| Firefly: Illuminating future network-on-chip with nanophotonics Y Pan, P Kumar, J Kim, G Memik, Y Zhang, A Choudhary Proceedings of the 36th annual international symposium on Computer …, 2009 | 533 | 2009 |
| Flexishare: Channel sharing for an energy-efficient nanophotonic crossbar Y Pan, J Kim, G Memik HPCA-16 2010 The Sixteenth International Symposium on High-Performance …, 2010 | 250 | 2010 |
| Power to the people: Leveraging human physiological traits to control microprocessor frequency A Shye, Y Pan, B Scholbrock, JS Miller, G Memik, PA Dinda, RP Dick 2008 41st IEEE/ACM International Symposium on Microarchitecture, 188-199, 2008 | 78 | 2008 |
| Galaxy: A high-performance energy-efficient multi-chip architecture using photonic interconnects Y Demir, Y Pan, S Song, N Hardavellas, J Kim, G Memik Proceedings of the 28th ACM international conference on Supercomputing, 303-312, 2014 | 76 | 2014 |
| Exploring concentration and channel slicing in on-chip network router P Kumar, Y Pan, J Kim, G Memik, A Choudhary 2009 3rd ACM/IEEE International Symposium on Networks-on-Chip, 276-285, 2009 | 67 | 2009 |
| Selective wordline voltage boosting for caches to manage yield under process variations Y Pan, J Kong, S Ozdemir, G Memik, SW Chung Proceedings of the 46th annual design automation conference, 57-62, 2009 | 46 | 2009 |
| Featherweight: low-cost optical arbitration with qos support Y Pan, J Kim, G Memik Proceedings of the 44th Annual IEEE/ACM International Symposium on …, 2011 | 42 | 2011 |
| Leveraging root cause deconvolution analysis for logic yield ramping Y Pan, A Chittora, K Sekar, GS Huat, YG Feng, A Viswanatha, J Lam International Symposium for Testing and Failure Analysis 80224, 602-607, 2013 | 25 | 2013 |
| Quantifying and coping with parametric variations in 3D-stacked microarchitectures S Ozdemir, Y Pan, A Das, G Memik, G Loh, A Choudhary Proceedings of the 47th Design Automation Conference, 144-149, 2010 | 22 | 2010 |
| Effectiveness of frequency mapping on 28 nm device broken scan chain failures SH Goh, Y Pan, GF You, YH Chan, T Herrman, T Heller, VSK Lim, ZH Mai, ... Review of Scientific Instruments 83 (2), 2012 | 18 | 2012 |
| Automatic identification of yield limiting layout patterns using root cause deconvolution on volume scan diagnosis data WT Cheng, R Klingenberg, B Benware, W Yang, M Sharma, G Eide, ... 2017 IEEE 26th Asian Test Symposium (ATS), 219-224, 2017 | 14 | 2017 |
| Systematic defect detection methodology for volume diagnosis: A data mining perspective C Shan, P Babighian, Y Pan, J Carulli, LC Wang 2017 IEEE International Test Conference (ITC), 1-10, 2017 | 14 | 2017 |
| Tuning nanophotonic on-chip network designs for improving memory trafics Y Pan, J Kim, G Memik PICA@ MICRO2009, 2011 | 10 | 2011 |
| System and method for leveraging human physiological traits to control microprocessor frequency A Shye, Y Pan, B Scholbrock, JS Miller, G Memik, PA Dinda, RP Dick US Patent 8,683,242, 2014 | 8 | 2014 |
| Fine-grain voltage tuned cache architecture for yield management under process variations J Kong, Y Pan, S Ozdemir, A Mohan, G Memik, SW Chung IEEE transactions on very large scale integration (VLSI) systems 20 (8 …, 2011 | 8 | 2011 |
| Net tracing and classification analysis on E-beam die-to-database inspection W Gao, X Zeng, P Lin, Y Pan, HY Song, H Nguyen, N Cai, Z Chen, K Zafar Metrology, Inspection, and Process Control for Microlithography XXX 9778 …, 2016 | 7 | 2016 |
| SpotMe effective co-optimization of design and defect inspection for fast yield ramp Y Pan, R Desineni, J Lambert, E Teoh, T Berndt, V Lim, GS Huat, J Kim, ... ASMC 2013 SEMI Advanced Semiconductor Manufacturing Conference, 200-205, 2013 | 7 | 2013 |
| Exploring benefits and designs of optically connected disintegrated processor architecture Y Pan, Y Demir, N Hardavellas, J Kim, G Memik Workshop on the Interaction between Nanophotonic Devices and Systems (in …, 2010 | 6 | 2010 |
| Yield learning for complex finfet defect mechanisms based on volume scan diagnosis results H Tang, M Sharma, WT Cheng, G Veda, D Gehringer, M Knowles, ... 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC …, 2019 | 5 | 2019 |
| Application of Bayesian Machine Learning To Create A Low-Cost Silicon Failure Mechanism Pareto C Schuermyer, S Palosh, P Babighian, Y Pan 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC …, 2019 | 5 | 2019 |
Gokhan MemikProfessor, Northwestern University在 eecs.northwestern.edu 的电子邮件经过验证
