| Deep learning enabled strain mapping of single-atom defects in two-dimensional transition metal dichalcogenides with sub-picometer precision CH Lee, A Khan, D Luo, TP Santos, C Shi, BE Janicek, S Kang, W Zhu, ... Nano letters 20 (5), 3369-3377, 2020 | 101 | 2020 |
| Spin–orbit torque switching in a nearly compensated Heusler ferrimagnet J Finley, CH Lee, PY Huang, L Liu Advanced Materials 31 (2), 1805361, 2019 | 57 | 2019 |
| Nearly hyperuniform, nonhyperuniform, and antihyperuniform density fluctuations in two-dimensional transition metal dichalcogenides with defects D Chen, Y Zheng, CH Lee, S Kang, W Zhu, H Zhuang, PY Huang, Y Jiao Phys. Rev. B 103 (22), 224102, 2021 | 21 | 2021 |
| Effects of surface oxidation of Cu substrates on the growth kinetics of graphene by chemical vapor deposition RJ Chang, CH Lee, MK Lee, CW Chen, CY Wen Nanoscale 9 (6), 2324-2329, 2017 | 21 | 2017 |
| In Situ Imaging of an Anisotropic Layer-by-Layer Phase Transition in Few-Layer MoTe2 CH Lee, H Ryu, G Nolan, Y Zhang, Y Lee, S Oh, H Cheong, K Watanabe, ... Nano letters 23 (2), 677-684, 2023 | 14 | 2023 |
| Leveraging generative adversarial networks to create realistic scanning transmission electron microscopy images A Khan, CH Lee, PY Huang, BK Clark npj Computational Materials 9 (1), 85, 2023 | 12 | 2023 |
| Achieving sub-0.5-angstrom–resolution ptychography in an uncorrected electron microscope KX Nguyen, Y Jiang, CH Lee, P Kharel, Y Zhang, AM van der Zande, ... Science 383 (6685), 865-870, 2024 | 3 | 2024 |
| Atom-by-atom imaging of moiré transformations in 2D transition metal dichalcogenides Y Zhang, JH Baek, CH Lee, Y Jung, SC Hong, G Nolan, K Watanabe, ... Science Advances 10 (13), eadk1874, 2024 | 2 | 2024 |
| Using CycleGANs to Generate Realistic STEM Images for Machine Learning A Khan, CH Lee, PY Huang, BK Clark arXiv e-prints, arXiv: 2301.07743, 2023 | 2 | 2023 |
| Automated acquisition and deep learning of 2D materials on the million-atom scale CH Lee, A Khan, Y Zhang, MA Hossain, A van der Zande, B Clark, ... Microscopy and Microanalysis 28 (S1), 3062-3063, 2022 | 2 | 2022 |
| Deep Learning Enabled Atom-by-Atom Analysis of 2D materials on the Million-Atom Scale CH Lee, A Khan, D Luo, C Shi, Y Zhang, MA Hossain, A van der Zande, ... Microscopy and Microanalysis 27 (S1), 904-906, 2021 | 2 | 2021 |
| Probing the strain fields of single-atom defects in 2D materials with sub-picometer precision CH Lee, A Khan, D Luo, T Santos, C Shi, B Janicek, S Kang, N Sobh, ... Microscopy and Microanalysis 27 (S1), 1944-1944, 2021 | 2 | 2021 |
| Deep Learning Enabled Measurements of Single-Atom Defects in 2D Transition Metal Dichalcogenides with Sub-Picometer Precision CH Lee, C Shi, D Luo, A Khan, BE Janicek, S Kang, W Zhu, BK Clark, ... Microscopy and Microanalysis 25 (S2), 172-173, 2019 | 2 | 2019 |
| In-situ Imaging of Anisotropic Layer-by-layer Phase Transition in Few-layer MoTe2 CH Lee, H Ryu, G Nolan, Y Zhang, Y Lee, K Kim, GH Lee, PY Huang Microscopy and Microanalysis 28 (S1), 2320-2322, 2022 | 1 | 2022 |
| Using cycle-GANS to generate realistic STEM images for defect identification A Khan, CH Lee, P Huang, B Clark APS March Meeting Abstracts 2022, Q60. 005, 2022 | 1 | 2022 |
| Machine Learning of Single-Atom Defects in 2D Transition Metal Dichalcogenides with Sub-Picometer Precision A Khan, B Clark, CH Lee, D Luo, C Shi, S Kang, W Zhu, P Huang Bulletin of the American Physical Society 65, 2020 | 1 | 2020 |
| Enhancing Depth Resolution of Multislice Ptychography with Data-Driven Prior and Regularization CH Lee, DA Muller Microscopy and Microanalysis 30 (Supplement_1), 2024 | | 2024 |
| Electron Ptychography for Deep Sub-angstrom Resolution Without an Aberration Corrector CH Lee, Y Jiang, K Nguyen, P Kharel, Y Zhang, A van der Zande, ... Microscopy and Microanalysis 30 (Supplement_1), ozae044. 911, 2024 | | 2024 |
| Using CycleGANs to construct training data for other Machine Learning models A Khan, CH Lee, P Huang, B Clark APS March Meeting Abstracts 2023, K53. 009, 2023 | | 2023 |
| Tuning the Optical Properties of 2D Materials with Defects and Strain CH Lee, Y Zhang, MA Hossain, Y Zhang, AM van der Zande, PY Huang Microscopy and Microanalysis 28 (S1), 2014-2014, 2022 | | 2022 |
Pinshane Y. HuangAssociate Professor of Materials Science, University of Illinois在 illinois.edu 的电子邮件经过验证
