Evaluation of hybrid memory technologies using SOT-MRAM for on-chip cache hierarchy F Oboril, R Bishnoi, M Ebrahimi, MB Tahoori IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2015 | 260* | 2015 |
Ultra-fast and high-reliability SOT-MRAM: From cache replacement to normally-off computing G Prenat, K Jabeur, P Vanhauwaert, G Di Pendina, F Oboril, R Bishnoi, ... IEEE Transactions on Multi-Scale Computing Systems 2 (1), 49-60, 2016 | 194 | 2016 |
Layout-based modeling and mitigation of multiple event transients M Ebrahimi, H Asadi, R Bishnoi, MB Tahoori IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2016 | 124* | 2016 |
Comprehensive analysis of sequential and combinational soft errors in an embedded processor M Ebrahimi, A Evans, MB Tahoori, E Costenaro, D Alexandrescu, ... Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions …, 2015 | 120* | 2015 |
SCFIT: A FPGA-based fault injection technique for SEU fault model A Mohammadi, M Ebrahimi, A Ejlali, SG Miremadi Proceedings of the Conference on Design, Automation and Test in Europe, 586-589, 2012 | 120* | 2012 |
Low-Cost Multiple Bit Upset Correction in SRAM-Based FPGA Configuration Frames M Ebrahimi, PMB Rao, R Seyyedi, MB Tahoori IEEE Transactions on Very Large Scale Integration (VLSI) Systems 24 (3), 932-943, 2016 | 92* | 2016 |
Read disturb fault detection in STT-MRAM R Bishnoi, M Ebrahimi, F Oboril, MB Tahoori 2014 International Test Conference, 1-7, 2014 | 87 | 2014 |
Improving write performance for STT-MRAM R Bishnoi, M Ebrahimi, F Oboril, MB Tahoori IEEE Transactions on Magnetics 52 (8), 1-11, 2016 | 74 | 2016 |
Avoiding unnecessary write operations in STT-MRAM for low power implementation R Bishnoi, F Oboril, M Ebrahimi, MB Tahoori Fifteenth International Symposium on Quality Electronic Design, 548-553, 2014 | 73 | 2014 |
Aging-aware logic synthesis M Ebrahimi, F Oboril, S Kiamehr, MB Tahoori Proceedings of the International Conference on Computer-Aided Design, 61-68, 2013 | 70 | 2013 |
CEP: correlated error propagation for hierarchical soft error analysis L Chen, M Ebrahimi, MB Tahoori Journal of Electronic Testing 29 (2), 143-158, 2013 | 66 | 2013 |
Aging mitigation in memory arrays using self-controlled bit-flipping technique A Gebregiorgis, M Ebrahimi, S Kiamehr, F Oboril, S Hamdioui, ... The 20th Asia and South Pacific Design Automation Conference, 231-236, 2015 | 51 | 2015 |
Asynchronous asymmetrical write termination (AAWT) for a low power STT-MRAM R Bishnoi, M Ebrahimi, F Oboril, MB Tahoori Proceedings of the conference on Design, Automation & Test in Europe, 180, 2014 | 46 | 2014 |
Low-cost scan-chain-based technique to recover multiple errors in TMR systems M Ebrahimi, SG Miremadi, H Asadi, M Fazeli IEEE Transactions on Very Large Scale Integration (VLSI) Systems 21 (8 …, 2013 | 46* | 2013 |
Class: Combined logic and architectural soft error sensitivity analysis M Ebrahimi, L Chen, H Asadi, MB Tahoori 2013 18th Asia and South Pacific Design Automation Conference (ASP-DAC), 601-607, 2013 | 46 | 2013 |
Temperature-aware dynamic voltage scaling to improve energy efficiency of near-threshold computing S Kiamehr, M Ebrahimi, MS Golanbari, MB Tahoori IEEE Transactions on Very Large Scale Integration (VLSI) Systems 25 (7), 2017 | 43* | 2017 |
Fault injection acceleration by architectural importance sampling M Ebrahimi, N Sayed, M Rashvand, MB Tahoori 2015 International Conference on Hardware/Software Codesign and System …, 2015 | 35 | 2015 |
Self-timed read and write operations in STT-MRAM R Bishnoi, F Oboril, M Ebrahimi, MB Tahoori IEEE Transactions on Very Large Scale Integration (VLSI) Systems 24 (5 …, 2015 | 32 | 2015 |
Chip-level modeling and analysis of electrical masking of soft errors S Kiamehr, M Ebrahimi, F Firouzi, MB Tahoori 2013 IEEE 31st VLSI Test Symposium (VTS), 1-6, 2013 | 28 | 2013 |
Improving reliability, performance, and energy efficiency of STT-MRAM with dynamic write latency A Ahari, M Ebrahimi, F Oboril, M Tahoori 2015 33rd IEEE International Conference on Computer Design (ICCD), 109-116, 2015 | 27 | 2015 |