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Satyajeet Shinde
Satyajeet Shinde
Apple Inc., Cupertino, CA, USA
在 mst.edu 的电子邮件经过验证 - 首页
标题
引用次数
引用次数
年份
Radiated EMI estimation from DC–DC converters with attached cables based on terminal equivalent circuit modeling
S Shinde, K Masuda, G Shen, A Patnaik, T Makharashvili, D Pommerenke, ...
IEEE Transactions on Electromagnetic Compatibility 60 (6), 1769-1776, 2017
622017
A frequency tunable high sensitivity H-field probe using varactor diodes and parasitic inductance
S Shinde, S Marathe, G Li, R Zoughi, D Pommerenke
IEEE Transactions on Electromagnetic Compatibility 58 (1), 331-334, 2015
442015
Wideband microwave reflectometry for rapid detection of dissimilar and aged ICs
S Shinde, S Jothibasu, MT Ghasr, R Zoughi
IEEE Transactions on Instrumentation and Measurement 66 (8), 2156-2165, 2017
232017
IEC 61000-4-2 ESD test in display down configurationfor cell phones
J Zhou, S Shinde, Y Guo, A Talebzadeh, S Marathe, Y Gan, KH Kim, ...
2016 IEEE International Symposium on Electromagnetic Compatibility (EMC …, 2016
212016
Modeling EMI due to display signals in a TV
S Shinde, X Gao, K Masuda, VV Khilkevich, D Pommerenke
IEEE Transactions on Electromagnetic Compatibility 58 (1), 85-94, 2015
192015
Real time bridge scour monitoring with magneto-inductive field coupling
A Radchenko, D Pommerenke, G Chen, P Maheshwari, S Shinde, V Pilla, ...
Sensors and Smart Structures Technologies for Civil, Mechanical, and …, 2013
182013
A study on correlation between near-field EMI scan and ESD susceptibility of ICs
A Hosseinbeig, OH Izadi, S Shinde, D Pommerenke, H Shumiya, ...
2017 IEEE International Symposium on Electromagnetic Compatibility & Signal …, 2017
172017
Experimental characterization and modeling of surface discharging for an electrostatic discharge (ESD) to an LCD display
Y Gan, A Talebzadeh, X Xu, S Shinde, Y Zeng, KH Kim, D Pommerenke
IEEE Transactions on Electromagnetic Compatibility 60 (1), 96-106, 2017
162017
Measurement techniques to identify soft failure sensitivity to ESD
J Zhou, Y Guo, S Shinde, A Hosseinbeig, A Patnaik, OH Izadi, C Zeng, ...
IEEE transactions on electromagnetic compatibility 62 (4), 1007-1016, 2019
142019
Terminal modeling of DC–DC converters with stochastic behavior
G Shen, S Shinde, A Patnaik, D Pommerenke, H Aichele, C Keller, ...
IEEE Transactions on Electromagnetic Compatibility 60 (6), 2011-2018, 2018
142018
Investigation of interference in a mobile phone from a DC-to-DC converter
S Shinde, A Radchenko, J Pan, K Sung-Hee, D Kim, S Lee, J Fan, ...
2013 IEEE International Symposium on Electromagnetic Compatibility, 616-620, 2013
142013
An ESD demonstrator system for evaluating the ESD risks of wearable devices
J Zhou, Z Legenzoff, X Yan, S Yang, S Xiang, S Shinde, J Lee, ...
2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 1-7, 2017
122017
ESD to the display inducing currents measured using a substitution PC board
S Shinde, J Zhou, S Marathe, A Talebzadeh, Y Gan, D Pommerenke, ...
2016 IEEE International Symposium on Electromagnetic Compatibility (EMC …, 2016
112016
Common mode current prediction from a power converter with attached cables based on a terminal equivalent circuit model
S Shinde, A Patnaik, T Makharashvilli, K Masuda, D Pommerenke
2016 IEEE International Symposium on Electromagnetic Compatibility (EMC …, 2016
62016
Investigating intra-system radio-frequency interference from high-speed traces to a GPS patch antenna
S Shinde, L Li, K Ito, Y Kato, N Mukai, K Araki, J Fan
2013 IEEE International Symposium on Electromagnetic Compatibility, 7-11, 2013
62013
Optimizing measurement SNR for weak near-field scanning applications
L Guan, G Maghlakelidze, X Yan, S Shinde, D Pommerenke
2017 IEEE International Symposium on Electromagnetic Compatibility & Signal …, 2017
52017
Electro-mechanical structures for channel emulation
S Shinde, S Yang, N Erickson, D Pommerenke, C Ding, D White, ...
2014 IEEE International Symposium on Electromagnetic Compatibility (EMC …, 2014
32014
A new methodology for bridge scour monitoring with wireless smart rocks
G Chen, D Pommerenke, YR Zheng, Y Huang, AV Radchenko, ...
International American Society for Nondestructive Testing (ASNT), 2012
32012
EMI investigation and modeling of a flat panel display
S Shinde
Missouri University of Science and Technology, 2014
22014
Nanosecond Peak Detect and Hold Circuit With Adjustable Dynamic Range
G Fellner, L Speckbacher, SM Mousavi, DJ Pommerenke, S Shinde, ...
IEEE Transactions on Instrumentation and Measurement 72, 1-8, 2023
2023
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