Investigation of optical transmission in thin metal films A Axelevitch, B Gorenstein, G Golan Physics Procedia 32, 1-13, 2012 | 228 | 2012 |
Hot-probe method for evaluation of impurities concentration in semiconductors G Golan, A Axelevitch, B Gorenstein, V Manevych Microelectronics journal 37 (9), 910-915, 2006 | 153 | 2006 |
Simulation and experimental investigation of optical transparency in gold island films A Axelevitch, B Apter, G Golan Optics express 21 (4), 4126-4138, 2013 | 107 | 2013 |
Diode–capacitor voltage multipliers combined with boost-converters: Topologies and characteristics B Axelrod, Y Berkovich, A Shenkman, G Golan IET Power Electronics 5 (6), 873-884, 2012 | 94 | 2012 |
Metal–insulator phase transition in vanadium oxides films G Golan, A Axelevitch, B Sigalov, B Gorenstein Microelectronics Journal 34 (4), 255-258, 2003 | 68 | 2003 |
Hot-probe method for evaluation of majority charged carriers concentration in semiconductor thin films A Axelevitch, G Golan Facta universitatis-series: Electronics and Energetics 26 (3), 187-195, 2013 | 55 | 2013 |
Novel type of indium oxide thin films sputtering for opto-electronic applications G Golan, A Axelevitch, B Gorenstein, A Peled Applied surface science 253 (15), 6608-6611, 2007 | 48 | 2007 |
Liquid heating method and apparatus particularly useful for vaporizing a liquid condensate from cooling devices G Golan US Patent 6,965,732, 2005 | 48 | 2005 |
Electroless-deposited Ag–W films for microelectronics applications A Inberg, Y Shacham-Diamand, E Rabinovich, G Golan, N Croitoru Thin Solid Films 389 (1-2), 213-218, 2001 | 48 | 2001 |
Investigation of phase transition mechanism in vanadium oxide thin films G Golan, A Axelevitch, B Sigalov, B Gorenstein Journal of Optoelectronics and Advanced Materials 6 (1), 189-195, 2004 | 41 | 2004 |
Pedagogical communication patterns in collaborative telelearning R Aviv, G Golan Journal of educational technology systems 26 (3), 201-208, 1998 | 39 | 1998 |
Structures of transformerless step-up and step-down controlled rectifiers Y Berkovich, A Shenkman, B Axelrod, G Golan IET Power Electronics 1 (2), 245-254, 2008 | 27 | 2008 |
Dislocations structure investigation in neutron irradiated silicon detectors using AFM and microhardness measurements G Golan, E Rabinovich, A Inberg, A Axelevitch, M Oksman, Y Rosenwaks, ... Microelectronics Reliability 39 (10), 1497-1504, 1999 | 23 | 1999 |
Design and analysis of a novel tunable optical filter S Eliahou-Niv, R Dahan, G Golan microelectronics Journal 37 (4), 302-307, 2006 | 19 | 2006 |
Integrated thin film heater-thermocouple systems G Golan, A Axelevitch, B Sigalov, B Gorenstein Microelectronics Reliability 43 (3), 509-512, 2003 | 19 | 2003 |
Material and electrical properties of electroless Ag-W thin film A Inberg, Y Shacham-Diamand, E Rabinovich, G Golan, N Croitoru Journal of electronic materials 30, 355-359, 2001 | 19 | 2001 |
Novel approach to sputtered tantalum film resistors with controlled pre-defined resistance G Golan, A Axelevitch, R Margolin, E Rabinovitch Microelectronics journal 32 (1), 61-67, 2001 | 19 | 2001 |
Thin films indentation size effects in microhardness measurements G Golan, E Rabinovich, A Axelevitch, A Seidman, N Croitoru Journal of Optoelectronics and Advanced Materials 2 (4), 317-326, 2000 | 19 | 2000 |
Novel sputtering method for Pd–Al2O3 UV transparent conductive coatings G Golan, A Axelevitch Microelectronics Journal 31 (6), 469-473, 2000 | 18 | 2000 |
Atomic force microscopy investigation of dislocation structures and deformation characteristics in neutron-irradiated silicon detectors G Golan, E Rabinovich, A Inberg, M Oksman, PG Rancoita, M Rattaggi, ... Microelectronics journal 31 (11-12), 937-944, 2000 | 17 | 2000 |