| 12 W/mm AlGaN-GaN HFETs on silicon substrates JW Johnson, EL Piner, A Vescan, R Therrien, P Rajagopal, JC Roberts, ... IEEE Electron Device Letters 25 (7), 459-461, 2004 | 310 | 2004 |
| Influence of MgO and passivation on AlGaN/GaN high-electron-mobility transistors B Luo, JW Johnson, J Kim, RM Mehandru, F Ren, BP Gila, AH Onstine, ... Applied Physics Letters 80 (9), 1661-1663, 2002 | 222 | 2002 |
| 1.9-kV AlGaN/GaN lateral Schottky barrier diodes on silicon M Zhu, B Song, M Qi, Z Hu, K Nomoto, X Yan, Y Cao, W Johnson, E Kohn, ... IEEE Electron Device Letters 36 (4), 375-377, 2015 | 199 | 2015 |
| Gallium nitride material devices including an electrode-defining layer and methods of forming the same JW Johnson, RJ Therrien, A Vescan, JD Brown US Patent 7,071,498, 2006 | 180 | 2006 |
| Enzymatic glucose detection using ZnO nanorods on the gate region of AlGaN∕ GaN high electron mobility transistors BS Kang, HT Wang, F Ren, SJ Pearton, TE Morey, DM Dennis, ... Applied Physics Letters 91 (25), 2007 | 177 | 2007 |
| Pressure-induced changes in the conductivity of AlGaN∕ GaN high-electron mobility-transistor membranes BS Kang, S Kim, F Ren, JW Johnson, RJ Therrien, P Rajagopal, ... Applied Physics Letters 85 (14), 2962-2964, 2004 | 162 | 2004 |
| Prostate specific antigen detection using AlGaN∕ GaN high electron mobility transistors BS Kang, HT Wang, TP Lele, Y Tseng, F Ren, SJ Pearton, JW Johnson, ... Applied physics letters 91 (11), 2007 | 149 | 2007 |
| Electrical detection of deoxyribonucleic acid hybridization with AlGaN∕ GaN high electron mobility transistors BS Kang, SJ Pearton, JJ Chen, F Ren, JW Johnson, RJ Therrien, ... Applied Physics Letters 89 (12), 2006 | 143 | 2006 |
| DC and RF performance of proton-irradiated AlGaN/GaN high electron mobility transistors B Luo, JW Johnson, F Ren, KK Allums, CR Abernathy, SJ Pearton, ... Applied Physics Letters 79 (14), 2196-2198, 2001 | 142 | 2001 |
| metal-oxide-semiconductor field-effect transistor JW Johnson, B Luo, F Ren, BP Gila, W Krishnamoorthy, CR Abernathy, ... Applied Physics Letters 77 (20), 3230-3232, 2000 | 142 | 2000 |
| GaN electronics for high power, high temperature applications SJ Pearton, F Ren, AP Zhang, G Dang, XA Cao, KP Lee, H Cho, BP Gila, ... Materials Science and Engineering: B 82 (1-3), 227-231, 2001 | 133 | 2001 |
| 210-GHz InAlN/GaN HEMTs with dielectric-free passivation R Wang, G Li, O Laboutin, Y Cao, W Johnson, G Snider, P Fay, D Jena, ... IEEE electron device letters 32 (7), 892-894, 2011 | 132 | 2011 |
| Breakdown voltage and reverse recovery characteristics of free-standing GaN Schottky rectifiers JW Johnson, AP Zhang, WB Luo, F Ren, SJ Pearton, SS Park, YJ Park, ... IEEE Transactions on Electron devices 49 (1), 32-36, 2002 | 127 | 2002 |
| Nanowire Channel InAlN/GaN HEMTs With High Linearity ofand DS Lee, H Wang, A Hsu, M Azize, O Laboutin, Y Cao, JW Johnson, ... IEEE electron device letters 34 (8), 969-971, 2013 | 124 | 2013 |
| Reliability of large periphery GaN-on-Si HFETs S Singhal, T Li, A Chaudhari, AW Hanson, R Therrien, JW Johnson, ... Microelectronics Reliability 46 (8), 1247-1253, 2006 | 123 | 2006 |
| Influence of γ-rays on dc performance of AlGaN/GaN high electron mobility transistors B Luo, JW Johnson, F Ren, KK Allums, CR Abernathy, SJ Pearton, ... Applied physics letters 80 (4), 604-606, 2002 | 121 | 2002 |
| Gadolinium oxide and scandium oxide: gate dielectrics for GaN MOSFETs BP Gila, JW Johnson, R Mehandru, B Luo, AH Onstine, V Krishnamoorthy, ... physica status solidi (a) 188 (1), 239-242, 2001 | 118 | 2001 |
| Lateral power rectifiers with 9.7 kV reverse breakdown voltage AP Zhang, JW Johnson, F Ren, J Han, AY Polyakov, NB Smirnov, ... Applied Physics Letters 78 (6), 823-825, 2001 | 118 | 2001 |
| Fast electrical detection of Hg (II) ions with AlGaN∕ GaN high electron mobility transistors HT Wang, BS Kang, TF Chancellor, TP Lele, Y Tseng, F Ren, SJ Pearton, ... Applied Physics Letters 91 (4), 2007 | 113 | 2007 |
| Semiconductor device-based sensors JW Johnson, EL Piner, KJ Linthicum US Patent 7,361,946, 2008 | 109 | 2008 |
Fan RenUniversity of Florida, Bell Lab, AT&T在 che.ufl.edu 的电子邮件经过验证
