Direct Observation of Ferroelectric Domain Walls in LiNbO3: Wall‐Meanders, Kinks, and Local Electric Charges J Gonnissen, D Batuk, GF Nataf, L Jones, AM Abakumov, S Van Aert, ... Advanced Functional Materials 26 (42), 7599-7604, 2016 | 86 | 2016 |
Thickness dependent properties in oxide heterostructures driven by structurally induced metal–oxygen hybridization variations Z Liao, N Gauquelin, RJ Green, S Macke, J Gonnissen, S Thomas, ... Advanced functional materials 27 (17), 1606717, 2017 | 78 | 2017 |
Estimation of unknown structure parameters from high-resolution (S) TEM images: what are the limits? AJ Den Dekker, J Gonnissen, A De Backer, J Sijbers, S Van Aert Ultramicroscopy 134, 34-43, 2013 | 53 | 2013 |
Optimal experimental design for nano-particle atom-counting from high-resolution STEM images A De Backer, J Gonnissen, S Van Aert Ultramicroscopy 151, 46-55, 2015 | 49 | 2015 |
Long‐Range Domain Structure and Symmetry Engineering by Interfacial Oxygen Octahedral Coupling at Heterostructure Interface Z Liao, RJ Green, N Gauquelin, S Macke, L Li, J Gonnissen, R Sutarto, ... Advanced Functional Materials 26 (36), 6627-6634, 2016 | 34 | 2016 |
Optimal experimental design for the detection of light atoms from high-resolution scanning transmission electron microscopy images J Gonnissen, A De Backer, AJ Den Dekker, GT Martinez, A Rosenauer, ... Applied Physics Letters 105 (6), 2014 | 34 | 2014 |
Direct space structure solution from precession electron diffraction data: Resolving heavy and light scatterers in Pb13Mn9O25 J Hadermann, AM Abakumov, AA Tsirlin, VP Filonenko, J Gonnissen, ... Ultramicroscopy 110 (7), 881-890, 2010 | 30 | 2010 |
Detecting and locating light atoms from high-resolution STEM images: The quest for a single optimal design J Gonnissen, A De Backer, AJ Den Dekker, J Sijbers, S Van Aert Ultramicroscopy 170, 128-138, 2016 | 13 | 2016 |
Atom-counting in high resolution electron microscopy: TEM or STEM–That's the question J Gonnissen, A De Backer, AJ den Dekker, J Sijbers, S Van Aert Ultramicroscopy 174, 112-120, 2017 | 11 | 2017 |
Optimal statistical experiment design for detecting and locating light atoms using quantitative high resolution (scanning) transmission electron microscopy J Gonnissen University of Antwerp, 2017 | | 2017 |
Optimal detectability combined with picometre range precision to position light atoms from HR STEM images J Gonnissen, A De Backer, A Jan den Dekker, J Sijbers, S Van Aert European Microscopy Congress 2016: Proceedings, 549-550, 2016 | | 2016 |
Engineering properties by long range symmetry propagation initiated at perovskite heterostructure interface ZL Liao, RJ Green, N Gauquelin, J Gonnissen, S Van Aert, J Verbeeck Advanced functional materials.-Weinheim, 1-25, 2016 | | 2016 |
Quantitative annular dark field scanning transmission electron microscopy for nanoparticle atom-counting: What are the limits? A De Backer, A De Wael, J Gonnissen, GT Martinez, A Béché, ... Journal of Physics: Conference Series 644 (1), 012034, 2015 | | 2015 |
Analysis of magnetic structures using magnetic superspace groups vs. representation analysis J Gonnissen UNIVERSITEIT ANTWERPEN, 2012 | | 2012 |
Atomic number estimation from STEM images: what are the limits? J Gonnissen, AJ den Dekker, A De Backer, J Sijbers, S Van Aert | | |