| Mapping the conductivity of graphene with Electrical Resistance Tomography A Cultrera, D Serazio, A Zurutuza, A Centeno, O Txoperena, D Etayo, ... Scientific reports 9 (1), 10655, 2019 | 48 | 2019 |
| A simple algorithm to find the L-curve corner in the regularisation of ill-posed inverse problems A Cultrera, L Callegaro IOP SciNotes, 2020 | 39 | 2020 |
| Band-gap states in unfilled mesoporous nc-TiO2: measurement protocol for electrical characterization A Cultrera, L Boarino, G Amato, C Lamberti Journal of Physics D: Applied Physics 47 (1), 015102, 2013 | 28 | 2013 |
| Electrical resistance tomography of conductive thin films A Cultrera, L Callegaro IEEE transactions on instrumentation and measurement 65 (9), 2101-2107, 2016 | 26 | 2016 |
| Mapping time-dependent conductivity of metallic nanowire networks by electrical resistance tomography toward transparent conductive materials G Milano, A Cultrera, K Bejtka, N De Leo, L Callegaro, C Ricciardi, ... ACS Applied Nano Materials 3 (12), 11987-11997, 2020 | 18 | 2020 |
| Metrological characterization of consumer-grade equipment for wearable brain–computer interfaces and extended reality P Arpaia, L Callegaro, A Cultrera, A Esposito, M Ortolano IEEE Transactions on Instrumentation and Measurement 71, 1-9, 2021 | 16 | 2021 |
| Towards standardisation of contact and contactless electrical measurements of CVD graphene at the macro-, micro-and nano-scale C Melios, N Huang, L Callegaro, A Centeno, A Cultrera, A Cordon, ... Scientific Reports 10 (1), 3223, 2020 | 16 | 2020 |
| A correlation noise spectrometer for flicker noise measurement in graphene samples M Marzano, A Cultrera, M Ortolano, L Callegaro Measurement Science and Technology 30 (3), 035102, 2019 | 16 | 2019 |
| Metrological characterization of a low-cost electroencephalograph for wearable neural interfaces in industry 4.0 applications P Arpaia, L Callegaro, A Cultrera, A Esposito, M Ortolano 2021 IEEE International Workshop on Metrology for Industry 4.0 & IoT …, 2021 | 15 | 2021 |
| Recommended implementation of electrical resistance tomography for conductivity mapping of metallic nanowire networks using voltage excitation A Cultrera, G Milano, N De Leo, C Ricciardi, L Boarino, L Callegaro Scientific Reports 11 (1), 13167, 2021 | 10 | 2021 |
| A new calibration setup for lock-in amplifiers in the low frequency range and its validation in a bilateral comparison A Cultrera, D Corminboeuf, V D’Elia, NTM Tran, L Callegaro, M Ortolano Metrologia 58 (2), 025001, 2021 | 9 | 2021 |
| Molecular doping and gas sensing in Si nanowires: from charge injection to reduced dielectric mismatch G Amato, A Cultrera, L Boarino, C Lamberti, S Bordiga, F Mercuri, ... Journal of Applied Physics 114 (20), 2013 | 9 | 2013 |
| A modified cryostat for photo-electrical characterization of porous materials in controlled atmosphere at very low gas dosage A Cultrera, G Amato, L Boarino, C Lamberti AIP Advances 4 (8), 2014 | 8 | 2014 |
| Tomography of memory engrams in self-organizing nanowire connectomes G Milano, A Cultrera, L Boarino, L Callegaro, C Ricciardi Nature Communications 14 (1), 5723, 2023 | 6 | 2023 |
| A calibration-verification testbed for electrical energy meters under low power quality conditions L Callegaro, G Aprile, A Cultrera, F Galliana, G Germito, D Serazio, ... Measurement: Sensors 18, 100188, 2021 | 6 | 2021 |
| Role of plasma-induced defects in the generation of 1/f noise in graphene A Cultrera, L Callegaro, M Marzano, M Ortolano, G Amato Applied Physics Letters 112 (9), 2018 | 6 | 2018 |
| Electrical Resistance Tomography on thin films: sharp conductive profiles A Cultrera, L Callegaro 2015 IEEE 1st International Forum on Research and Technologies for Society …, 2015 | 3 | 2015 |
| Laboratory reproduction of on-field low power quality conditions for the calibration/verification of electrical energy meters A Cultrera, G Germito, F Galliana, B Trinchera, G Aprile, M Chirulli, ... Proceedings 25th IMEKO TC-4 international symposium on of Measurement of …, 2022 | 2 | 2022 |
| GRACE: Developing electrical characterisation methods for future graphene electronics L Callegaro, C Cassiago, A Cultrera, V D'Elia, D Serazio, M Ortolano, ... 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018), 1-2, 2018 | 2 | 2018 |
| New IEC standards for the measurement of sheet resistance on large-area graphene using the van der Pauw and the in-line four-point probe methods A Cultrera, D Serazio, N Fabricius, L Callegaro Measurement 236, 114980, 2024 | 1 | 2024 |
Luca CallegaroINRIM - Istituto Nazionale di Ricerca Metrologica在 inrim.it 的电子邮件经过验证
