| SMARS: Sleep monitoring via ambient radio signals F Zhang, C Wu, B Wang, M Wu, D Bugos, H Zhang, KJR Liu IEEE Transactions on Mobile Computing 20 (1), 217-231, 2019 | 117 | 2019 |
| Method, apparatus, server and system for real-time vital sign detection and monitoring F Zhang, C Chen, Q Xu, B Wang, C Wu, H Zhang, W Chau-Wai, ... US Patent 10,495,725, 2019 | 42 | 2019 |
| Apparatus, systems and methods for fall-down detection based on a wireless signal F Zhang, C Chen, Q Xu, B Wang, C Wu, H Zhang, W Chau-Wai, ... US Patent 10,397,039, 2019 | 36 | 2019 |
| Angular effects of heavy-ion strikes on single-event upset response of flip-flop designs in 16-nm bulk FinFET technology H Zhang, H Jiang, TR Assis, DR Ball, B Narasimham, A Anvar, ... IEEE Transactions on Nuclear Science 64 (1), 491-496, 2016 | 36 | 2016 |
| Temperature dependence of soft-error rates for FF designs in 20-nm bulk planar and 16-nm bulk FinFET technologies H Zhang, H Jiang, TR Assis, DR Ball, K Ni, JS Kauppila, RD Schrimpf, ... 2016 IEEE International Reliability Physics Symposium (IRPS), 5C-3-1-5C-3-5, 2016 | 35 | 2016 |
| Effects of threshold voltage variations on single-event upset response of sequential circuits at advanced technology nodes H Zhang, H Jiang, TR Assis, NN Mahatme, B Narasimham, LW Massengill, ... IEEE Transactions on Nuclear Science 64 (1), 457-463, 2016 | 34 | 2016 |
| Apparatus, systems and methods for event recognition based on a wireless signal Q Xu, F Zhang, C Chen, B Wang, C Wu, H Zhang, W Chau-Wai, ... US Patent 10,374,863, 2019 | 33 | 2019 |
| Method, apparatus, and system for vehicle wireless monitoring CL Mai, JF Lee, DN Claffey, H Zhang, F Zhang, HQD Lai, B Wang, ... US Patent App. 17/019,270, 2020 | 17 | 2020 |
| Effects of temperature and supply voltage on SEU-and SET-induced errors in bulk 40-nm sequential circuits RM Chen, ZJ Diggins, NN Mahatme, L Wang, EX Zhang, YP Chen, ... IEEE Transactions on Nuclear Science 64 (8), 2122-2128, 2017 | 17 | 2017 |
| Method, apparatus, server and system for vital sign detection and monitoring C Chen, F Zhang, Q Xu, B Wang, C Wu, H Zhang, W Chau-Wai, ... US Patent 10,735,298, 2020 | 15 | 2020 |
| Method, apparatus, and system for wireless sleep monitoring F Zhang, B Wang, C Wu, M Wu, D Bugos, H Zhang, KJR Liu, OCL Au US Patent 11,439,344, 2022 | 12 | 2022 |
| Method, apparatus, and system for automatic and adaptive wireless monitoring and tracking CL Mai, JF Lee, HQD Lai, D Bugos, H Zhang, B Wang, OCL Au, KJR LIU US Patent App. 17/019,273, 2020 | 12 | 2020 |
| An empirical model for predicting SE cross section for combinational logic circuits in advanced technologies H Jiang, H Zhang, JS Kauppila, LW Massengill, BL Bhuva IEEE Transactions on Nuclear Science 65 (1), 304-310, 2017 | 12 | 2017 |
| Effects of total-ionizing-dose irradiation on single-event response for flip-flop designs at a 14-/16-nm bulk FinFET technology node H Zhang, H Jiang, X Fan, JS Kauppila, I Chatterjee, BL Bhuva, ... IEEE Transactions on Nuclear Science 65 (8), 1928-1934, 2017 | 11 | 2017 |
| Frequency dependence of heavy-ion-induced single-event responses of flip-flops in a 16-nm bulk FinFET technology H Zhang, H Jiang, BL Bhuva, JS Kauppila, WT Holman, LW Massengill IEEE Transactions on Nuclear Science 65 (1), 413-417, 2017 | 11 | 2017 |
| Thermal neutron-induced soft-error rates for flip-flop designs in 16-nm bulk FinFET technology H Zhang, H Jiang, JD Brockman, TR Assis, X Fan, BL Bhuva, ... 2017 IEEE International Reliability Physics Symposium (IRPS), 3D-3.1-3D-3.4, 2017 | 11 | 2017 |
| SE performance of a Schmitt-trigger-based D-flip-flop design in a 16-nm bulk FinFET CMOS process H Jiang, H Zhang, DR Ball, LW Massengill, BL Bhuva, TR Assis, ... 2016 IEEE International Reliability Physics Symposium (IRPS), 3B-2-1-3B-2-6, 2016 | 10 | 2016 |
| Method, apparatus, and system for positioning and powering a wireless monitoring system CL Mai, JF Lee, DN Claffey, H Zhang, HQD Lai, B Wang, OCL Au, KJR Liu US Patent App. 17/019,271, 2020 | 8 | 2020 |
| Power-aware SE analysis of different FF designs at the 14-/16-nm bulk FinFET CMOS technology node H Jiang, H Zhang, I Chatterjee, JS Kauppila, BL Bhuva, LW Massengill IEEE Transactions on Nuclear Science 65 (8), 1866-1871, 2018 | 8 | 2018 |
| Single-event performance of sense-amplifier based flip-flop design in a 16-nm bulk FinFET CMOS process H Jiang, H Zhang, TR Assis, B Narasimham, BL Bhuva, WT Holman, ... IEEE Transactions on Nuclear Science 64 (1), 477-482, 2016 | 5 | 2016 |
