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Giovanni Verzellesi
Giovanni Verzellesi
Professor of Electronics, University of Modena and Reggio Emilia, Italy
在 unimore.it 的电子邮件经过验证 - 首页
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引用次数
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年份
Reliability of GaN high-electron-mobility transistors: State of the art and perspectives
G Meneghesso, G Verzellesi, F Danesin, F Rampazzo, F Zanon, A Tazzoli, ...
IEEE Transactions on Device and Materials Reliability 8 (2), 332-343, 2008
7772008
Efficiency droop in InGaN/GaN blue light-emitting diodes: Physical mechanisms and remedies
G Verzellesi, D Saguatti, M Meneghini, F Bertazzi, M Goano, ...
Journal of Applied Physics 114 (7), 2013
4732013
Surface-related drain current dispersion effects in AlGaN-GaN HEMTs
G Meneghesso, G Verzellesi, R Pierobon, F Rampazzo, A Chini, ...
IEEE Transactions on Electron Devices 51 (10), 1554-1561, 2004
4132004
GaN-based power devices: Physics, reliability, and perspectives
M Meneghini, C De Santi, I Abid, M Buffolo, M Cioni, RA Khadar, L Nela, ...
Journal of Applied Physics 130 (18), 2021
3402021
Current collapse and high-electric-field reliability of unpassivated GaN/AlGaN/GaN HEMTs
G Meneghesso, F Rampazzo, P Kordos, G Verzellesi, E Zanoni
IEEE Transactions on Electron Devices 53 (12), 2932-2941, 2006
2252006
Investigation of high-electric-field degradation effects in AlGaN/GaN HEMTs
M Faqir, G Verzellesi, G Meneghesso, E Zanoni, F Fantini
IEEE Transactions on Electron Devices 55 (7), 1592-1602, 2008
1622008
Impact of programming charge distribution on threshold voltage and subthreshold slope of NROM memory cells
L Larcher, G Verzellesi, P Pavan, E Lusky, I Bloom, B Eitan
IEEE Transactions on Electron Devices 49 (11), 1939-1946, 2002
1482002
Mechanisms of RF current collapse in AlGaN–GaN high electron mobility transistors
M Faqir, G Verzellesi, A Chini, F Fantini, F Danesin, G Meneghesso, ...
IEEE Transactions on Device and Materials Reliability 8 (2), 240-247, 2008
1362008
Radiation tolerance of epitaxial silicon carbide detectors for electrons, protons and gamma-rays
F Nava, E Vittone, P Vanni, G Verzellesi, PG Fuochi, C Lanzieri, M Glaser
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2003
1312003
Physics‐based modeling and experimental implications of trap‐assisted tunneling in InGaN/GaN light‐emitting diodes
M Mandurrino, G Verzellesi, M Goano, M Vallone, F Bertazzi, G Ghione, ...
physica status solidi (a) 212 (5), 947-953, 2015
1252015
Influence of buffer carbon doping on pulse and AC behavior of insulated-gate field-plated power AlGaN/GaN HEMTs
G Verzellesi, L Morassi, G Meneghesso, M Meneghini, E Zanoni, ...
IEEE Electron Device Letters 35 (4), 443-445, 2014
1152014
Experimental and numerical analysis of hole emission process from carbon-related traps in GaN buffer layers
A Chini, G Meneghesso, M Meneghini, F Fantini, G Verzellesi, A Patti, ...
IEEE Transactions on Electron Devices 63 (9), 3473-3478, 2016
962016
Radiation-hard semiconductor detectors for SuperLHC
M Bruzzi, J Adey, A Al-Ajili, P Alexandrov, G Alfieri, PP Allport, ...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2005
652005
A review of failure modes and mechanisms of GaN-based HEMTs
E Zanoni, G Meneghesso, G Verzellesi, F Danesin, M Meneghini, ...
2007 IEEE International Electron Devices Meeting, 381-384, 2007
612007
“Hole Redistribution” Model Explaining the Thermally Activated RON Stress/Recovery Transients in Carbon-Doped AlGaN/GaN Power MIS-HEMTs
N Zagni, A Chini, FM Puglisi, M Meneghini, G Meneghesso, E Zanoni, ...
IEEE Transactions on Electron Devices 68 (2), 697-703, 2021
542021
Study of breakdown effects in silicon multiguard structures
M Da Rold, N Bacchetta, D Bisello, A Paccagnella, GF Dalla Betta, ...
Nuclear Science, IEEE Transactions on 46 (4), 1215-1223, 1999
521999
Semiclassical simulation of trap-assisted tunneling in GaN-based light-emitting diodes
M Mandurrino, M Goano, M Vallone, F Bertazzi, G Ghione, G Verzellesi, ...
Journal of Computational Electronics 14, 444-455, 2015
492015
Investigation of efficiency-droop mechanisms in multi-quantum-well InGaN/GaN blue light-emitting diodes
D Saguatti, L Bidinelli, G Verzellesi, M Meneghini, G Meneghesso, ...
IEEE Transactions on Electron Devices 59 (5), 1402-1409, 2012
482012
Characterization and analysis of trap-related effects in AlGaN–GaN HEMTs
M Faqir, G Verzellesi, F Fantini, F Danesin, F Rampazzo, G Meneghesso, ...
Microelectronics reliability 47 (9-11), 1639-1642, 2007
442007
Investigation on the charge collection properties of a 4H-SiC Schottky diode detector
G Verzellesi, P Vanni, F Nava, C Canali
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2002
422002
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