| Universality of non-Ohmic shunt leakage in thin-film solar cells S Dongaonkar, JD Servaites, GM Ford, S Loser, J Moore, RM Gelfand, ... Journal of Applied Physics 108 (12), 2010 | 263 | 2010 |
| Correlation of Built-In Potential and I–V Crossover in Thin-Film Solar Cells JE Moore, S Dongaonkar, RVK Chavali, MA Alam, MS Lundstrom IEEE Journal of Photovoltaics 4 (4), 1138-1148, 2014 | 67 | 2014 |
| Performance and reliability implications of two-dimensional shading in monolithic thin-film photovoltaic modules S Dongaonkar, C Deline, MA Alam IEEE Journal of Photovoltaics 3 (4), 1367-1375, 2013 | 55 | 2013 |
| Universal statistics of parasitic shunt formation in solar cells, and its implications for cell to module efficiency gap S Dongaonkar, S Loser, EJ Sheets, K Zaunbrecher, R Agrawal, TJ Marks, ... Energy & Environmental Science 6 (3), 782-787, 2013 | 46 | 2013 |
| On the nature of shunt leakage in amorphous silicon pin solar cells S Dongaonkar, Y Karthik, D Wang, M Frei, S Mahapatra, MA Alam IEEE Electron Device Letters 31 (11), 1266-1268, 2010 | 43 | 2010 |
| The essence and efficiency limits of bulk-heterostructure organic solar cells: A polymer-to-panel perspective MA Alam, B Ray, MR Khan, S Dongaonkar Journal of Materials Research 28 (4), 541-557, 2013 | 38 | 2013 |
| Random telegraph noise (RTN) in 14nm logic technology: High volume data extraction and analysis S Dongaonkar, MD Giles, A Kornfeld, B Grossnickle, J Yoon 2016 IEEE Symposium on VLSI Technology, 1-2, 2016 | 25 | 2016 |
| End to end modeling for variability and reliability analysis of thin film photovoltaics S Dongaonkar, MA Alam 2012 IEEE International Reliability Physics Symposium (IRPS), 4A. 4.1-4A. 4.6, 2012 | 25 | 2012 |
| From process corners to statistical circuit design methodology: Opportunities and challenges S Dongaonkar, SP Mudanai, MD Giles IEEE Transactions on Electron Devices 66 (1), 19-27, 2018 | 23 | 2018 |
| Geometrical design of thin film photovoltaic modules for improved shade tolerance and performance S Dongaonkar, MA Alam Progress in Photovoltaics: Research and Applications 23 (2), 170-181, 2015 | 21 | 2015 |
| Identification, characterization, and implications of shadow degradation in thin film solar cells S Dongaonkar, MA Alam, Y Karthik, S Mahapatra, D Wang, M Frei 2011 International Reliability Physics Symposium, 5E. 4.1-5E. 4.5, 2011 | 21 | 2011 |
| From process to modules: end-to-end modeling of CSS-deposited CdTe solar cells ES Mungan, Y Wang, S Dongaonkar, DR Ely, RE García, MA Alam IEEE Journal of Photovoltaics 4 (3), 954-961, 2014 | 19 | 2014 |
| Physics and statistics of non-ohmic shunt conduction and metastability in amorphous silicon p–i–n solar cells S Dongaonkar, Y Karthik, S Mahapatra, MA Alam IEEE Journal of Photovoltaics 1 (2), 111-117, 2011 | 16 | 2011 |
| In-line post-process scribing for reducing cell to module efficiency gap in monolithic thin-film photovoltaics S Dongaonkar, MA Alam IEEE Journal of Photovoltaics 4 (1), 324-332, 2013 | 15 | 2013 |
| Intrinisic reliability of amorphous silicon thin film solar cells MA Alam, S Dongaonkar, Y Karthik, S Mahapatra, D Wang, M Frei 2010 IEEE International Reliability Physics Symposium, 312-317, 2010 | 11 | 2010 |
| Device limitations and light-soaking effects in CZTSSe and CZTGeSSe CJ Hages, J Moore, S Dongaonkar, M Alam, M Lundstrom, R Agrawal 2012 38th IEEE Photovoltaic Specialists Conference, 002658-002663, 2012 | 10 | 2012 |
| A shade tolerant panel design for thin film photovoltaics S Dongaonkar, MA Alam 2012 38th IEEE Photovoltaic Specialists Conference, 002416-002420, 2012 | 10 | 2012 |
| Reverse stress metastability of shunt current in CIGS solar cells S Dongaonkar, E Sheets, R Agrawal, MA Alam 2012 38th IEEE Photovoltaic Specialists Conference, 000868-000872, 2012 | 9 | 2012 |
| Bridging the gap: Modeling the variation due to grain size distribution in CdTe solar cells ES Mungan, S Dongaonkar, MA Alam 2013 IEEE 39th Photovoltaic Specialists Conference (PVSC), 2007-2010, 2013 | 8 | 2013 |
| PV Analyzer S Dongaonkar, MA Alam Mar-2011.[Online]. Available: https://nanohub. org/resources/11073, 2011 | 8 | 2011 |
Muhammad Ashraful AlamJai N. Gupta Professor of Electrical Engineering, Purdue University在 purdue.edu 的电子邮件经过验证
