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Gregor Overney
Gregor Overney
R&D Director, Agilent Technologies
在 agilent.com 的电子邮件经过验证 - 首页
标题
引用次数
引用次数
年份
Structural rigidity and low frequency vibrational modes of long carbon tubules
G Overney, W Zhong, D Tomanek
Zeitschrift für Physik D Atoms, Molecules and Clusters 27, 93-96, 1993
5741993
Conformational ordering of biomolecules in the gas phase: nitrogen collision cross sections measured on a prototype high resolution drift tube ion mobility-mass spectrometer
JC May, CR Goodwin, NM Lareau, KL Leaptrot, CB Morris, ...
Analytical chemistry 86 (4), 2107-2116, 2014
4342014
Compliance measurements of confined polystyrene solutions by atomic force microscopy
RM Overney, DP Leta, CF Pictroski, MH Rafailovich, Y Liu, J Quinn, ...
Physical review letters 76 (8), 1272, 1996
1101996
Cavities and channels in electrides
JL Dye, MJ Wagner, G Overney, RH Huang, TF Nagy, D Tomanek
Journal of the American Chemical Society 118 (31), 7329-7336, 1996
1031996
Theory for the atomic force microscopy of deformable surfaces
D Tomanek, G Overney, H Miyazaki, SD Mahanti, HJ Güntherodt
Physical review letters 63 (8), 876, 1989
881989
Effect of interfacial liquid structuring on the coherence length in nanolubrication
M He, AS Blum, G Overney, RM Overney
Physical review letters 88 (15), 154302, 2002
872002
Structural properties of Fe crystals
W Zhong, G Overney, D Tomanek
Physical Review B 47 (1), 95, 1993
851993
Atomic resolution on the surface of LiF (100) by atomic force microscopy
E Meyer, H Heinzelmann, D Brodbeck, G Overney, R Overney, L Howald, ...
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1991
531991
Method and apparatus for surface desorption ionization by charged particles
JL Truche, PC Goodley, G Overney
US Patent 7,723,678, 2010
482010
Theory of elastic tip–surface interactions in atomic force microscopy
G Overney, W Zhong, D Tománek
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1991
471991
Limits of resolution in atomic force microscopy images of graphite
W Zhong, G Overney, D Tomanek
Europhysics Letters 15 (1), 49, 1991
461991
Local symmetry breaking in stage-1 alkali-metal–graphite intercalation compounds studied by scanning tunneling microscopy
D Anselmetti, V Geiser, G Overney, R Wiesendanger, HJ Güntherodt
Physical Review B 42 (3), 1848, 1990
331990
User customizable plate handling for MALDI mass spectrometry
GT Overney, BD Miller
US Patent 7,138,625, 2006
322006
System and method for analyzing contents of sample based on quality of mass spectra
JE Satulovsky, G Overney
US Patent App. 12/465,001, 2010
272010
Real-time analysis of mass spectrometry data for identifying peptidic data of interest
GT Overney, JC Roark
US Patent 7,498,568, 2009
262009
Hexagonal and nonhexagonal superlattice structures on stage-1 alkali metal graphite intercalation compounds studied by scanning tunnelling microscopy
D Anselmetti, V Geiser, D Brodbeck, G Overney, R Wiesendanger, ...
Synthetic metals 38 (2), 157-167, 1990
261990
Theory for the atomic force microscopy of layered elastic surfaces
G Overney, D Tomanek, W Zhong, Z Sun, H Miyazaki, SD Mahanti, ...
Journal of Physics: Condensed Matter 4 (17), 4233, 1992
231992
Apparatus and method for MALDI source control with external image capture
GT Overney
US Patent 7,291,835, 2007
182007
The history of photomicrography
N Overney, G Overney
Micscape Magazine Index 173, 1-8, 2011
172011
Ion source sample plate illumination system
JL Truche, GT Overney, WD Fisher, RP Tella
US Patent 7,435,951, 2008
132008
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