Investigation of the p-GaN gate breakdown in forward-biased GaN-based power HEMTs AN Tallarico, S Stoffels, P Magnone, N Posthuma, E Sangiorgi, ... IEEE Electron Device Letters 38 (1), 99-102, 2016 | 157 | 2016 |
Magnetic anisotropy produced by magma flow: theoretical model and experimental data from Ferrar dolerite sills (Antarctica) M Dragoni, R Lanza, A Tallarico Geophysical Journal International 128 (1), 230-240, 1997 | 105 | 1997 |
PBTI in GaN-HEMTs With p-Type Gate: Role of the Aluminum Content on and Underlying Degradation Mechanisms AN Tallarico, S Stoffels, N Posthuma, P Magnone, D Marcon, S Decoutere, ... IEEE Transactions on Electron Devices 65 (1), 38-44, 2017 | 90 | 2017 |
The effect of crystallization on the rheology and dynamics of lava flows M Dragoni, A Tallarico Journal of Volcanology and Geothermal Research 59 (3), 241-252, 1994 | 88 | 1994 |
A model for the formation of lava tubes by roofing over a channel M Dragoni, A Piombo, A Tallarico Journal of Geophysical Research: Solid Earth 100 (B5), 8435-8447, 1995 | 74 | 1995 |
Viscous Newtonian laminar flow in a rectangular channel: application to Etna lava flows A Tallarico, M Dragoni Bulletin of Volcanology 61, 40-47, 1999 | 69 | 1999 |
Failure mode for p-GaN gates under forward gate stress with varying Mg concentration S Stoffels, B Bakeroot, TL Wu, D Marcon, NE Posthuma, S Decoutere, ... 2017 IEEE International Reliability Physics Symposium (IRPS), 4B-4.1-4B-4.9, 2017 | 62 | 2017 |
Threshold voltage instability in GaN HEMTs with p-type gate: Mg doping compensation AN Tallarico, S Stoffels, N Posthuma, S Decoutere, E Sangiorgi, C Fiegna IEEE Electron Device Letters 40 (4), 518-521, 2019 | 56 | 2019 |
Gate reliability of p-GaN HEMT with gate metal retraction AN Tallarico, S Stoffels, N Posthuma, B Bakeroot, S Decoutere, ... IEEE Transactions on Electron Devices 66 (11), 4829-4835, 2019 | 49 | 2019 |
Statistical analysis of the impact of anode recess on the electrical characteristics of AlGaN/GaN Schottky diodes with gated edge termination J Hu, S Stoffels, S Lenci, B De Jaeger, N Ronchi, AN Tallarico, ... IEEE Transactions on Electron Devices 63 (9), 3451-3458, 2016 | 45 | 2016 |
Longitudinal deformation of a lava flow: the influence of Bingham rheology M Dragoni, S Pondrelli, A Tallarico Journal of volcanology and geothermal research 52 (4), 247-254, 1992 | 40 | 1992 |
Perimeter driven transport in the p-GaN gate as a limiting factor for gate reliability S Stoffels, N Posthuma, S Decoutere, B Bakeroot, AN Tallarico, ... 2019 IEEE International Reliability Physics Symposium (IRPS), 1-10, 2019 | 39 | 2019 |
Time-dependent breakdown mechanisms and reliability improvement in edge terminated AlGaN/GaN Schottky diodes under HTRB tests J Hu, S Stoffels, M Zhao, AN Tallarico, I Rossetto, M Meneghini, X Kang, ... IEEE Electron Device Letters 38 (3), 371-374, 2017 | 38 | 2017 |
A model for the shape of lava flow fronts M Dragoni, I Borsari, A Tallarico Journal of Geophysical Research: Solid Earth 110 (B9), 2005 | 37 | 2005 |
A three‐dimensional Bingham model for channeled lava flows A Tallarico, M Dragoni Journal of Geophysical Research: Solid Earth 105 (B11), 25969-25980, 2000 | 36* | 2000 |
Hot-carrier degradation in power LDMOS: Selective LOCOS-versus STI-based architecture AN Tallarico, S Reggiani, R Depetro, AM Torti, G Croce, E Sangiorgi, ... IEEE Journal of the Electron Devices Society 6, 219-226, 2018 | 33 | 2018 |
Modeling long‐term ground deformation due to the cooling of a magma chamber: Case of Basiluzzo island, Aeolian Islands, Italy A Tallarico, M Dragoni, M Anzidei, A Esposito Journal of Geophysical Research: Solid Earth 108 (B12), 2003 | 32 | 2003 |
Field-and current-driven degradation of GaN-based power HEMTs with p-GaN gate: Dependence on Mg-doping level I Rossetto, M Meneghini, E Canato, M Barbato, S Stoffels, N Posthuma, ... Microelectronics Reliability 76, 298-303, 2017 | 31 | 2017 |
Assumptions in the evaluation of lava effusion rates from heat radiation M Dragoni, A Tallarico Geophysical Research Letters 36 (8), 2009 | 31 | 2009 |
Mechanisms of formation of lava tubes A Valerio, A Tallarico, M Dragoni Journal of Geophysical Research: Solid Earth 113 (B8), 2008 | 31 | 2008 |