
| 13.2 A 3.6Mb 10.1Mb/mm2 Embedded Non-Volatile ReRAM Macro in 22nm FinFET Technology with Adaptive Forming/Set/Reset Schemes Yielding Down to 0.5V … P Jain, U Arslan, M Sekhar, BC Lin, L Wei, T Sahu, J Alzate-Vinasco, ... 2019 IEEE International Solid-State Circuits Conference-(ISSCC), 212-214, 2019 | 140 | 2019 |
| Non-volatile RRAM embedded into 22FFL FinFET technology O Golonzka, U Arslan, P Bai, M Bohr, O Baykan, Y Chang, A Chaudhari, ... 2019 Symposium on VLSI Technology, T230-T231, 2019 | 66 | 2019 |
| eNVM RRAM reliability performance and modeling in 22FFL FinFET technology YF Chang, JA O'Donnell, T Acosta, R Kotlyar, A Chen, PA Quintero, ... 2020 IEEE International Reliability Physics Symposium (IRPS), 1-4, 2020 | 13 | 2020 |
| Integrated circuit reliability assessment apparatus and method CF Connor, B Querbach, G McFadden, HP Belgal, R Khanna US Patent App. 14/961,824, 2017 | 12 | 2017 |
| Reliability for manufacturing on 45nm logic technology with high-k+ metal gate transistors and Pb-free packaging R Kasim, C Connor, J Hicks, J Jopling, C Litteken 2009 IEEE International Reliability Physics Symposium, 350-354, 2009 | 11 | 2009 |
| M, Mainuddin, M O Golonzka, J Alzate, U Arslan, M Bohr, P Bai, J Brockman, B Buford, ... Meterelliyoz, P. Nguyen, D. Nikonov, K. O'brien, JO Donnell, K. Oguz, D …, 0 | 8 | |
| Embedded emerging memory technologies for neuromorphic computing: Temperature instability and reliability YF Chang, I Karpov, R Hopkins, D Janosky, J Medeiros, B Sherrill, ... 2021 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2021 | 7 | 2021 |
| Integrated circuit reliability assessment apparatus and method US Patent 9,977,075, 0 | 7* | |
| IEEE Int. Electron Devices Meet O Golonzka, JG Alzate, U Arslan, M Bohr, P Bai, J Brockman, B Buford, ... the press); https://ieee-iedm. org/program, 2018 | 6 | 2018 |
| Rack scale architecture (rsa) and shared memory controller (smc) techniques of fast zeroing B Querbach, MA Schmisseur, RK Ramanujan, M Arafa, CF Connor, ... US Patent App. 14/752,826, 2016 | 6 | 2016 |
| Outlier detection for large scale manufacturing processes A Jauhri, B McDanel, C Connor 2015 IEEE International Conference on Big Data (Big Data), 2771-2774, 2015 | 6 | 2015 |
| eNVM MRAM retention reliability modeling in 22FFL FinFET technology JA O'Donnell, C Connor, T Pramanik, J Hicks, JG Alzate, F Hamzaoglu, ... 2019 IEEE International Reliability Physics Symposium (IRPS), 1-3, 2019 | 5 | 2019 |
| Selective performance level modes of operation in a non-volatile memory Connor, Q Christopher F., B Bruce, H P. US Patent 10,163,502, 2018 | 5* | 2018 |
| Determination of demarcation voltage for managing drift in non-volatile memory devices US Patent 9,691,492, 0 | 4* | |
| Memory cell including multi-level sensing B Querbach, C Connor US Patent 11,264,094, 2022 | 3 | 2022 |
| The copy exactly! Evolution story: High reliability fungible output based solely upon matching AE Lucero, C Connor, I Hsu, T Utlaut IEEE IRPS, 2017 | 3 | 2017 |
| Self-healing in a computing system using embedded non-volatile memory C Connor, B Querbach US Patent App. 15/943,594, 2019 | 1 | 2019 |
| Process Optimization of dual-gate CMOS IM Liu, YY Chen, C Connor, AB Joshi, DL Kwong SPIE 3212, 72-79, 1997 | 1 | 1997 |
| Gate dielectric for thin film oxide transistors C Connor, J O'donnell, SK Madisetti US Patent App. 17/476,165, 2023 | | 2023 |
