Breast cancer diagnosis using statistical neural networks T Kıyan, T Yıldırım IU-Journal of Electrical & Electronics Engineering 4 (2), 1149-1153, 2004 | 184 | 2004 |
Automatic Extraction of Secrets from the Transistor Jungle using {Laser-Assisted}{Side-Channel} Attacks T Krachenfels, T Kiyan, S Tajik, JP Seifert 30th USENIX security symposium (USENIX security 21), 627-644, 2021 | 30 | 2021 |
Physical IC debug–backside approach and nanoscale challenge C Boit, R Schlangen, A Glowacki, U Kindereit, T Kiyan, U Kerst, ... Advances in Radio Science 6, 265-272, 2008 | 19 | 2008 |
Comparative assessment of optical techniques for semi-invasive SRAM data read-out on an MSP430 microcontroller T Kiyan, H Lohrke, C Boit International Symposium for Testing and Failure Analysis 81009, 266-271, 2018 | 18 | 2018 |
Timing analysis of scan design integrated circuits using stimulation by an infrared diode laser in externally triggered pulsing condition T Kiyan, C Brillert, C Boit Microelectronics Reliability 48 (8-9), 1327-1332, 2008 | 10 | 2008 |
Logic state imaging from fa techniques for special applications to one of the most powerful hardware security side-channel threats C Boit, T Kiyan, T Krachenfels, JP Seifert 2020 IEEE International Symposium on the Physical and Failure Analysis of …, 2020 | 8 | 2020 |
Dynamic Analysis of Tester Operated Integrated Circuits Stimulated by Infra-Red Lasers T Kiyan | 7 | 2010 |
Timing sensitivity analysis of logical nodes in scan design integrated circuits by pulsed diode laser stimulation T Kiyan, C Boit, C Brillert International Symposium for Testing and Failure Analysis 30910, 180-187, 2008 | 7 | 2008 |
Breast Cancer Diagnosis Using Statistical Neural Networks. International XII T Kiyan, T Yildirim Turkish Symposium on Artificial Intelligence and Neural Networks. University …, 2003 | 7 | 2003 |
Second generation of optical IC-backside protection structure E Amini, T Kiyan, N Herfurth, A Beyreuther, C Boit, JP Seifert 2020 IEEE International Symposium on the Physical and Failure Analysis of …, 2020 | 6 | 2020 |
Special session: Physical attacks through the chip backside: Threats, challenges, and opportunities E Amini, K Bartels, C Boit, M Eggert, N Herfurth, T Kiyan, T Krachenfels, ... 2021 IEEE 39th VLSI Test Symposium (VTS), 1-12, 2021 | 5 | 2021 |
Hardware application of human-machine interface in smart air conditioners using hand tracking E Acay, N Kahraman, M Taskiran, T Kiyan, HU Yogun 2016 International Symposium ELMAR, 269-272, 2016 | 4 | 2016 |
Timing Characterization of a Tester Operated Integrated Circuit by Continuous and Pulsed Laser Stimulation T Kiyan, C Brillert, C Boit International Symposium for Testing and Failure Analysis 30415, 211-216, 2010 | 3 | 2010 |
A Neural Network-Based Design Automation of a Second Generation Current Conveyor N Kahraman, T Kiyan 2014 International Conference on Computational Science and Computational …, 2014 | 2 | 2014 |
Dynamic Laser Stimulation K Tuba LAP Lambert Academic Publishing, 2013 | 2 | 2013 |
Electrons Vs. Photons: Assessment of Circuit’s Activity Requirements for E-Beam and Optical Probing Attacks E Amini, T Kiyan, L Renkes, T Krachenfels, C Boit, JP Seifert, J Jatzkowski, ... International Symposium for Testing and Failure Analysis 84741, 339-345, 2023 | 1 | 2023 |
Extraction of Secrets from Allegedly Secret-free IoT Sensors using Artificial Intelligence T Kiyan, T Krachenfels, E Amini, Z Shakibaei, C Boit, JP Seifert 2021 IEEE International Symposium on the Physical and Failure Analysis of …, 2021 | 1 | 2021 |
Detection of P300 based on Artficial Bee Colony SA Aytekin, T Kiyan International Conference on Bio-inspired Systems and Signal Processing 5 …, 2016 | 1 | 2016 |
Evaluating an Open-Source Hardware Approach from HDL to GDS for a Security Chip Design-a Review of the Final Stage of Project HEP T Henkes, S Reith, M Stöttinger, N Herfurth, G Panic, J Wälde, ... 2024 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6, 2024 | | 2024 |
On the Design of Pseudo Resistors in Biomedical CMOS Circuits T Lausen, B Jusko, T Kiyan, S Keil, R Thewes MikroSystemTechnik Congress 2021; Congress, 1-2, 2021 | | 2021 |