| Layer-dependent dielectric and optical properties of centimeter-scale 2D WSe 2: evolution from a single layer to few layers H Gu, B Song, M Fang, Y Hong, X Chen, H Jiang, W Ren, S Liu Nanoscale 11 (47), 22762-22771, 2019 | 85 | 2019 |
| Broadband optical properties of graphene and HOPG investigated by spectroscopic Mueller matrix ellipsometry B Song, H Gu, S Zhu, H Jiang, X Chen, C Zhang, S Liu Applied Surface Science 439, 1079-1087, 2018 | 85 | 2018 |
| Layer‐Dependent Dielectric Function of Wafer‐Scale 2D MoS2 B Song, H Gu, M Fang, X Chen, H Jiang, R Wang, T Zhai, YT Ho, S Liu Advanced Optical Materials 7 (2), 1801250, 2019 | 76 | 2019 |
| Optimal broadband Mueller matrix ellipsometer using multi-waveplates with flexibly oriented axes H Gu, X Chen, H Jiang, C Zhang, S Liu Journal of Optics 18 (2), 025702, 2016 | 66 | 2016 |
| Mueller matrix imaging ellipsometry for nanostructure metrology S Liu, W Du, X Chen, H Jiang, C Zhang Optics express 23 (13), 17316-17329, 2015 | 65 | 2015 |
| Optical wafer defect inspection at the 10 nm technology node and beyond J Zhu, J Liu, T Xu, S Yuan, Z Zhang, H Jiang, H Gu, R Zhou, S Liu International Journal of Extreme Manufacturing 4 (3), 032001, 2022 | 51 | 2022 |
| Accurate characterization of nanoimprinted resist patterns using Mueller matrix ellipsometry X Chen, S Liu, C Zhang, H Jiang, Z Ma, T Sun, Z Xu Optics express 22 (12), 15165-15177, 2014 | 47 | 2014 |
| Superhydrophilic Cu (OH) 2 nanowire-based QCM transducer with self-healing ability for humidity detection J Lin, N Gao, J Liu, Z Hu, H Fang, X Tan, H Li, H Jiang, H Liu, T Shi, ... Journal of Materials Chemistry A 7 (15), 9068-9077, 2019 | 44 | 2019 |
| Layer-dependent dielectric permittivity of topological insulator Bi2Se3 thin films M Fang, Z Wang, H Gu, M Tong, B Song, X Xie, T Zhou, X Chen, H Jiang, ... Applied Surface Science 509, 144822, 2020 | 40 | 2020 |
| Complex Optical Conductivity of Two-Dimensional MoS2: A Striking Layer Dependency B Song, H Gu, M Fang, YT Ho, X Chen, H Jiang, S Liu The journal of physical chemistry letters 10 (20), 6246-6252, 2019 | 40 | 2019 |
| Depolarization artifacts in dual rotating-compensator Mueller matrix ellipsometry W Li, C Zhang, H Jiang, X Chen, S Liu Journal of Optics 18 (5), 055701, 2016 | 39 | 2016 |
| Measurement configuration optimization for accurate grating reconstruction by Mueller matrix polarimetry X Chen, S Liu, C Zhang, H Jiang Journal of Micro/Nanolithography, MEMS, and MOEMS 12 (3), 033013, 2013 | 38 | 2013 |
| Study of the retardance of a birefringent waveplate at tilt incidence by Mueller matrix ellipsometer H Gu, X Chen, C Zhang, H Jiang, S Liu Journal of Optics 20 (1), 015401, 2017 | 37 | 2017 |
| Real-time estimation of time-varying bending modes using fiber Bragg grating sensor arrays H Jiang, B Van Der Veek, D Kirk, H Gutierrez AIAA journal 51 (1), 178-185, 2013 | 37 | 2013 |
| Improved measurement accuracy in optical scatterometry using correction-based library search X Chen, S Liu, C Zhang, H Jiang Applied optics 52 (27), 6726-6734, 2013 | 36 | 2013 |
| Robust solution to the inverse problem in optical scatterometry J Zhu, S Liu, X Chen, C Zhang, H Jiang Optics express 22 (18), 22031-22042, 2014 | 33 | 2014 |
| Complete Dielectric Tensor and Giant Optical Anisotropy in Quasi-One-Dimensional ZrTe5 Z Guo, H Gu, M Fang, B Song, W Wang, X Chen, C Zhang, H Jiang, ... ACS Materials Letters 3 (5), 525-534, 2021 | 32 | 2021 |
| Comprehensive characterization of a general composite waveplate by spectroscopic Mueller matrix polarimetry H Gu, X Chen, Y Shi, H Jiang, C Zhang, P Gong, S Liu Optics express 26 (19), 25408-25425, 2018 | 29 | 2018 |
| Development of a spectroscopic Mueller matrix imaging ellipsometer for nanostructure metrology X Chen, W Du, K Yuan, J Chen, H Jiang, C Zhang, S Liu Review of Scientific Instruments 87 (5), 053707, 2016 | 27 | 2016 |
| High-speed Mueller matrix ellipsometer with microsecond temporal resolution S Zhang, H Jiang, H Gu, X Chen, S Liu Optics Express 28 (8), 10873-10887, 2020 | 25 | 2020 |
