| The VLSI handbook WK Chen CRC press, 1999 | 302 | 1999 |
| Modeling, detection, and diagnosis of faults in multilevel memristor memories S Kannan, N Karimi, R Karri, O Sinanoglu IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2015 | 91 | 2015 |
| Online NoC switch fault detection and diagnosis using a high level fault model A Alaghi, N Karimi, M Sedghi, Z Navabi 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI …, 2007 | 91 | 2007 |
| Instruction-level impact analysis of low-level faults in a modern microprocessor controller M Maniatakos, N Karimi, C Tirumurti, A Jas, Y Makris IEEE Transactions on Computers, 60 (9), 1260-1273, 2011 | 89 | 2011 |
| Magic: Malicious aging in circuits/cores N Karimi, AK Kanuparthi, X Wang, O Sinanoglu, R Karri ACM Transactions on Architecture and Code Optimization (TACO) 12 (1), 1-25, 2015 | 51 | 2015 |
| A PUF-based modeling-attack resilient authentication protocol for IoT devices M Ebrahimabadi, M Younis, N Karimi IEEE Internet of Things Journal 9 (5), 3684-3703, 2021 | 46 | 2021 |
| Security vulnerabilities of emerging nonvolatile main memories and countermeasures S Kannan, N Karimi, O Sinanoglu, R Karri IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2014 | 44 | 2014 |
| Reconciling the IC test and security dichotomy O Sinanoglu, N Karimi, J Rajendran, R Karri, Y Jin, K Huang, Y Makris 2013 18th IEEE European Test Symposium (ETS), 1-6, 2013 | 41 | 2013 |
| Detection, diagnosis, and repair of faults in memristor-based memories S Kannan, N Karimi, R Karri, O Sinanoglu 2014 IEEE 32nd VLSI Test Symposium (VTS), 1-6, 2014 | 39 | 2014 |
| Dfssd: Deep faults and shallow state duality, a provably strong obfuscation solution for circuits with restricted access to scan chain S Roshanisefat, HM Kamali, KZ Azar, SMP Dinakarrao, N Karimi, ... 2020 IEEE 38th VLSI Test Symposium (VTS), 1-6, 2020 | 38 | 2020 |
| Detection, diagnosis, and recovery from clock-domain crossing failures in multiclock SoCs N Karimi, K Chakrabarty IEEE transactions on computer-aided design of integrated circuits and …, 2013 | 31 | 2013 |
| Online network-on-chip switch fault detection and diagnosis using functional switch faults. N Karimi, A Alaghi, M Sedghi, Z Navabi J. Univers. Comput. Sci. 14 (22), 3716-3736, 2008 | 30 | 2008 |
| On the correlation between controller faults and instruction-level errors in modern microprocessors N Karimi, M Maniatakos, A Jas, Y Makris 2008 IEEE International Test Conference, 1-10, 2008 | 30 | 2008 |
| Real-time prediction for IC aging based on machine learning K Huang, X Zhang, N Karimi IEEE Transactions on Instrumentation and Measurement 68 (12), 4756-4764, 2019 | 29 | 2019 |
| Special session: on the reliability of conventional and quantum neural network hardware M Sadi, Y He, Y Li, M Alam, S Kundu, S Ghosh, J Bahrami, N Karimi 2022 IEEE 40th VLSI Test Symposium (VTS), 1-12, 2022 | 28 | 2022 |
| Impact of aging on the reliability of delay PUFs N Karimi, JL Danger, S Guilley Journal of Electronic Testing 34, 571-586, 2018 | 27 | 2018 |
| Effect of aging on PUF modeling attacks based on power side-channel observations T Kroeger, W Cheng, S Guilley, JL Danger, N Karimi 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 454-459, 2020 | 24 | 2020 |
| Exploring the effect of device aging on static power analysis attacks N Karimi, T Moos, A Moradi IACR Transactions on Cryptographic Hardware and Embedded Systems, 233-256, 2019 | 24 | 2019 |
| Detecting failures and attacks via digital sensors MTH Anik, JL Danger, S Guilley, N Karimi IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2020 | 23 | 2020 |
| Lasca: Learning assisted side channel delay analysis for hardware trojan detection A Vakil, F Behnia, A Mirzaeian, H Homayoun, N Karimi, A Sasan 2020 21st International Symposium on Quality Electronic Design (ISQED), 40-45, 2020 | 22 | 2020 |
