| COVID-19 detection in cough audio dataset using deep learning model M Sabet, A Ramezani, SM Ghasemi 2022 8th International Conference on Control, Instrumentation and Automation …, 2022 | 6 | 2022 |
| Enabling in-field parametric testing for risc-v cores SM Ghasemi, S Meschkov, J Krautter, DRE Gnad, MB Tahoori 2023 IEEE International Test Conference (ITC), 367-376, 2023 | 3 | 2023 |
| SLM ISA and hardware extensions for RISC-V processors SM Ghasemi, S Meschkov, J Krautter, DRE Gnad, MB Tahoori 2023 IEEE 29th International Symposium on On-Line Testing and Robust System …, 2023 | 3 | 2023 |
| Reconfiguration of embedded accelerators by microprogramming for intensive loop computations S Yousefzadeh, K Basharkhah, N Nosrati, M Rajabalipanah, SM Ghasemi, ... 2020 23rd International Symposium on Design and Diagnostics of Electronic …, 2020 | 3 | 2020 |
| Concurrent Error Detection for LSTM Accelerators N Nosrati, SM Ghasemi, MS Roodsari, Z Navabi 2022 IEEE European Test Symposium (ETS), 1-2, 2022 | 1 | 2022 |
| Silicon Lifecycle Management (SLM): Requirements, Trends, and Opportunities M Tahoori, SM Ghasemi, Y Zorian IEEE Design & Test, 2024 | | 2024 |
| Degradation Monitoring Through Software-controlled On-chip Sensors for RISC-V SM Ghasemi, J Krautter, T Gheshlaghi, S Meschkov, DRE Gnad, ... 2024 IEEE European Test Symposium (ETS), 1-6, 2024 | | 2024 |
| In-Field Detection of Small Delay Defects and Runtime Degradation Using On-Chip Sensors SM Ghasemi, S Meschkov, J Krautter, DRE Gnad, MB Tahoori 2024 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-2, 2024 | | 2024 |
| POS2-Concurrent Error Detection for LSTM Accelerators N Nosrati, SM Ghasemi, MS Roodsari, Z Navabi | | 2022 |
| Reducing DFT hardware overhead by use of a test microprogram in a microprogrammed hardware accelerator M Rajabalipanah, SM Ghasemi, N Nosrati, K Basharkhah, S Yousefzadeh, ... 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2020 | | 2020 |
| SCOAP-based Directed Random Test Generation for Combinational Circuits SM Ghasemy, M Rajabalipanah, S Sarmadi, Z Navabi 2019 IEEE East-West Design & Test Symposium (EWDTS), 1-5, 2019 | | 2019 |
Mehdi B. TahooriProfessor of Computer Science, Karlsruhe Institute of Technology, Germany在 kit.edu 的电子邮件经过验证
