| Origins of charge noise in carbon nanotube field-effect transistor biosensors T Sharf, JW Kevek, T DeBorde, JL Wardini, ED Minot Nano letters 12 (12), 6380-6384, 2012 | 59 | 2012 |
| Photothermoelectric effect in suspended semiconducting carbon nanotubes T DeBorde, L Aspitarte, T Sharf, JW Kevek, ED Minot ACS nano 8 (1), 216-221, 2014 | 51 | 2014 |
| Identifying individual single-walled and double-walled carbon nanotubes by atomic force microscopy T DeBorde, JC Joiner, MR Leyden, ED Minot Nano letters 8 (11), 3568-3571, 2008 | 44 | 2008 |
| Terahertz imaging of inhomogeneous electrodynamics in single-layer graphene embedded in dielectrics MJ Paul, JL Tomaino, JW Kevek, T DeBorde, ZJ Thompson, ED Minot, ... Applied Physics Letters 101 (9), 2012 | 32 | 2012 |
| Optical fault isolation and nanoprobing techniques for the 10 nm technology node and beyond M von Haartman, S Rahman, S Ganguly, J Verma, A Umair, T Deborde International Symposium for Testing and Failure Analysis 81030, 52-56, 2015 | 29 | 2015 |
| Determining the chiral index of semiconducting carbon nanotubes using photoconductivity resonances T DeBorde, L Aspitarte, T Sharf, JW Kevek, ED Minot The Journal of Physical Chemistry C 118 (19), 9946-9950, 2014 | 16 | 2014 |
| A spectrally-tunable photocurrent microscope for characterizing nanoelectronic devices T DeBorde, JW Kevek, T Sharf, JL Wardini, ED Minot 2011 11th IEEE International Conference on Nanotechnology, 382-386, 2011 | 7 | 2011 |
| Variable-force microscopy for advanced characterization of horizontally aligned carbon nanotubes AA Almaqwashi, JW Kevek, RM Burton, T DeBorde, ED Minot Nanotechnology 22 (27), 275717, 2011 | 7 | 2011 |
| Controlling the function of carbon nanotube devices with re-writable charge patterns L Prisbrey, T DeBorde, JY Park, ED Minot Applied Physics Letters 99 (5), 2011 | 4 | 2011 |
| Efficient fault isolation and failure analysis methods to root cause defects in microprocessors H Faraby, T Deborde, M von Haartman International Symposium for Testing and Failure Analysis 82747, 377-380, 2019 | 1 | 2019 |
| Scanning photocurrent microscopy study of photovoltaic and thermoelectric effects in individual single-walled carbon nanotubes T DeBorde | 1 | 2014 |
| Enhanced electron beam (e-beam) apparatus and methodology with nano-scale e-beam probe tips for fault isolation in integrated circuits and other structures X Tong, J Huening, J Kevek, K Celio, T Deborde, P Joshi, ML Oh, HJ Ryu, ... US Patent App. 18/090,415, 2024 | | 2024 |
| Terahertz imaging of inhomogeneous electrodynamics in single-layer graphene embedded in dielectrics Z Thompson, M Paul, J Tomaino, J Kevek, T Deborde, E Minot, YS Lee APS Northwest Section Meeting Abstracts 14, H1. 004, 2012 | | 2012 |
| Terahertz imaging of inhomogeneous electrodynamics in single-layer graphene embedded in dielectrics YS Lee, ZJ Thompson, ED Minot, JW Kevek, T DeBorde, MJ Paul, ... | | 2012 |
| Terahertz imaging and spectroscopy of large-area single-layer graphene MJ Paul, JL Tomaino, AD Jameson, JW Kevek, TA Deborde, ... Optical Sensors, SW1C. 1, 2012 | | 2012 |
| Terahertz imaging and spectroscopy of single-layer graphene embedded in dielectrics MJ Paul, JL Tomaino, JW Kevek, TA Deborde, ZJ Thompson, PL McEuen, ... CLEO: Science and Innovations, CTu3B. 1, 2012 | | 2012 |
| Scanning Photocurrent Characterization of Absorption Resonances and Photocarrier Generation in Single-Walled Carbon Nanotubes T Deborde, T Sharf, JW Kevek, ED Minot APS March Meeting Abstracts 2012, Y6. 004, 2012 | | 2012 |
| Large Area Graphene Growth and Characterization J Wardini, J Kevek, T Deborde, E Minot APS Northwest Section Meeting Abstracts 13, C2. 012, 2011 | | 2011 |
| Determination of carbon nanotube wall thickness and elasticity by atomic force micrsocopy. T Deborde, C Joiner, M Leyden, E Minot APS March Meeting Abstracts, Y29. 007, 2008 | | 2008 |
| Supporting information for “Photothermoelectric Effect in Suspended Semiconducting Carbon Nanotubes” T DeBorde, L Aspitarte, T Sharf, JW Kevek, ED Minot | | |
