Scalable fabrication of edge contacts to 2D materials: Implications for quantum resistance metrology and 2D electronics N Shetty, H He, R Mitra, J Huhtasaari, K Iordanidou, J Wiktor, S Kubatkin, ... ACS Applied Nano Materials 6 (7), 6292-6298, 2023 | 6 | 2023 |
Ultralow 1/f noise in epigraphene devices N Shetty, F Chianese, H He, J Huhtasaari, S Ghasemi, K Moth-Poulsen, ... Applied Physics Letters 124 (9), 2024 | | 2024 |