Decoupling-controlled triport composited DC/DC converter for multiple energy interface W Li, C Xu, H Luo, Y Hu, X He, C Xia IEEE Transactions on Industrial Electronics 62 (7), 4504-4513, 2014 | 85 | 2014 |
A new complete condition monitoring method for sic power mosfets E Ugur, C Xu, F Yang, S Pu, B Akin IEEE Transactions on Industrial Electronics 68 (2), 1654-1664, 2020 | 76 | 2020 |
Turn-on Delay Based Real-Time Junction Temperature Measurement for SiC MOSFETs With Aging Compensation F Yang, S Pu, C Xu, B Akin IEEE Transactions on Power Electronics 36 (2), 1280-1294, 2020 | 66 | 2020 |
Experimental Evaluation and Analysis of Switching Transient's Effect on Dynamic on-Resistance in GaN HEMTs F Yang, C Xu, B Akin IEEE Transactions on Power Electronics 34 (10), 10121-10135, 2019 | 54 | 2019 |
A Practical On-Board SiC MOSFET Condition Monitoring Technique for Aging Detection S Pu, F Yang, BT Vankayalapati, E Ugur, C Xu, B Akin IEEE Transactions on Industry Applications 56 (3), 2828-2839, 2020 | 47 | 2020 |
Analysis, design and implementation of isolated bidirectional converter with winding-cross-coupled inductors for high step-up and high step-down conversion system W Li, C Xu, H Yu, Y Gu, X He IET Power Electronics 7 (1), 67-77, 2014 | 45 | 2014 |
Design of a Fast Dynamic On-Resistance Measurement Circuit for GaN Power HEMTs F Yang, C Xu, E Ugur, S Pu, B Akin 2018 IEEE Transportation Electrification Conference and Expo (ITEC), 359-365, 2018 | 36 | 2018 |
Performance degradation of GaN HEMTs under accelerated power cycling tests C Xu, F Yang, E Ugur, S Pu, B Akin CPSS Transactions on Power Electronics and Applications 3 (4), 269-277, 2018 | 35 | 2018 |
Characterization of threshold voltage instability under off-state drain stress and its impact on p-GaN HEMT performance F Yang, C Xu, B Akin IEEE Journal of Emerging and Selected Topics in Power Electronics 9 (4 …, 2020 | 33 | 2020 |
SiC MOSFET Aging Detection Based on Miller Plateau Voltage Sensing S Pu, F Yang, E Ugur, C Xu, B Akin 2019 IEEE Transportation Electrification Conference and Expo (ITEC), 1-6, 2019 | 32 | 2019 |
Performance analysis of coupled inductor based multiple-input DC/DC converter with PWM plus phase-shift (PPS) control strategy C Xu, Y Gu, H Luo, Y Hu, Y Zhao, W Li, X He 2013 IEEE ECCE Asia Downunder, 994-998, 2013 | 22 | 2013 |
Energy management with dual droop plus frequency dividing coordinated control strategy for electric vehicle applications W Li, C Xu, H Yu, Y Gu, X He Journal of Modern Power Systems and Clean Energy 3 (2), 212-220, 2015 | 19 | 2015 |
Investigation of Performance Degradation in Enhancement-Mode GaN HEMTs under Accelerated Aging C Xu, E Ugur, F Yang, S Pu, B Akin 2018 IEEE 6th Workshop on Wide Bandgap Power Devices and Applications (WiPDA …, 2018 | 15 | 2018 |
Impact of Threshold Voltage Instability on Static and Switching Performance of GaN Devices with p-GaN Gate F Yang, C Xu, B Akin 2019 IEEE Applied Power Electronics Conference and Exposition (APEC), 951-957, 2019 | 12 | 2019 |
Quantitative Analysis of Different Operating Conditions' Effect on Dynamic On-Resistance in Enhancement-Mode GaN HEMTs F Yang, C Xu, B Akin 2018 IEEE 6th Workshop on Wide Bandgap Power Devices and Applications (WiPDA …, 2018 | 12 | 2018 |
On-Board SiC MOSFET Degradation Monitoring Through Readily Available Inverter Current/Voltage Sensors S Pu, F Yang, E Ugur, BT Vankayalapati, C Xu, B Akin 2019 IEEE Transportation Electrification Conference and Expo (ITEC), 1-5, 2019 | 11 | 2019 |
Thermally Triggered SiC MOSFET Aging Effect on Conducted EMI S Pu, E Ugur, F Yang, C Xu, B Akin 2018 IEEE 6th Workshop on Wide Bandgap Power Devices and Applications (WiPDA …, 2018 | 10 | 2018 |
Investigation of performance degradation in thermally aged cascode GaN power devices C Xu, E Ugur, B Akin 2017 IEEE 5th Workshop on Wide Bandgap Power Devices and Applications (WiPDA …, 2017 | 10 | 2017 |
Comparing the performance of different control techniques for DC-DC boost converter with variable solar PV generation in DC microgrid A Ali, Y Gu, C Xu, W Li, X He 2014 9th IEEE Conference on Industrial Electronics and Applications, 603-609, 2014 | 10 | 2014 |
A System Level Approach for Online Junction Temperature Measurement of SiC MOSFETs Using Turn-On Delay Time F Yang, S Pu, C Xu, B Akin 2020 IEEE Transportation Electrification Conference & Expo (ITEC), 1012-1017, 2020 | 6 | 2020 |