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Guillaume Haben
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A Replication Study on the Usability of Code Vocabulary in Predicting Flaky Tests
G Haben, S Habchi, M Papadakis, M Cordy, Y Le Traon
2021 IEEE/ACM 18th International Conference on Mining Software Repositories …, 2021
332021
A qualitative study on the sources, impacts, and mitigation strategies of flaky tests
S Habchi, G Haben, M Papadakis, M Cordy, Y Le Traon
2022 IEEE Conference on Software Testing, Verification and Validation (ICST …, 2022
272022
Predicting flaky tests categories using few-shot learning
A Akli, G Haben, S Habchi, M Papadakis, YL Traon
arXiv preprint arXiv:2208.14799, 2022
122022
What made this test flake? pinpointing classes responsible for test flakiness
S Habchi, G Haben, J Sohn, A Franci, M Papadakis, M Cordy, Y Le Traon
2022 IEEE International Conference on Software Maintenance and Evolution …, 2022
82022
The importance of discerning flaky from fault-triggering test failures: A case study on the chromium ci
G Haben, S Habchi, M Papadakis, M Cordy, YL Traon
arXiv preprint arXiv:2302.10594, 2023
62023
FlakyCat: Predicting flaky tests categories using few-shot learning
A Akli, G Haben, S Habchi, M Papadakis, Y Le Traon
2023 IEEE/ACM International Conference on Automation of Software Test (AST …, 2023
52023
Discerning Legitimate Failures From False Alerts: A Study of Chromium's Continuous Integration
G Haben, S Habchi, M Papadakis, M Cordy, YL Traon
arXiv preprint arXiv:2111.03382, 2021
12021
Test Flakiness Prediction Techniques for Evolving Software Systems
G Haben
Unilu-University of Luxembourg, Luxembourg, Luxembourg, 2023
2023
SATE VI Report: Bug Injection and Collection
A Delaitre, PE Black, D Cupif, G Haben, L Alex-Kevin, V Okun, Y Prono
Aurelien Delaitre, Paul E. Black, Damien Cupif, Guillaume Haben, Loembe Alex …, 2023
2023
SATE VI Report
PE Black, D Cupif, G Haben, AK Loembe, V Okun, Y Prono
2023
ICSME 2023
A Awal, AI Alam, AV Dimate, A Saha, B Nwiran, DHR Cardenas, ...
2022 IEEE International Conference on Software Maintenance and Evolution (ICSME)| 978-1-6654-7956-1/22/$31.00© 2022 IEEE| DOI: 10.1109/ICSME55016. 2022.00086
R Abreu, E Aghajani, GA Ahmed, SS Ahmed, J Ahn, O Ait-Mohamed, ...
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