Radiated EMI estimation from DC–DC converters with attached cables based on terminal equivalent circuit modeling S Shinde, K Masuda, G Shen, A Patnaik, T Makharashvili, D Pommerenke, ... IEEE Transactions on Electromagnetic Compatibility 60 (6), 1769-1776, 2017 | 62 | 2017 |
A frequency tunable high sensitivity H-field probe using varactor diodes and parasitic inductance S Shinde, S Marathe, G Li, R Zoughi, D Pommerenke IEEE Transactions on Electromagnetic Compatibility 58 (1), 331-334, 2015 | 44 | 2015 |
Wideband microwave reflectometry for rapid detection of dissimilar and aged ICs S Shinde, S Jothibasu, MT Ghasr, R Zoughi IEEE Transactions on Instrumentation and Measurement 66 (8), 2156-2165, 2017 | 23 | 2017 |
IEC 61000-4-2 ESD test in display down configurationfor cell phones J Zhou, S Shinde, Y Guo, A Talebzadeh, S Marathe, Y Gan, KH Kim, ... 2016 IEEE International Symposium on Electromagnetic Compatibility (EMC …, 2016 | 21 | 2016 |
Modeling EMI due to display signals in a TV S Shinde, X Gao, K Masuda, VV Khilkevich, D Pommerenke IEEE Transactions on Electromagnetic Compatibility 58 (1), 85-94, 2015 | 19 | 2015 |
Real time bridge scour monitoring with magneto-inductive field coupling A Radchenko, D Pommerenke, G Chen, P Maheshwari, S Shinde, V Pilla, ... Sensors and Smart Structures Technologies for Civil, Mechanical, and …, 2013 | 18 | 2013 |
A study on correlation between near-field EMI scan and ESD susceptibility of ICs A Hosseinbeig, OH Izadi, S Shinde, D Pommerenke, H Shumiya, ... 2017 IEEE International Symposium on Electromagnetic Compatibility & Signal …, 2017 | 17 | 2017 |
Experimental characterization and modeling of surface discharging for an electrostatic discharge (ESD) to an LCD display Y Gan, A Talebzadeh, X Xu, S Shinde, Y Zeng, KH Kim, D Pommerenke IEEE Transactions on Electromagnetic Compatibility 60 (1), 96-106, 2017 | 16 | 2017 |
Measurement techniques to identify soft failure sensitivity to ESD J Zhou, Y Guo, S Shinde, A Hosseinbeig, A Patnaik, OH Izadi, C Zeng, ... IEEE transactions on electromagnetic compatibility 62 (4), 1007-1016, 2019 | 14 | 2019 |
Terminal modeling of DC–DC converters with stochastic behavior G Shen, S Shinde, A Patnaik, D Pommerenke, H Aichele, C Keller, ... IEEE Transactions on Electromagnetic Compatibility 60 (6), 2011-2018, 2018 | 14 | 2018 |
Investigation of interference in a mobile phone from a DC-to-DC converter S Shinde, A Radchenko, J Pan, K Sung-Hee, D Kim, S Lee, J Fan, ... 2013 IEEE International Symposium on Electromagnetic Compatibility, 616-620, 2013 | 14 | 2013 |
An ESD demonstrator system for evaluating the ESD risks of wearable devices J Zhou, Z Legenzoff, X Yan, S Yang, S Xiang, S Shinde, J Lee, ... 2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 1-7, 2017 | 12 | 2017 |
ESD to the display inducing currents measured using a substitution PC board S Shinde, J Zhou, S Marathe, A Talebzadeh, Y Gan, D Pommerenke, ... 2016 IEEE International Symposium on Electromagnetic Compatibility (EMC …, 2016 | 11 | 2016 |
Common mode current prediction from a power converter with attached cables based on a terminal equivalent circuit model S Shinde, A Patnaik, T Makharashvilli, K Masuda, D Pommerenke 2016 IEEE International Symposium on Electromagnetic Compatibility (EMC …, 2016 | 6 | 2016 |
Investigating intra-system radio-frequency interference from high-speed traces to a GPS patch antenna S Shinde, L Li, K Ito, Y Kato, N Mukai, K Araki, J Fan 2013 IEEE International Symposium on Electromagnetic Compatibility, 7-11, 2013 | 6 | 2013 |
Optimizing measurement SNR for weak near-field scanning applications L Guan, G Maghlakelidze, X Yan, S Shinde, D Pommerenke 2017 IEEE International Symposium on Electromagnetic Compatibility & Signal …, 2017 | 5 | 2017 |
Electro-mechanical structures for channel emulation S Shinde, S Yang, N Erickson, D Pommerenke, C Ding, D White, ... 2014 IEEE International Symposium on Electromagnetic Compatibility (EMC …, 2014 | 3 | 2014 |
A new methodology for bridge scour monitoring with wireless smart rocks G Chen, D Pommerenke, YR Zheng, Y Huang, AV Radchenko, ... International American Society for Nondestructive Testing (ASNT), 2012 | 3 | 2012 |
EMI investigation and modeling of a flat panel display S Shinde Missouri University of Science and Technology, 2014 | 2 | 2014 |
Nanosecond Peak Detect and Hold Circuit With Adjustable Dynamic Range G Fellner, L Speckbacher, SM Mousavi, DJ Pommerenke, S Shinde, ... IEEE Transactions on Instrumentation and Measurement 72, 1-8, 2023 | | 2023 |